Switching mechanism of Al/La1−xSrxMnO3 resistance random access memory. I. Oxygen vacancy formation in perovskites

RSC Advances ◽  
2015 ◽  
Vol 5 (124) ◽  
pp. 102772-102779 ◽  
Author(s):  
Nodo Lee ◽  
Yves Lansac ◽  
Hyunsang Hwang ◽  
Yun Hee Jang

The oxygen vacancy formation in half-metallic perovskite LSMO itself plays an interesting role in the resistive switching.

2016 ◽  
Vol 37 (4) ◽  
pp. 408-411 ◽  
Author(s):  
Tsung-Ming Tsai ◽  
Kuan-Chang Chang ◽  
Ting-Chang Chang ◽  
Rui Zhang ◽  
Tong Wang ◽  
...  

2007 ◽  
Vol 101 (2) ◽  
pp. 024517 ◽  
Author(s):  
Sheng T. Hsu ◽  
Tingkai Li ◽  
Nobuyoshi Awaya

2015 ◽  
Vol 3 (16) ◽  
pp. 4081-4085 ◽  
Author(s):  
Zhonglu Guo ◽  
Linggang Zhu ◽  
Jian Zhou ◽  
Zhimei Sun

Resistance random access memory (RRAM) is known to be a promising candidate for next generation non-volatile memory devices, in which the diffusion of oxygen vacancies plays a key role in resistance switching.


2016 ◽  
Vol 9 (10) ◽  
pp. 104201 ◽  
Author(s):  
Chih-Hung Pan ◽  
Ting-Chang Chang ◽  
Tsung-Ming Tsai ◽  
Kuan-Chang Chang ◽  
Tian-Jian Chu ◽  
...  

2015 ◽  
Vol 106 (21) ◽  
pp. 213505 ◽  
Author(s):  
Yi-Ting Tseng ◽  
Tsung-Ming Tsai ◽  
Ting-Chang Chang ◽  
Chih-Cheng Shih ◽  
Kuan-Chang Chang ◽  
...  

2012 ◽  
Vol 101 (24) ◽  
pp. 243503 ◽  
Author(s):  
Moon-Seok Kim ◽  
Young Hwan Hwang ◽  
Sungho Kim ◽  
Zheng Guo ◽  
Dong-Il Moon ◽  
...  

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