Measurement of fibre density and fibre bundles in the skin of sheep from different breeds

1998 ◽  
Vol 49 (1) ◽  
pp. 113
Author(s):  
B. N. Nagorcka ◽  
A. E. Dollin ◽  
A. J. Ringrose-Voase
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Average Distance ◽  
Fibre Diameter ◽  
Total Density ◽  
Sem Images ◽  
Fibre Bundles ◽  
Fibre Density ◽  
Wide Range ◽  
Scanning Electron

A procedure for analysing digitised scanning electron microscope (SEM) images of impressions of sheep skin has been developed and tested. The new technique for measuring fibre densities and fibre bundles was applied to a small number of sheep from the Romney, Border Leicester, and Suffolk breeds, and in fine- and strong-woolled Merinos. Skin impressions were taken from small shaved areas of the skin, and fibres in digitised SEM images of the skin impressions were counted and assigned to bundles. Estimates were made of the density of epidermal follicles, the proportion of these which branch, the number of fibres (follicles) per bundle, and the proportion of skin left bare of follicles. An average distance between neighbouring epidermal follicles, Λ E, was also measured. Λ E was found to be correlated with fibre diameter. The total density of fibres (follicles) in the animals sampled ranged from 10 to 100 follicles/mm2 , and fibre diameter ranged from ~35 to ~15µm. Despite this wide range, all animals examined were observed to have derived (branched) follicles. The fraction of epidermal follicles which branched varied from ~0·15 to ~0·45, and the average number of fibres (follicles) per bundle ranged from 2·2 to 3·8. Λ E was used to calculate an indicator of the fraction of skin which is bare of follicles. This was found to be substantial, varying between 0·4 and 0·7. Measurements were also made using both serial transverse and serial longitudinal skin sections. The results obtained with the different techniques were compared.

Thick photoresists for electroforming metallic microcomponents

2008 ◽  
Vol 222 (1) ◽  
pp. 37-42 ◽  
Author(s):  
X Wei ◽  
C-H Lee ◽  
Z Jiang ◽  
K Jiang
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Current Paper ◽  
Sem Images ◽  
Advantages And Disadvantages ◽  
Uv Lithography ◽  
Electroforming Process ◽  
Electroformed Nickel ◽  
Scanning Electron

Recently, microelectroforming has been extensively applied to fabricating metallic components for sensors, actuators, and other systems. Thick photoresists are used for making micromoulds for electroforming and closely related to the quality and costs of an electroforming process. In the current paper, thick UV photoresists SU8, BPR100, and KMPR are analysed and compared in their electroforming performance of nickel microcomponents. Optimized UV lithography processes are introduced for producing micromoulds in each of the resists and scanning electron microscope (SEM) images of the moulds are presented and analysed. Then, electroformed nickel components from the micromoulds are presented. Finally, applicability of the photoresists to electroforming microcomponents is discussed. Each of the resists demonstrates advantages and disadvantages to suit different applications.

PET Depolymerization Catalyzed by Sulfates under Microwave Irradiation

2012 ◽  
Vol 550-553 ◽  
pp. 792-797 ◽  
Author(s):  
Wei Lu Zhang ◽  
Xiao Ni Shi ◽  
Xin Zhang ◽  
Chun Hua Han ◽  
Dong Zhang
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Microwave Irradiation ◽  
Polyethylene Terephthalate ◽  
Sem Images ◽  
Scanning Electron

Different sulfates were used as the catalysts of polyethylene terephthalate (PET) depolymerization under microwave of 250 watts, in which ZnSO4presented the best catalysis in this reaction, and the depolymerization degree (DPD) of PET was reached to 90 %. It was found that the depolymerization was occurred simultaneously on the surface and the internal parts of PET chips by the observation of scanning electron microscope (SEM) images. In addition, DPD increased with the improvement of the polarization forces of these sulfates.

scholarly journals A Review on Machine and Deep Learning for Semiconductor Defect Classification in Scanning Electron Microscope Images

2021 ◽  
Vol 11 (20) ◽  
pp. 9508
Author(s):  
Francisco López de la Rosa ◽  
Roberto Sánchez-Reolid ◽  
José L. Gómez-Sirvent ◽  
Rafael Morales ◽  
Antonio Fernández-Caballero
Keyword(s):  
Deep Learning ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Defect Detection ◽  
Scoping Review ◽  
Semiconductor Manufacturing ◽  
Manufacturing Industry ◽  
Future Research ◽  
Wide Range ◽  
Scanning Electron

Continued advances in machine learning (ML) and deep learning (DL) present new opportunities for use in a wide range of applications. One prominent application of these technologies is defect detection and classification in the manufacturing industry in order to minimise costs and ensure customer satisfaction. Specifically, this scoping review focuses on inspection operations in the semiconductor manufacturing industry where different ML and DL techniques and configurations have been used for defect detection and classification. Inspection operations have traditionally been carried out by specialised personnel in charge of visually judging the images obtained with a scanning electron microscope (SEM). This scoping review focuses on inspection operations in the semiconductor manufacturing industry where different ML and DL methods have been used to detect and classify defects in SEM images. We also include the performance results of the different techniques and configurations described in the articles found. A thorough comparison of these results will help us to find the best solutions for future research related to the subject.

scholarly journals QUALITY REINFORCEMENT OF ELECTROPLATING ZINC COATINGSELECTRODEPOSITED FROM CYANIDE FREE ALKALINE SOLUTION BY POLYAMINE 70.000 AND POLYVINYL ALCOHOL 16.000

2018 ◽  
Vol 55 (5B) ◽  
pp. 18
Author(s):  
Truong Thi Nam
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Polyvinyl Alcohol ◽  
Zinc Coating ◽  
Alkaline Solutions ◽  
Zinc Ions ◽  
Sem Images ◽  
Zinc Coatings ◽  
Scanning Electron ◽  
Good Agreement

Zinc coatings have been deposited electrochemically from cyanine free alkaline solutions containing zinc ions with the presence of polyamine 70.000 and polyvinyl alcohol at different contents. The scanning electron microscope (SEM) images showed that the size of zinc grains decreased with the presence of polyamine 70.000 and polyvinyl alcohol with smoother surface of zinc coating. The polarization measurements also revealed that the coatings with the presence of polyamine or polyvinyl alcohol possessed higher value of polarity degree. This result is in good agreement with the result obtained from SEM images.

Charge Contrast Imaging (CCI) in the Environmental Scanning Electron Microscope: Optimizing Operating Parameters for Calcite

2001 ◽  
Vol 7 (S2) ◽  
pp. 780-781
Author(s):  
Eric Doehne ◽  
David Carson
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Defect Density ◽  
Imaging System ◽  
Environmental Scanning Electron Microscope ◽  
Small Scale ◽  
Environmental Scanning ◽  
Contrast Imaging ◽  
Wide Range ◽  
Scanning Electron

Charge contrast imaging (CCI) is a useful new method for imaging sub-micron features in crystalline materials using the unique gas/ion/electron imaging system of the environmental scanning electron microscope (Griffin, 1997; Doehne, 1998). Crystal growth zoning, microfractures, solution boundaries, and areas of chemical alteration or recrystallization can be imaged in a wide range of materials (Griffin, 2000; Watt, et al. 2000). While not fully understood, charge contrast images reflect differences in the ability of materials to accept, store and discharge deposited electrons from the primary electron beam. These differences are expressed, in turn, as contrasts in secondary electron emission from flat samples (e.g. these contrasts are not related to topography, as is usually the case). Charge contrast appears be related to differences in electronic properties which are often controlled by defect density. CCI is also affected by small-scale physical defects (such as microfractures) which appear to affect the distribution and timing of charge buildup and discharge in the sample (Johansen, et al. 1997).

scholarly journals Determination of the Effective Detector Area of an Energy-Dispersive X-Ray Spectrometer at the Scanning Electron Microscope Using Experimental and Theoretical X-Ray Emission Yields

2016 ◽  
Vol 22 (6) ◽  
pp. 1360-1368 ◽  
Author(s):  
Mathias Procop ◽  
Vasile-Dan Hodoroaba ◽  
Ralf Terborg ◽  
Dirk Berger
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Count Rate ◽  
Effective Area ◽  
Energy Dispersive ◽  
X Ray ◽  
Active Sensor ◽  
Wide Range ◽  
Specific Geometry ◽  
Scanning Electron

AbstractA method is proposed to determine the effective detector area for energy-dispersive X-ray spectrometers (EDS). Nowadays, detectors are available for a wide range of nominal areas ranging from 10 up to 150 mm2. However, it remains in most cases unknown whether this nominal area coincides with the “net active sensor area” that should be given according to the related standard ISO 15632, or with any other area of the detector device. Moreover, the specific geometry of EDS installation may further reduce a given detector area. The proposed method can be applied to most scanning electron microscope/EDS configurations. The basic idea consists in a comparison of the measured count rate with the count rate resulting from known X-ray yields of copper, titanium, or silicon. The method was successfully tested on three detectors with known effective area and applied further to seven spectrometers from different manufacturers. In most cases the method gave an effective area smaller than the area given in the detector description.

Performance enhancement of Scanning Electron Microscope using a Deep Convolutional Neural Network

2022 ◽  
Author(s):  
Suresh Panchal ◽  
Unnikrishnan Gopinathan ◽  
Suwarna Datar
Keyword(s):  
Neural Network ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Convolutional Neural Network ◽  
Performance Enhancement ◽  
Deep Convolutional Neural Network ◽  
Sem Images ◽  
Scan Rate ◽  
Charging Effect ◽  
Scanning Electron

Abstract We report noise reduction and image enhancement in Scanning Electron Microscope (SEM) imaging while maintaining a Fast-Scan rate during imaging, using a Deep Convolutional Neural Network (D-CNN). SEM images of non-conducting samples without conducting coating always suffer from charging phenomenon, giving rise to SEM images with low contrast or anomalous contrast and permanent damage to the sample. One of the ways to avoid this effect is to use Fast-Scan mode, which suppresses the charging effect fairly well. Unfortunately, this also introduces noise and gives blurred images. The D-CNN has been used to predict relatively noise-free images as obtained from a Slow-Scan from a noisy, Fast-Scan image. The predicted images from D-CNN have the sharpness of images obtained from a Slow-Scan rate while reducing the charging effect due to images obtained from Fast-Scan rates. We show that using the present method, and it is possible to increase the scanning rate by a factor of about seven with an output of image quality comparable to that of the Slow-Scan mode. We present experimental results in support of the proposed method.

Single Phase Pyrite Synthesized via Hydrothermal Method

2013 ◽  
Vol 562-565 ◽  
pp. 136-140 ◽  
Author(s):  
Zhao Tang Yang ◽  
Xiao Jiang Liu ◽  
Jing Song Liu ◽  
Xiu Li Feng
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Hydrothermal Method ◽  
Single Phase ◽  
Sem Images ◽  
X Ray ◽  
Decreasing Ph ◽  
Size And Morphology ◽  
Ph Range ◽  
Scanning Electron

Single phase pyrite has been successfully prepared via the reaction of FeSO4·7H2O, S and Na2S·9H2O using hydrothermal method. The X-ray powder diffraction measurements confirm the formation of iron disulfides in the pH range of 1-12. Marcasite is formed at pH<4, the marcasite contents in the final products increasing with decreasing pH; when the pH is higher than 4, the final product is single phase pyrite. Scanning electron microscope (SEM) images reveal that both the pH and temperatures have significant effects on the size and morphology of final products. Pyrite micro-nanocubes of 200-400nm in length were synthesized at pH=9. Detailed information of the experimental results are analyzed in the results and discussion part.

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