Chemical durability engineering of solution-processed oxide thin films and its application in chemically-robust patterned oxide thin-film transistors
2017 ◽
Vol 5
(2)
◽
pp. 339-349
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Keyword(s):
The chemical durability of solution-processed oxide films was engineered via Sn-incorporation and thermal-treatment, which was applied for large-area TFT circuit integration.
2021 ◽
Vol 59
(3)
◽
pp. 162-167
Keyword(s):
2017 ◽
Vol 714
◽
pp. 572-582
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2021 ◽
Vol 32
(7)
◽
pp. 8347-8353
Keyword(s):
Keyword(s):
2016 ◽
Vol 63
(9)
◽
pp. 3558-3561
◽
Keyword(s):
2016 ◽
Vol 16
(12)
◽
pp. 12871-12874
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Keyword(s):
2008 ◽
Vol 130
(38)
◽
pp. 12580-12581
◽
Keyword(s):
2018 ◽
Vol 3
(2)
◽
pp. 025005
◽
Keyword(s):
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