Experiments with the Stutter-Aid

1973 ◽  
Vol 36 (3_suppl) ◽  
pp. 1129-1130 ◽  
Author(s):  
William D. Trotter ◽  
Franklin H. Silverman
Keyword(s):  
Low Frequency ◽  
Noise Generator ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
The Impact

4 studies concerned with the impact of a miniature low-frequency noise generator (Stutter-Aid) on stuttering are summarized.

Ceiling Construction Low-Frequency Noise Issues

2013 ◽  
Vol 649 ◽  
pp. 277-280
Author(s):  
Petra Berková ◽  
Pavel Berka
Keyword(s):  
Spectral Analysis ◽  
Low Frequency ◽  
Sound Insulation ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Frequency Tone ◽  
The Impact ◽  
40 Hz

Through the use of a spectral analysis of the source of noise – person’s movement over the ceiling construction – it was found out that in this kind of noise distinctive low-frequency tone components occur (31,5 - 40 Hz) which is beyond the evaluation area of the impact sound insulation of the ceiling construction, s. [2], [3].

Low-frequency noise and static analysis of the impact of the TiN metal gate thicknesses on n- and p-channel MuGFETs

2010 ◽  
Vol 54 (12) ◽  
pp. 1592-1597 ◽  
Author(s):  
M. Rodrigues ◽  
J.A. Martino ◽  
A. Mercha ◽  
N. Collaert ◽  
E. Simoen ◽  
...  
Keyword(s):  
Static Analysis ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Metal Gate ◽  
Tin Metal ◽  
The Impact

Low Frequency Noise Analysis in Advanced CMOS Devices

2011 ◽  
Vol 324 ◽  
pp. 441-444 ◽  
Author(s):  
Jalal Jomaah ◽  
Majida Fadlallah ◽  
Gerard Ghibaudo
Keyword(s):  
Experimental Data ◽  
Noise Analysis ◽  
Low Frequency ◽  
Deep Submicron ◽  
Electrical Noise ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Noise Sources ◽  
The Impact ◽  
Mobility Fluctuations

A review of recent results concerning the low frequency noise in modern CMOS devices is given. The approaches such as the carrier number and the Hooge mobility fluctuations used for the analysis of the noise sources are illustrated through experimental data obtained on advanced CMOS generations. Furthermore, the impact on the electrical noise of the shrinking of CMOS devices in the deep submicron range is also shown.

Noise induced hearing loss in low frequencies in employees in a hospital microbiology department

2021 ◽  
Vol 7 (5) ◽  
pp. 861
Author(s):  
Konstantina Chrysouli ◽  
Dimitrios Kikidis
Keyword(s):  
Hearing Loss ◽  
Low Frequency ◽  
Control Group ◽  
Frequency Noise ◽  
Noise Induced Hearing Loss ◽  
Low Frequency Noise ◽  
Low Frequencies ◽  
History Of ◽  
Laboratory Workers ◽  
The Impact

<p class="abstract">Noise induced hearing loss (NIHL) is regarded as a serious problem and one of the most recorded occupational disorders in Europe and in the rest of the world and amounts to between 7% and 21% of the hearing loss. Aim of this study is to explore the development and the prevalence of low frequency noise-induced hearing loss (NIHL) in a hospital, especially in microbiology laboratory workers. Generally it is known that 4 KHz is the main NIHL frequency. Despite current theories, our study suggests for the first time the impact of low frequency noise in hearing loss among laboratory workers. According to the results, the population examined, namely the employees at the Microbiology Department of the Hospital, showed lower hearing levels compared to the control group, who had no history of occupational exposure to noise. There are many other studies which suggest that prolonged exposures to high noise levels have negative physiological and psychological effects on workers. The finding of the correlation of noise frequency with the frequency of the generated hearing loss is involved in the controversy about the pathophysiology of noise effect.</p>

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