Deterioration mechanism of flip chip attachment using an anisotropic conductive film and design technology for high reliability

Author(s):  
S. Fujiwara ◽  
M. Harada ◽  
Y. Fujita ◽  
T. Hachiya ◽  
M. Muramatsu
1999 ◽  
Vol 22 (4) ◽  
pp. 575-581 ◽  
Author(s):  
Myung-Jin Yim ◽  
Woonghwan Ryu ◽  
Young-Doo Jeon ◽  
Junho Lee ◽  
Seungyoung Ahn ◽  
...  

Author(s):  
Hideo Koguchi ◽  
Nipon Taweejun ◽  
Kazuto Nishida ◽  
Chie Sasaki

Chip-size packaging (CSP) attracts largely attentions due to its lighter, thinner and smaller size. In this study, the deformations and the stresses in the CSP fabricated by non-conductive film stud-bump direct interconnection (NSD) were analyzed. The reliability evaluation of single-sided CSP and both-sided CSP were investigated for heat cycles. The material parameters, i.e. stresses, strains and deformations, for achieving a high reliability of CSP were investigated using a finite element method and experiment. The dependency of the life in single-sided CSP and both-sided CSP on the thicknesses of IC and substrate could be expressed using a normal stress in the thickness direction and shear stress in the vertical cross section, respectively.


2004 ◽  
Vol 33 (1) ◽  
pp. 76-82 ◽  
Author(s):  
Myung Jin Yim ◽  
Jin-Sang Hwang ◽  
Jin Gu Kim ◽  
Jin Yong Ahn ◽  
Hyung Joon Kim ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document