Is fast mapping good mapping? A review of the benefits of high-speed orientation mapping using electron backscatter diffraction

2002 ◽  
Vol 205 (3) ◽  
pp. 259-269 ◽  
Author(s):  
P. Trimby ◽  
A. Day ◽  
K. Mehnert ◽  
N.-H. Schmidt
Keyword(s):  
High Speed ◽  
Electron Backscatter Diffraction ◽  
Fast Mapping ◽  
Orientation Mapping ◽  
Electron Backscatter ◽  
Backscatter Diffraction

scholarly journals Recent Advances in High-Speed Orientation Mapping

2006 ◽  
Vol 14 (6) ◽  
pp. 6-9 ◽  
Author(s):  
Matthew M. Nowell ◽  
Martina Chui-Sabourin ◽  
John O. Carpenter
Keyword(s):  
High Speed ◽  
Electron Backscatter Diffraction ◽  
Microstructural Analysis ◽  
Automated Analysis ◽  
Steady Increase ◽  
Analysis Tool ◽  
Early Adopters ◽  
Orientation Mapping ◽  
Backscatter Diffraction ◽  
Acquisition Rates

Orientation mapping via automated analysis of Electron Backscatter Diffraction (EBSD) patterns has developed into an established microstructural analysis tool in the electron microscopy community. From the early 1990s, when this technique became commercially available, there has been a steady increase in the data acquisition rates as shown in Figure 1. Currently, orientation mapping speeds of over 200 analyzed patterns per second have been achieved. With these types of acquisition rates now available, the strategy on how to best use EBSD and orientation mapping has also shifted. Early adopters of this technique had to allocate hours of Scanning Electron Microscope (SEM) beam time in order to collect statistically significant data. With current technology, what was collected in hours can now be obtained in minutes. The goal of this article is to introduce this high-speed orientation mapping and present results illustrating the benefits of this capability.

scholarly journals Forming Mechanism of High-Speed Cold Roll Beating of Spline Tooth

2018 ◽  
Vol 2018 ◽  
pp. 1-6 ◽  
Author(s):  
Ting Niu ◽  
Yong-Tang Li ◽  
Zhi-Qi Liu ◽  
Hui-Ping Qi
Keyword(s):  
Process Parameters ◽  
High Speed ◽  
Room Temperature ◽  
Electron Backscatter Diffraction ◽  
Forming Mechanism ◽  
Grain Sizes ◽  
Cold Roll ◽  
Subgrain Rotation ◽  
Electron Backscatter ◽  
Backscatter Diffraction

The spline tooth of ASTM 1045 was fabricated by high-speed cold roll-beating (HSCRB) process at room temperature. Microhardness of the spline tooth was examined by a nanoindenter. The grains and misorientation angle distributions were measured by electron backscatter diffraction (EBSD). The results showed that the microhardness was improved up to 1280 μm deep from the surface of the spine tooth. The microhardness and the grain sizes gradually decreased in the direction away from the surface. On the surface, the fraction of ultrafine grains increased up to about 90%, and the average grain diameter (which was ∼0.56 µm) decreased by 71.4%. The model of grain evolution during HSCRB process is proposed in this work. New grains appear first on the boundaries of the elongated grains within numerous subgrains. The elongated grains are refined as a result of subgrain rotation. By analyzing the HSCRB technical principle, we concluded that the process parameters affect the refinement degree of studied steel by determining beating pass, beating pass interval time, and strain rate.

Electron backscatter diffraction analysis and orientation mapping of monazite

2010 ◽  
Vol 74 (3) ◽  
pp. 493-506 ◽  
Author(s):  
S. M. Reddy ◽  
C. Clark ◽  
N. E. Timms ◽  
B. M. Eglington
Keyword(s):  
Electron Backscatter Diffraction ◽  
Crystallographic Data ◽  
Ebsd Analysis ◽  
Crystallographic Structure ◽  
Ebsd Data ◽  
Orientation Mapping ◽  
Sample Composition ◽  
Electron Backscatter ◽  
Data Yield ◽  
Backscatter Diffraction

AbstractElectron backscatter diffraction (EBSD) analysis of monazite requires a comparison of empirically collected electron backscatter patterns (EBSPs) with theoretical diffraction data, or ‘match units’, derived from known crystallographic parameters. Published crystallographic data derived from compositionally varying natural and synthetic monazite are used to calculate ten different match units for monazite. These match units are used to systematically index EBSPs obtained from four natural monazite samples with different compositions. Analyses of EBSD data, derived from the indexing of five and six diffraction bands using each of the ten match units for 10,000 EBSPs from each of the four samples, indicate a large variation in the ability of the different match units to correctly index the different natural samples. However, the use of match units derived from either synthetic Gd or Eu monazite crystallographic data yield good results for three of the four analysed monazites. Comparison of sample composition with published monazite compositions indicates that these match units are likely to yield good results for the EBSD analysis of metamorphic monazite. The results provide a clear strategy for optimizing the acquisition and analysis of EBSD data from monazite but also indicate the need for the collection of new crystallographic structure data and the subsequent generation of more appropriate match units for natural monazite.

scholarly journals Crystal orientation measurements using SEM–EBSD under unconventional conditions

2015 ◽  
Vol 30 (2) ◽  
pp. 104-108 ◽  
Author(s):  
Karsten Kunze
Keyword(s):  
Crystal Orientation ◽  
Electron Backscatter Diffraction ◽  
Bulk Specimen ◽  
X Ray ◽  
Analytical Technique ◽  
Orientation Mapping ◽  
Electron Backscatter ◽  
Backscatter Diffraction ◽  
Element Mapping ◽  
Scanning Electron

Electron backscatter diffraction (EBSD) is a micro-analytical technique typically attached to a scanning electron microscope (SEM). The vast majority of EBSD measurements is applied to planar and polished surfaces of polycrystalline bulk specimen. In this paper, we present examples of using EBSD and energy-dispersive X-ray spectroscopy (EDX) to analyze specimens that are not flat, not planar, or not bulk – but pillars, needles, and rods. The benefits of low vacuum SEM operation to reduced drift problems are displayed. It is further demonstrated that small and thin specimens enhance the attainable spatial resolution for orientation mapping (by EBSD or transmission Kikuchi diffraction) as well as for element mapping (by EDX).

Electron Backscatter Diffraction Measurement of Structural Reorientation after Nanoindentation of Nanoporous Gold

MRS Advances ◽  
2018 ◽  
Vol 3 (8-9) ◽  
pp. 487-492
Author(s):  
Nicolas J. Briot ◽  
T. John Balk
Keyword(s):  
Focused Ion Beam ◽  
Mechanical Response ◽  
Electron Backscatter Diffraction ◽  
Ion Beam ◽  
Specimen Preparation ◽  
Diffraction Measurement ◽  
Orientation Mapping ◽  
Electron Backscatter ◽  
Backscatter Diffraction ◽  
First Time

ABSTRACTCharacterizing individual ligaments’ behavior during deformation of nanoporous (np) structures remains crucial in further understanding the mechanical response of such materials. In this paper, we report, for the first time, quantifiable results describing the reorientation of ligament structure in np gold (np-Au) subjected to nanoindentation, based on characterization by electron backscatter diffraction (EBSD) orientation mapping. The analysis was performed on a cross-sectioned face at the center of an indent, after specimen preparation utilizing focused ion beam (FIB) techniques. This work provides insights into how the np structure accommodates the material volume displaced during nanoindentation, as well as the strain propagation under the indent. This new knowledge will be fundamental to optimizing utilization of the nanoindentation technique for measurement of np materials and, in particular, np thin films.

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