scholarly journals Correlation between Gilbert damping and electric resistivity in Fe94Co6/GaAs single crystal thin films: A role of electron scattering

2017 ◽  
Vol 903 ◽  
pp. 012063
Author(s):  
Akihiro Iwasaki ◽  
Takahiko Suzuki ◽  
Nobuyuki Inaba ◽  
Yutaka Takahashi ◽  
Fumiyoshi Kirino ◽  
...  
1996 ◽  
Vol 427 ◽  
Author(s):  
R. T. Tung

AbstractThe phenomenon of Ti-interlayer mediated epitaxy (TIME) of CoSi2 on Si(100) has attracted much academic and technological interest. As yet, the role of the interlayer, Ti, is not fully understood. The various drawbacks of the TIME process have driven the search for a better interlayer. New results are presented which demonstrate the efficacy of a thin SiOx layer, grown in a peroxide-containing aqueous solution, in inducing nearly perfect epitaxial growth of CoSi2 on practically all surfaces of Si. This technique, dubbed oxide mediated epitaxy (OME), allows a thin layer of epitaxial CoSi2 to grow sub-surface, leaving the SiOx layer largely on the surface of the silicide. An interesting result of the surface oxide cap is a significant re-evaporation of cobalt observed during deposition at elevated temperatures. Thicker (10-30nm), excellent quality, CoSi2 single crystal thin films have been grown by repeated growth sequences on Si(100), (110), (211) and (511). Nearly perfect type A oriented CoSi2 layers were grown on Si(111) using mixed A/B oriented template layers.


RSC Advances ◽  
2016 ◽  
Vol 6 (37) ◽  
pp. 30813-30823 ◽  
Author(s):  
Sergio Battiato ◽  
Maria M. Giangregorio ◽  
Maria R. Catalano ◽  
Raffaella Lo Nigro ◽  
Maria Losurdo ◽  
...  

NiO thin films were grown through MOCVD on quartz and LaAlO3 (001) single crystal substrates. The relationship between the precursor/substrate nature and film properties allowed to define the best conditions to grow good quality NiO films.


Author(s):  
L.J. Chen ◽  
Y.F. Hsieh

One measure of the maturity of a device technology is the ease and reliability of applying contact metallurgy. Compared to metal contact of silicon, the status of GaAs metallization is still at its primitive stage. With the advent of GaAs MESFET and integrated circuits, very stringent requirements were placed on their metal contacts. During the past few years, extensive researches have been conducted in the area of Au-Ge-Ni in order to lower contact resistances and improve uniformity. In this paper, we report the results of TEM study of interfacial reactions between Ni and GaAs as part of the attempt to understand the role of nickel in Au-Ge-Ni contact of GaAs.N-type, Si-doped, (001) oriented GaAs wafers, 15 mil in thickness, were grown by gradient-freeze method. Nickel thin films, 300Å in thickness, were e-gun deposited on GaAs wafers. The samples were then annealed in dry N2 in a 3-zone diffusion furnace at temperatures 200°C - 600°C for 5-180 minutes. Thin foils for TEM examinations were prepared by chemical polishing from the GaA.s side. TEM investigations were performed with JE0L- 100B and JE0L-200CX electron microscopes.


Author(s):  
L. Tang ◽  
G. Thomas ◽  
M. R. Khan ◽  
S. L. Duan

Cr thin films are often used as underlayers for Co alloy magnetic thin films, such as Co1, CoNi2, and CoNiCr3, for high density longitudinal magnetic recording. It is belived that the role of the Cr underlayer is to control the growth and texture of the Co alloy magnetic thin films, and, then, to increase the in plane coercivity of the films. Although many epitaxial relationship between the Cr underlayer and the magnetic films, such as ﹛1010﹜Co/ {110﹜Cr4, ﹛2110﹜Co/ ﹛001﹜Cr5, ﹛0002﹜Co/﹛110﹜Cr6, have been suggested and appear to be related to the Cr thickness, the texture of the Cr underlayer itself is still not understood very well. In this study, the texture of a 2000 Å thick Cr underlayer on Nip/Al substrate for thin films of (Co75Ni25)1-xTix dc-sputtered with - 200 V substrate bias is investigated by electron microscopy.


Author(s):  
C. Ewins ◽  
J.R. Fryer

The preparation of thin films of organic molecules is currently receiving much attention because of the need to produce good quality thin films for molecular electronics. We have produced thin films of the polycyclic aromatic, perylene C10H12 by evaporation under high vacuum onto a potassium chloride (KCl) substrate. The role of substrate temperature in determining the morphology and crystallography of the films was then investigated by transmission electron microscopy (TEM).The substrate studied was the (001) face of a freshly cleaved crystal of KCl. The temperature of the KCl was controlled by an electric heater or a cold finger. The KCl was heated to 200°C under a vacuum of 10-6 torr and allowed to cool to the desired temperature. The perylene was then evaporated over a period of one minute from a molybdenum boat at a distance of 10cm from the KCl. The perylene thin film was then backed with an amorphous layer of carbon and floated onto copper microscope grids.


2018 ◽  
Vol 10 (3) ◽  
pp. 03005-1-03005-6 ◽  
Author(s):  
Rupali Kulkarni ◽  
◽  
Amit Pawbake ◽  
Ravindra Waykar ◽  
Ashok Jadhawar ◽  
...  

2021 ◽  
Vol 46 (5) ◽  
pp. 4137-4153
Author(s):  
Neha Verma ◽  
Rob Delhez ◽  
Niek M. van der Pers ◽  
Frans D. Tichelaar ◽  
Amarante J. Böttger

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