Analysis of temperature-dependent electrical characteristics in amorphous In-Ga-Zn-O thin-film transistors using gated-four-probe measurements

2013 ◽  
Vol 114 (9) ◽  
pp. 094502 ◽  
Author(s):  
Jaewook Jeong ◽  
Gwang Jun Lee ◽  
Joonwoo Kim ◽  
Soon Moon Jeong ◽  
Jung-Hye Kim
2015 ◽  
Vol 30 (11) ◽  
pp. 115020 ◽  
Author(s):  
Dong Wook Kim ◽  
Hyunji Shin ◽  
Ji-Ho Park ◽  
Jaehoon Park ◽  
Jong Sun Choi

2014 ◽  
Vol 598 (1) ◽  
pp. 129-134 ◽  
Author(s):  
Sung Woo Lee ◽  
Dong Wook Kim ◽  
Hyunji Shin ◽  
Jong Sun Choi ◽  
Jin-Hyuk Bae ◽  
...  

2018 ◽  
Vol 10 (51) ◽  
pp. 44554-44560 ◽  
Author(s):  
Tae Soo Jung ◽  
Heesoo Lee ◽  
Hee Jun Kim ◽  
Jin Hyeok Lee ◽  
Hyun Jae Kim

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