scholarly journals Crystal orientation measurements using SEM–EBSD under unconventional conditions

2015 ◽  
Vol 30 (2) ◽  
pp. 104-108 ◽  
Author(s):  
Karsten Kunze
Keyword(s):  
Crystal Orientation ◽  
Electron Backscatter Diffraction ◽  
Bulk Specimen ◽  
X Ray ◽  
Analytical Technique ◽  
Orientation Mapping ◽  
Electron Backscatter ◽  
Backscatter Diffraction ◽  
Element Mapping ◽  
Scanning Electron

Electron backscatter diffraction (EBSD) is a micro-analytical technique typically attached to a scanning electron microscope (SEM). The vast majority of EBSD measurements is applied to planar and polished surfaces of polycrystalline bulk specimen. In this paper, we present examples of using EBSD and energy-dispersive X-ray spectroscopy (EDX) to analyze specimens that are not flat, not planar, or not bulk – but pillars, needles, and rods. The benefits of low vacuum SEM operation to reduced drift problems are displayed. It is further demonstrated that small and thin specimens enhance the attainable spatial resolution for orientation mapping (by EBSD or transmission Kikuchi diffraction) as well as for element mapping (by EDX).

All You Need to Know About Electron Backscatter Diffraction: Orientation is Only the Tip of the Iceberg

1997 ◽  
Vol 3 (S2) ◽  
pp. 387-388 ◽  
Author(s):  
J. R. Michael
Keyword(s):  
Electron Backscatter Diffraction ◽  
Photographic Film ◽  
Phase Identification ◽  
Electron Backscattered Diffraction ◽  
Bulk Specimen ◽  
Electron Backscatter ◽  
Backscatter Diffraction ◽  
Over 40 Years ◽  
Orientation Determination ◽  
Scanning Electron

This tutorial will describe the technique of electron backscattered diffraction (EBSD) in the scanning electron microscope (SEM). To properly exploit EBSD in the SEM it is important to understand how these patterns are formed. This discussion will be followed by a description of the hardware required for the collection of electron backscatter patterns (EBSP). We will then discuss the methods used to extract the appropriate crystallographic information from the patterns for orientation determination and phase identification and how these operations can be automated. Following this, a number of applications of the technique for both orientation studies and phase identification will be discussed.EBSD in the SEM is a phenomenon that has been known for many years. EBSD in the SEM is a technique that permits the crystallography of sub-micron sized regions to be studied from a bulk specimen. These patterns were first observed over 40 years ago, before the development of the SEM and were recorded using a special chamber and photographic film.

scholarly journals Twin domain imaging in topological insulator Bi2Te3 and Bi2Se3 epitaxial thin films by scanning X-ray nanobeam microscopy and electron backscatter diffraction

2017 ◽  
Vol 50 (2) ◽  
pp. 369-377 ◽  
Author(s):  
Dominik Kriegner ◽  
Petr Harcuba ◽  
Jozef Veselý ◽  
Andreas Lesnik ◽  
Guenther Bauer ◽  
...  
Keyword(s):  
Crystal Orientation ◽  
Electron Backscatter Diffraction ◽  
Domain Size ◽  
Epitaxial Thin Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
Twin Domain ◽  
Electron Backscatter ◽  
Backscatter Diffraction ◽  
Diffraction Microscopy

The twin distribution in topological insulators Bi2Te3 and Bi2Se3 was imaged by electron backscatter diffraction (EBSD) and scanning X-ray diffraction microscopy (SXRM). The crystal orientation at the surface, determined by EBSD, is correlated with the surface topography, which shows triangular pyramidal features with edges oriented in two different orientations rotated in the surface plane by 60°. The bulk crystal orientation is mapped out using SXRM by measuring the diffracted X-ray intensity of an asymmetric Bragg peak using a nano-focused X-ray beam scanned over the sample. By comparing bulk- and surface-sensitive measurements of the same area, buried twin domains not visible on the surface are identified. The lateral twin domain size is found to increase with the film thickness.

Oxide Scales Grown on Stainless Steels during Simulated Reheat

2006 ◽  
Vol 15-17 ◽  
pp. 792-797 ◽  
Author(s):  
M.A.E. Jepson ◽  
C.L. Verona ◽  
R.L. Higginson
Keyword(s):  
Electron Microscopy ◽  
Stainless Steels ◽  
316L Stainless Steel ◽  
Electron Backscatter Diffraction ◽  
Oxide Scales ◽  
Crystal Direction ◽  
X Ray ◽  
Electron Backscatter ◽  
Backscatter Diffraction ◽  
Scanning Electron

including, external oxide layers, internal grain boundary oxidation structures as well as many other forms of internal oxidation. During the present study, needle like grains of hematite have been observed within the top layers of a number of external oxide scales formed during simulated reheat of 316L stainless steel. It is believed that these needles are caused by the decomposition of an iron rich spinel (approximated to magnetite) along a preferred crystal direction within the spinel grains. The needles have been studied using optical microscopy, scanning electron microscopy (SEM), energy dispersive x-ray spectroscopy (EDS) and electron backscatter diffraction (EBSD).

scholarly journals Crystallographic and shape orientations of magnetite micro-inclusions in plagioclase

2020 ◽  
Vol 175 (10) ◽  
Author(s):  
Olga Ageeva ◽  
Ge Bian ◽  
Gerlinde Habler ◽  
Alexey Pertsev ◽  
Rainer Abart
Keyword(s):  
Crystallographic Orientation ◽  
Crystal Orientation ◽  
Lattice Spacing ◽  
Electron Backscatter Diffraction ◽  
Metamorphic Rocks ◽  
Orientation Relationships ◽  
Electron Backscatter ◽  
Backscatter Diffraction ◽  
Universal Stage ◽  
Scanning Electron

Abstract Plagioclase hosted, oriented magnetite micro-inclusions are a frequently observed phenomenon in magmatic and metamorphic rocks. Understanding the orientation relationships between these inclusions and the plagioclase host is highly relevant for interpreting paleomagnetic measurements. The systematics of the shape and crystallographic orientation relationships between needle- and lath-shaped magnetite micro-inclusions and their plagioclase host from oceanic gabbro were investigated using optical microscopy including universal stage measurements, scanning electron microscopy, and crystal orientation analysis by electron backscatter diffraction. The magnetite inclusions show preferred shape orientations following six well-defined directions and with specific crystallographic orientation relationships to the plagioclase host. These relationships are rationalized based on angular and dimensional similarities between the crystal structures of magnetite and plagioclase, which favor the parallel alignment of oxygen layers with similar lattice spacing in both phases. The parallel alignment of oxygen layers in plagioclase and magnetite can be traced back to the oriented nucleation of magnetite, which occurs by the accommodation of FeO6 octahedra in six-membered rings of SiO4 and AlO4 tetrahedra of the plagioclase structure. The orientation systematics of the magnetite micro-inclusions is related to four orientation variants for placing the FeO6 octahedra into the plagioclase structure.

Where are the geometrically necessary dislocations accommodating small imprints?

2009 ◽  
Vol 24 (3) ◽  
pp. 647-651 ◽  
Author(s):  
M. Rester ◽  
C. Motz ◽  
R. Pippan
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Twin Boundary ◽  
Crystal Orientation ◽  
Electron Backscatter Diffraction ◽  
Transmission Electron ◽  
Electron Backscatter ◽  
Copper Single Crystals ◽  
Backscatter Diffraction ◽  
Small Misorientation

Electron backscatter diffraction (EBSD) and transmission electron microscopy (TEM) analyses of small indentations in copper single crystals exhibit only slight changes of the crystal orientation in the surroundings of the imprints. Far-reaching dislocations might be the reason for these small misorientation changes. Using EBSD and TEM technique, this work makes an attempt to visualize the far-propagating dislocations by introducing a twin boundary in the vicinity of small indentations. Because dislocations piled up at the twin boundary produce a misorientation gradient, the otherwise far-propagating dislocations can be detected.

scholarly journals Diffracting-grain identification from electron backscatter diffraction maps during residual stress measurements: a comparison between the sin2ψ and cosα methods

2019 ◽  
Vol 52 (4) ◽  
pp. 828-843 ◽  
Author(s):  
Dorian Delbergue ◽  
Damien Texier ◽  
Martin Lévesque ◽  
Philippe Bocher
Keyword(s):  
Residual Stress ◽  
Grain Size ◽  
Tilt Angle ◽  
Measurement Errors ◽  
Electron Backscatter Diffraction ◽  
Measurement Techniques ◽  
Single Exposure ◽  
X Ray ◽  
Electron Backscatter ◽  
Backscatter Diffraction

X-ray diffraction (XRD) is a widely used technique to evaluate residual stresses in crystalline materials. Several XRD measurement methods are available. (i) The sin2ψ method, a multiple-exposure technique, uses linear detectors to capture intercepts of the Debye–Scherrer rings, losing the major portion of the diffracting signal. (ii) The cosα method, thanks to the development of compact 2D detectors allowing the entire Debye–Scherrer ring to be captured in a single exposure, is an alternative method for residual stress measurement. The present article compares the two calculation methods in a new manner, by looking at the possible measurement errors related to each method. To this end, sets of grains in diffraction condition were first identified from electron backscatter diffraction (EBSD) mapping of Inconel 718 samples for each XRD calculation method and its associated detector, as each method provides different sets owing to the detector geometry or to the method specificities (such as tilt-angle number or Debye–Scherrer ring division). The X-ray elastic constant (XEC) ½S 2, calculated from EBSD maps for the {311} lattice planes, was determined and compared for the different sets of diffracting grains. It was observed that the 2D detector captures 1.5 times more grains in a single exposure (one tilt angle) than the linear detectors for nine tilt angles. Different XEC mean values were found for the sets of grains from the two XRD techniques/detectors. Grain-size effects were simulated, as well as detector oscillations to overcome them. A bimodal grain-size distribution effect and `artificial' textures introduced by XRD measurement techniques are also discussed.

scholarly journals Crystal orientation and detector distance effects on resolving pseudosymmetry by electron backscatter diffraction

2021 ◽  
Vol 54 (2) ◽  
pp. 513-522
Author(s):  
Edward L. Pang ◽  
Christopher A. Schuh
Keyword(s):  
Crystal Orientation ◽  
Electron Backscatter Diffraction ◽  
Detector Distance ◽  
Recent Emergence ◽  
Distance Effects ◽  
Electron Backscatter ◽  
Sample Position ◽  
Position And Orientation ◽  
Diffraction Patterns ◽  
Backscatter Diffraction

Accurately indexing pseudosymmetric materials has long proven challenging for electron backscatter diffraction. The recent emergence of intensity-based indexing approaches promises an enhanced ability to resolve pseudosymmetry compared with traditional Hough-based indexing approaches. However, little work has been done to understand the effects of sample position and orientation on the ability to resolve pseudosymmetry, especially for intensity-based indexing approaches. Thus, in this work the effects of crystal orientation and detector distance in a model tetragonal ZrO2 (c/a = 1.0185) material are quantitatively investigated. The orientations that are easiest and most difficult to correctly index are identified, the effect of detector distance on indexing confidence is characterized, and these trends are analyzed on the basis of the appearance of specific zone axes in the diffraction patterns. The findings also point to the clear benefit of shorter detector distances for resolving pseudosymmetry using intensity-based indexing approaches.

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