Temperature dependence of SiC thin film metal-insulator-metal (MIM) capacitors on alumina over a temperature range from 25 to 500ºC

2011 IEEE 61st Electronic Components and Technology Conference (ECTC) ◽

10.1109/ectc.2011.5898641 ◽

2011 ◽

Cited By ~ 2

Author(s):

Maximilian C. Scardelletti ◽

George E. Ponchak ◽

Jennifer L. Jordan ◽

Nicholas C. Varaljay ◽

Elizabeth A. McQuaid ◽

...

Keyword(s):

Thin Film ◽

Temperature Dependence ◽

Metal Insulator ◽

Temperature Range ◽

Metal Insulator Metal ◽

Mim Capacitors

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New insight into tantalum pentoxide Metal-Insulator-Metal (MIM) capacitors: Leakage current modeling, self-heating, reliability assessment and industrial applications

2008 IEEE International Reliability Physics Symposium ◽

10.1109/relphy.2008.4558891 ◽

2008 ◽

Cited By ~ 2

Author(s):

V. Martinez ◽

C. Besset ◽

F. Monsieur ◽

D. Ney ◽

L. Montes ◽

...

Keyword(s):

Leakage Current ◽

Reliability Assessment ◽

Industrial Applications ◽

Tantalum Pentoxide ◽

Metal Insulator ◽

Self Heating ◽

Metal Insulator Metal ◽

Insight Into ◽

Mim Capacitors

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Effects of dielectric thickness and contact area on current–voltage characteristics of thin film metal–insulator–metal diodes

Thin Solid Films ◽

10.1016/j.tsf.2007.08.067 ◽

2008 ◽

Vol 516 (8) ◽

pp. 2244-2250 ◽

Cited By ~ 55

Author(s):

Subramanian Krishnan ◽

Elias Stefanakos ◽

Shekhar Bhansali

Keyword(s):

Thin Film ◽

Contact Area ◽

Metal Insulator ◽

Dielectric Thickness ◽

Current Voltage ◽

Metal Insulator Metal ◽

Current Voltage Characteristics

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Temperature dependence of thin film spiral inductors on Alumina over a temperature range of 25 to 475° C

2010 Proceedings 60th Electronic Components and Technology Conference (ECTC) ◽

10.1109/ectc.2010.5490775 ◽

2010 ◽

Cited By ~ 4

Author(s):

George E. Ponchak ◽

Jennifer L. Jordan ◽

Maximilian C Scardelletti

Keyword(s):

Thin Film ◽

Temperature Dependence ◽

Temperature Range ◽

Spiral Inductors

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$hboxBaSm_2hboxTi_4hboxO_12$Thin Film for High-Performance Metal–Insulator–Metal Capacitors

IEEE Electron Device Letters ◽

10.1109/led.2006.881085 ◽

2006 ◽

Vol 27 (9) ◽

pp. 740-742 ◽

Cited By ~ 5

Author(s):

B.J. Kim ◽

Y.H. Jeong ◽

B.Y. Jang ◽

J.B. Lim ◽

S. Nahm ◽

...

Keyword(s):

Thin Film ◽

High Performance ◽

Metal Insulator ◽

Metal Insulator Metal

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An Empirical Investigation on the Effect of Oxygen Vacancy in ZrO₂ Thin Film on the Frequency-Dependent Capacitance Degradation in the Metal-Insulator-Metal Capacitor

IEEE Transactions on Electron Devices ◽

10.1109/ted.2021.3110837 ◽

2021 ◽

pp. 1-5

Author(s):

Dong Hee Han ◽

Seungwoo Lee ◽

Ji Hyeon Hwang ◽

Youngjin Kim ◽

Marceline Bonvalot ◽

...

Keyword(s):

Thin Film ◽

Oxygen Vacancy ◽

Empirical Investigation ◽

Metal Insulator ◽

Frequency Dependent ◽

Metal Insulator Metal ◽

Effect Of Oxygen

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Atomic Layer Deposition of High-k and Nanolaminate Dielectrics for Transparent Thin Film Transistors and Metal/Insulator/Metal Tunnel Diodes

ECS Meeting Abstracts ◽

10.1149/ma2011-01/22/1369 ◽

2011 ◽

Keyword(s):

Thin Film ◽

Atomic Layer Deposition ◽

Thin Film Transistors ◽

Atomic Layer ◽

Tunnel Diodes ◽

Metal Insulator ◽

Layer Deposition ◽

High K ◽

Metal Insulator Metal

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Design of radio frequency metal-insulator-metal (MIM) capacitors

Proceedings. 7th International Conference on Solid-State and Integrated Circuits Technology, 2004. ◽

10.1109/icsict.2004.1434989 ◽

2005 ◽

Cited By ~ 4

Author(s):

M.W.C. Goh ◽

Queennie Lim ◽

R.A. Keating ◽

A.V. Kordesch ◽

Y.B.M. Yusof

Keyword(s):

Radio Frequency ◽

Metal Insulator ◽

Metal Insulator Metal ◽

Mim Capacitors

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Thin Film Metal-Insulator-Metal Junction for Millimeter Wave Detection

Procedia Chemistry ◽

10.1016/j.proche.2009.07.102 ◽

2009 ◽

Vol 1 (1) ◽

pp. 409-412 ◽

Cited By ~ 15

Author(s):

S. Krishnan ◽

S. Bhansali ◽

E. Stefanakos ◽

Y. Goswami

Keyword(s):

Thin Film ◽

Millimeter Wave ◽

Metal Insulator ◽

Wave Detection ◽

Metal Insulator Metal

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Study of electrical properties of hafnium oxide thin film based metal–insulator–metal capacitors: pre and post metallic annealing

Journal of Materials Science Materials in Electronics ◽

10.1007/s10854-016-5783-8 ◽

2016 ◽

Vol 27 (12) ◽

pp. 12527-12532 ◽

Cited By ~ 3

Author(s):

O. Mangla ◽

V. Gupta

Keyword(s):

Thin Film ◽

Electrical Properties ◽

Hafnium Oxide ◽

Oxide Thin Film ◽

Metal Insulator ◽

Metal Insulator Metal

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Switching effects in metal-insulator-metal thin film devices

Thin Solid Films ◽

10.1016/0040-6090(70)90130-6 ◽

1970 ◽

Vol 6 (4) ◽

pp. R39-R42 ◽

Cited By ~ 9

Author(s):

R.R. Sutherland ◽

K.O. Legg ◽

R.A. Collins

Keyword(s):

Thin Film ◽

Metal Insulator ◽

Metal Thin Film ◽

Metal Insulator Metal ◽

Thin Film Devices

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