Analytical model to study temperature dependent Negative Capacitance effect on long channel Double Gate Ferroelectric Junctionless Transistor
2018 ◽
Vol 65
(7)
◽
pp. 2699-2706
◽
Keyword(s):
Keyword(s):
Keyword(s):
2018 ◽
Vol 117
◽
pp. 189-199
◽