scholarly journals 2 MHz high-density integrated power supply for gate driver in high-temperature applications

Author(s):  
Remi Perrin ◽  
Bruno Allard ◽  
Cyril Buttay ◽  
Nicolas Quentin ◽  
Wenli Zhang ◽  
...  
2008 ◽  
Vol 1 (1) ◽  
pp. 817-821 ◽  
Author(s):  
Patricia C. Irwin ◽  
Daniel Qi Tan ◽  
Yang Cao ◽  
Norberto Silvi ◽  
Mark Carter ◽  
...  

2014 ◽  
Vol 2014 (HITEC) ◽  
pp. 000206-000213
Author(s):  
David Gras ◽  
Christophe Pautrel ◽  
Amir Fanaei ◽  
Gregory Thepaut ◽  
Maxime Chabert ◽  
...  

In this paper we present a highly integrated, high-temperature isolated, half-bridge power gate driver demo board, based on turnkey X-REL chipset: XTR26010 (High-Temperature Intelligent Gate Driver), XTR40010 (High-Temperature Isolated Two Channel Transceiver), XTR30010 (High-Temperature PWM Controller), and XTR2N0825 (High-Temperature 80V N-Channel Power MOSFET). The XTR26010 is the key circuit in this chipset for power gate drive application. The XTR26010 circuit has been designed with a high focus in offering a robust, reliable and efficient solution for driving a large variety of high-temperature, high-voltage, and high-efficiency power transistors (SiC, GaN, Si) existing in the market. Furthermore, the XTR26010 circuit implements an unprecedented functionality for high-temperature drivers allowing safe operation at system level by preventing any cross-conduction between high-side and low-side switches, through isolated communication between high-side and low-side drivers. The XTR40010 is used for isolated data communication between a microcontroller or a PWM controller with the power driver (XTR26010). For supplying the half-bridge gate driver, a compact isolated flyback power supply has been developed thanks to the versatile voltage mode PWM controller XTR30010 and the XT2N0825 N-Channel MOSFET. The full system has been successfully tested while driving different brands of SiC MOSFETs up to Ta=200°C, 600kHz of switching frequency and 600V high-voltage bus (limited by isolation transformers used). The demo board presented can be easily modified to drive other SiC and GaN transistors available in the market. The 200°C limitation of the demo board is due to passives, PCB material, and the solder paste used. However, all X-REL active circuits have been qualified within specifications well above 230°C.


2012 ◽  
Vol 2012 (HITEC) ◽  
pp. 000207-000213
Author(s):  
B. M. McCue ◽  
R. L. Greenwell ◽  
M. I. Laurence ◽  
B. J. Blalock ◽  
S. K. Islam ◽  
...  

Developments in automotive (particularly hybrid-electric vehicles), aerospace, and energy production industries have led to expanding research interest in integrated circuit (IC) design toward high-temperature applications. A high-voltage, high-temperature silicon-on-insulator (SOI) process allows for circuit design to expand into these extreme environment applications. Nearly all electronic devices require a reliable supply voltage capable of operating under various supply voltages and load currents. These supply voltages and load currents can be either DC or time-varying signals. In this work, a stable supply voltage for embedded circuits is generated on chip via a voltage regulator producing a stable 5-V output voltage. Although applications of this voltage regulator are not limited to gate driver circuits, this regulator has been developed to meet the demands of a gate driver IC. The voltage regulator must be able to provide reliable output voltage over an input range from 10 V to 30 V, a temperature range of −25°C to 200°C, and output loads from 0 mA to 200 mA. Additionally, low power stand-by operation is provided to help reduce heat generation resulting in lower operating junction temperature. The designed voltage regulator has been successfully tested from −50°C to 200°C while demonstrating an output voltage variation of less than 10 mV under the full range of input voltage. Additionally, line regulation tests from 10 V to 30 V show a 12-ppm/V supply sensitivity. Full temperature and input voltage range tests reveal that the no-load supply current draw is within 17 mA while still providing in excess of 200-mA load current upon demand. Modifications to the existing design or off-chip biasing can widen the range of attainable output voltages and drive capabilities.


Author(s):  
R. E. Franck ◽  
J. A. Hawk ◽  
G. J. Shiflet

Rapid solidification processing (RSP) is one method of producing high strength aluminum alloys for elevated temperature applications. Allied-Signal, Inc. has produced an Al-12.4 Fe-1.2 V-2.3 Si (composition in wt pct) alloy which possesses good microstructural stability up to 425°C. This alloy contains a high volume fraction (37 v/o) of fine nearly spherical, α-Al12(Fe, V)3Si dispersoids. The improved elevated temperature strength and stability of this alloy is due to the slower dispersoid coarsening rate of the silicide particles. Additionally, the high v/o of second phase particles should inhibit recrystallization and grain growth, and thus reduce any loss in strength due to long term, high temperature annealing.The focus of this research is to investigate microstructural changes induced by long term, high temperature static annealing heat-treatments. Annealing treatments for up to 1000 hours were carried out on this alloy at 500°C, 550°C and 600°C. Particle coarsening and/or recrystallization and grain growth would be accelerated in these temperature regimes.


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