Analysis of temperature-dependent electrical characteristics in amorphous In-Ga-Zn-O thin-film transistors using gated-four-probe measurements
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2015 ◽
Vol 30
(11)
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pp. 115020
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2014 ◽
Vol 598
(1)
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pp. 129-134
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2018 ◽
Vol 10
(51)
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pp. 44554-44560
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2015 ◽
Vol 32
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pp. 088506
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