AbstractThermoelectric phenomena can be strongly modified in nanomaterials. The determination of the absolute Seebeck coefficient is a major challenge for metrology with respect to micro- and nanostructures due to the fact that the transport properties of the bulk material are no more valid. Here, we demonstrate a method to determine the absolute Seebeck coefficient S of individual metallic nanowires. For highly pure and single crystalline silver nanowires, we show the influence of nanopatterning on S in the temperature range between 16 K and 300 K. At room temperature, a nanowire diameter below 200 nm suppresses S by 50% compared to the bulk material to less than S = 1 μVK−1, which is attributed to the reduced electron mean free path. The temperature dependence of the absolute Seebeck coefficient depends on size effects. Thermodiffusion and phonon drag are reduced with respect to the bulk material and the ratio of electron-phonon to phonon-phonon interaction is significantly increased.
Effect of phonon-boundary scattering on phonon-drag factor in Seebeck coefficient of Si wire
