scholarly journals Multi-element X-ray movie imaging with a visible-light CMOS camera

2019 ◽  
Vol 26 (1) ◽  
pp. 230-233 ◽  
Author(s):  
Wenyang Zhao ◽  
Kenji Sakurai
Keyword(s):  
Visible Light ◽  
Spatial Resolution ◽  
Complementary Metal Oxide Semiconductor ◽  
Chemical Diffusion ◽  
Oxide Semiconductor ◽  
Acquisition Time ◽  
Cmos Camera ◽  
X Ray ◽  
Promising Tool ◽  
Efficient Option

For many years, X-ray movies have been considered a promising tool for exploring and providing insights into chemical reactions. A simultaneous multi-element X-ray movie can further clarify the behavior difference of various elements and help investigate their interactions. The present short communication illustrates how to conduct multi-element X-ray movie imaging in a synchrotron facility solely by placing a micro-pinhole in front of a visible-light complementary metal-oxide semiconductor (CMOS) camera. It has been found that the CMOS camera can resolve X-ray fluorescence spectra when it is specially operated. In this work, a spatial resolution of ∼15 µm was achieved. In the X-ray movie, a movie frame acquisition time of 2 min and a spatial resolution of ∼50 µm were simultaneously achieved. It is clear that the CMOS camera can be a cost-efficient option for many researchers who wish to establish their own setup for visualizing chemical diffusion in various reactions.

scholarly journals Complete Ring Artifacts Reduction Procedure for Lab-Based X-ray Nano CT Systems

Sensors ◽  
2021 ◽  
Vol 21 (1) ◽  
pp. 238
Author(s):  
Jakub Šalplachta ◽  
Tomáš Zikmund ◽  
Marek Zemek ◽  
Adam Břínek ◽  
Yoshihiro Takeda ◽  
...  
Keyword(s):  
High Efficiency ◽  
Image Inpainting ◽  
Simulated Data ◽  
Complementary Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Detection Accuracy ◽  
Reduction Procedure ◽  
X Ray ◽  
Artifacts Reduction ◽  
Ct Data

In this article, we introduce a new ring artifacts reduction procedure that combines several ideas from existing methods into one complex and robust approach with a goal to overcome their individual weaknesses and limitations. The procedure differentiates two types of ring artifacts according to their cause and character in computed tomography (CT) data. Each type is then addressed separately in the sinogram domain. The novel iterative schemes based on relative total variations (RTV) were integrated to detect the artifacts. The correction process uses the image inpainting, and the intensity deviations smoothing method. The procedure was implemented in scope of lab-based X-ray nano CT with detection systems based on charge-coupled device (CCD) and scientific complementary metal–oxide–semiconductor (sCMOS) technologies. The procedure was then further tested and optimized on the simulated data and the real CT data of selected samples with different compositions. The performance of the procedure was quantitatively evaluated in terms of the artifacts’ detection accuracy, the comparison with existing methods, and the ability to preserve spatial resolution. The results show a high efficiency of ring removal and the preservation of the original sample’s structure.

scholarly journals Simple low dose radiography allows precise lung volume assessment in mice

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Amara Khan ◽  
Andrea Markus ◽  
Thomas Rittmann ◽  
Jonas Albers ◽  
Frauke Alves ◽  
...  
Keyword(s):  
Lung Function ◽  
Whole Body ◽  
Acquisition Time ◽  
Micro Ct ◽  
Lung Volumes ◽  
X Ray ◽  
Promising Tool ◽  
Volume Assessment ◽  
Set Up ◽  
Time Required

AbstractX-ray based lung function (XLF) as a planar method uses dramatically less X-ray dose than computed tomography (CT) but so far lacked the ability to relate its parameters to pulmonary air volume. The purpose of this study was to calibrate the functional constituents of XLF that are biomedically decipherable and directly comparable to that of micro-CT and whole-body plethysmography (WBP). Here, we developed a unique set-up for simultaneous assessment of lung function and volume using XLF, micro-CT and WBP on healthy mice. Our results reveal a strong correlation of lung volumes obtained from radiographic XLF and micro-CT and demonstrate that XLF is superior to WBP in sensitivity and precision to assess lung volumes. Importantly, XLF measurement uses only a fraction of the radiation dose and acquisition time required for CT. Therefore, the redefined XLF approach is a promising tool for preclinical longitudinal studies with a substantial potential of clinical translation.

scholarly journals Characterization of dislocations in germanium layers grown on (011)- and (111)-oriented silicon by coplanar and noncoplanar X-ray diffraction

2015 ◽  
Vol 48 (3) ◽  
pp. 655-665 ◽  
Author(s):  
Andrei Benediktovitch ◽  
Alexei Zhylik ◽  
Tatjana Ulyanenkova ◽  
Maksym Myronov ◽  
Alex Ulyanenkov
Keyword(s):  
Dislocation Line ◽  
Complementary Metal Oxide Semiconductor ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Misfit Dislocations ◽  
X Ray Diffraction ◽  
X Ray ◽  
Lattice Constants ◽  
Silicon And Germanium

Strained germanium grown on silicon with nonstandard surface orientations like (011) or (111) is a promising material for various semiconductor applications, for example complementary metal-oxide semiconductor transistors. However, because of the large mismatch between the lattice constants of silicon and germanium, the growth of such systems is challenged by nucleation and propagation of threading and misfit dislocations that degrade the electrical properties. To analyze the dislocation microstructure of Ge films on Si(011) and Si(111), a set of reciprocal space maps and profiles measured in noncoplanar geometry was collected. To process the data, the approach proposed by Kaganer, Köhler, Schmidbauer, Opitz & Jenichen [Phys. Rev. B, (1997),55, 1793–1810] has been generalized to an arbitrary surface orientation, arbitrary dislocation line direction and noncoplanar measurement scheme.

Practical Estimation of Analytical Sensitivity for EDS in an Intermediate Voltage FEG-STEM

1997 ◽  
Vol 3 (S2) ◽  
pp. 965-966
Author(s):  
M. Watanabe ◽  
D. W. Ackland ◽  
D. B. Williams
Keyword(s):  
Spatial Resolution ◽  
Single Atom ◽  
Acquisition Time ◽  
Analytical Sensitivity ◽  
X Ray ◽  
Quantitative Microanalysis ◽  
Analytical Electron ◽  
Atom Detection ◽  
Electron Microscopes ◽  
Image Position

One of the ultimate objectives for energy-dispersive X-ray spectrometry (EDS) in the analytical electron microscope (AEM) is single-atom detection in thin specimens, as well as quantitative microanalysis with high accuracy approaching ±1% relative. In order to realize the single-atom analysis, the design of the AEM has to be optimized with respect to improvements in spatial resolution and detectability limits. The detectability limit, as defined by the minimum mass fraction (MMF), is given by:where P is the peak intensity of interest, (P/B) is the peak-to-background ratio for that peak, and r is the acquisition time. To improve the sensitivity for analysis, any or all of the variables P, (P/B), and τ should be increased. Intermediate-voltage analytical electron microscopes combined with high brightness field-emission gun (FEG) are expected to improve the MMF, while maintaining high spatial resolution. Additionally, the MMF should also be improved by maximizing the solid angle of X-ray collection.

Hyperspectral Raman Imaging Using a Spatial Heterodyne Raman Spectrometer with a Microlens Array

2020 ◽  
Vol 74 (8) ◽  
pp. 921-931 ◽  
Author(s):  
Ashley Allen ◽  
Abigail Waldron ◽  
Joshua M. Ottaway ◽  
J. Chance Carter ◽  
S. Michael Angel
Keyword(s):  
Raman Spectra ◽  
Spatial Resolution ◽  
Spectral Resolution ◽  
Diffraction Gratings ◽  
Complementary Metal Oxide Semiconductor ◽  
Microlens Array ◽  
Raman Imaging ◽  
Oxide Semiconductor ◽  
Raman Spectrometer ◽  
A Charge

A new hyperspectral Raman imaging technique is described using a spatial heterodyne Raman spectrometer (SHRS) and a microlens array (MLA). The new technique enables the simultaneous acquisition of Raman spectra over a wide spectral range at spatially isolated locations within two spatial dimensions ( x, y) using a single exposure on a charge-coupled device (CCD) or other detector types such as a complementary metal-oxide semiconductor (CMOS) detector. In the SHRS system described here, a 4 × 4 mm MLA with 1600, 100 µm diameter lenslets is used to image the sample, with each lenslet illuminating a different region of the SHRS diffraction gratings and forming independent fringe images on the CCD. The fringe images from each lenslet contain the fully encoded Raman spectrum of the region of the sample “seen” by the lenslet. Since the SHRS requires no moving parts, all fringe images can be measured simultaneously with a single detector exposure, and in principle using a single laser shot, in the case of a pulsed laser. In this proof of concept paper, hyperspectral Raman spectra of a wide variety of heterogeneous samples are used to characterize the technique in terms of spatial and spectral resolution tradeoffs. It is shown that the spatial resolution is a function of the diameter of the MLA lenslets, while the number of spatial elements that can be resolved is equal to the number of MLA lenslets that can be imaged onto the SHRS detector. The spectral resolution depends on the spatial resolution desired, and the number of grooves illuminated on both diffraction gratings by each lenslet, or combination of lenslets in cases where they are grouped.

Research on Testing Technology of CMOS Camera Module

2013 ◽  
Vol 378 ◽  
pp. 408-412
Author(s):  
Shou Lei Sun ◽  
Gui Tang Wang ◽  
Ying Ge Li ◽  
Zheng Li
Keyword(s):  
Transfer Function ◽  
Modulation Transfer Function ◽  
Complementary Metal Oxide Semiconductor ◽  
Test Method ◽  
Oxide Semiconductor ◽  
Modulation Transfer ◽  
Cmos Camera ◽  
Average Value ◽  
Camera Module ◽  
Testing Technology

After the completion of the CMOS(Complementary Metal-Oxide-Semiconductor Transistor) camera module assembly,in order to test the image quality of module. In this paper, based on the ISO12233 standard chart proposing a CMOS camera module modulation transfer function MTF (modulation transfer function) of test method, MTF average value calculated for each module with high contrast and grayscale method, and validation processing to detect unqualified imaging module. The results show that MTF detection method used in this paper can quickly and accurately detect the quality camera module, and stable and reliable, playing an important role to found the quality problems and improve the efficiency of production.

Sign in / Sign up

Export Citation Format

Share Document