Characterization of Irradiation Effect on 5251 Al-alloy using Rietveld X-Ray Diffraction Analysis

2021 ◽  
Author(s):  
Zoda Sayed ◽  
Mohamed Abdel-Rahman ◽  
Mamdoh Abdel-Rahman ◽  
Emad A. Badawi
Keyword(s):  
Diffraction Analysis ◽  
Al Alloy ◽  
Irradiation Effect ◽  
X Ray Diffraction ◽  
X Ray

Characterization of Cold Sprayed Copper Coatings on Al Alloy Substrate

2015 ◽  
Vol 3 (2) ◽  
pp. 41-53
Author(s):  
Tarun Goyal ◽  
T. S. Sidhu ◽  
R. S. Walia
Keyword(s):  
Spray Deposition ◽  
Structural Characteristics ◽  
Al Alloy ◽  
X Ray Diffraction ◽  
X Ray ◽  
Copper Coatings ◽  
Powder Particles ◽  
Micro Analysis ◽  
Hardness Values

This study reveals the successful low pressure cold spray deposition of near-uniform, defect free and dense copper coatings approximately 700-1900 µm thick, on Al alloy for electro-technical applications. The micro structural characteristics of the deposits have been studied using the combined techniques of X-ray diffraction (XRD), scanning electron microscopy (SEM), and energy dispersive X-ray spectroscopy (EDS) and electron-probe micro analysis (EPMA). The coatings exhibited characteristic splat-like, layered morphologies due to the deposition of solid powder particles which appeared to have been plastically deformed on impact to the substrate. The developed coatings have a dense (in the range of 3090-5015 kg/m3)and nearly uniform microstructure, with almost uniform hardness values in the range of 120 -140 Hv, and electrical conductivity in the range of 23-30 MS/m. EDAX, XRD and EPMA results revealed that the main constituent in the coating is Cu.

Synthesis and Characterization of Tetrakis(pentafluoroethyl)germane

Synthesis ◽  
2017 ◽  
Vol 49 (11) ◽  
pp. 2389-2393 ◽  
Author(s):  
Stefanie Pelzer ◽  
Beate Neumann ◽  
Hans-Georg Stammler ◽  
Nikolai Ignat’ev ◽  
Reint Eujen ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Nmr Spectroscopy ◽  
Ir Spectroscopy ◽  
Diffraction Analysis ◽  
Spectroscopic Characterization ◽  
Synthesis And Characterization ◽  
X Ray Diffraction ◽  
X Ray ◽  
Comprehensive Characterization

This paper describes the synthesis and comprehensive characterization of tetrakis(pentafluoroethyl)germane. In addition to a complete NMR spectroscopic characterization, including the rarely used 73Ge NMR spectroscopy, Ge(C2F5)4 was studied by IR spectroscopy, mass spectrometry as well as X-ray diffraction analysis. A 73Ge NMR investigation as well as an X-ray diffraction study of the related germane Ge(CF3)4 are also included.

Synthesis and characterization of the pentazolate anion cyclo-N5ˉ in (N5)6(H3O)3(NH4)4Cl

Science ◽  
2017 ◽  
Vol 355 (6323) ◽  
pp. 374-376 ◽  
Author(s):  
Chong Zhang ◽  
Chengguo Sun ◽  
Bingcheng Hu ◽  
Chuanming Yu ◽  
Ming Lu
Keyword(s):  
Thermal Analysis ◽  
Single Crystal ◽  
Diffraction Analysis ◽  
Decomposition Temperature ◽  
Synthesis And Characterization ◽  
X Ray Diffraction ◽  
X Ray ◽  
Onset Decomposition Temperature ◽  
The Stability

Pentazole (HN5), an unstable molecular ring comprising five nitrogen atoms, has been of great interest to researchers for the better part of a century. We report the synthesis and characterization of the pentazolate anion stabilized in a (N5)6(H3O)3(NH4)4Cl salt. The anion was generated by direct cleavage of the C–N bond in a multisubstituted arylpentazole using m-chloroperbenzoic acid and ferrous bisglycinate. The structure was confirmed by single-crystal x-ray diffraction analysis, which highlighted stabilization of the cyclo-N5ˉ ring by chloride, ammonium, and hydronium. Thermal analysis indicated the stability of the salt below 117°C on the basis of thermogravimetry-measured onset decomposition temperature.

SYNTHESIS AND CHARACTERIZATION OF La2Ca3Cu4Oy

1999 ◽  
Vol 13 (12n13) ◽  
pp. 451-453
Author(s):  
K. JEYABALAN ◽  
L. K. KALIYAPERUMAL
Keyword(s):  
Diffraction Analysis ◽  
Lattice Parameters ◽  
Synthesis And Characterization ◽  
Orthorhombic Structure ◽  
X Ray Diffraction ◽  
X Ray

Synthesis and characterization of La 2 Ca 3 Cu 4 O y compound is reported here. The powder X-ray diffraction analysis shows that the system belongs to an orthorhombic structure and the lattice parameters are a = 3.814(4)Å, b = 3.930(5)Å and c = 34.772(3)Å.

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