Preliminary study on switching characteristics of silver tin oxide type contacts for capacitive load

Author(s):  
Wanbin Ren ◽  
Jianmin Wei ◽  
Xu Zhang ◽  
Fubiao Luo ◽  
Zhefeng Zhou ◽  
...  
2016 ◽  
Vol 62 (11) ◽  
pp. 944-952 ◽  
Author(s):  
Lotfi Mhamdi ◽  
Nejib Mhamdi ◽  
Naceur Mhamdi ◽  
Philippe Lejeune ◽  
Nicole Jaffrezic ◽  
...  

This preliminary study focused on the effect of exposure to 0.5 T static magnetic fields on Escherichia coli adhesion and orientation. We investigated the difference in bacterial adhesion on the surface of glass and indium tin oxide-coated glass when exposed to a magnetic field either perpendicular or parallel to the adhesion surface (vectors of magnetic induction are perpendicular or parallel to the adhesion surface, respectively). Control cultures were simultaneously grown under identical conditions but without exposure to the magnetic field. We observed a decrease in cell adhesion after exposure to the magnetic field. Orientation of bacteria cells was affected after exposure to a parallel magnetic field. On the other hand, no effect on the orientation of bacteria cells was observed after exposure to a perpendicular magnetic field.


2014 ◽  
Vol 211 (5) ◽  
pp. 1194-1199 ◽  
Author(s):  
Ali Khiat ◽  
Iulia Salaoru ◽  
Themistoklis Prodromakis

2017 ◽  
Vol 131 ◽  
pp. 34-38 ◽  
Author(s):  
Zhao Yang ◽  
Zhi Luo ◽  
Haitao Tang ◽  
Bo Huang ◽  
Weiguang Xie

2014 ◽  
Vol 680 ◽  
pp. 111-114
Author(s):  
Zaliman Sauli ◽  
Vithyacharan Retnasamy ◽  
Chai Jee Keng ◽  
Moganraj Palianysamy ◽  
Hussin Kamarudin

A study on the resistance of directly sputtered films and treated films of Indium Tin Oxide (ITO) is done to initiate an extensive study on the material. This study involves variation in terms of number of layers and duration of deposition. Treated films are produced by undergoing annealing process which is carried out using Split Type Tube Furnace. Resistance measurements were carried out using Semiconductor Parametric Analyzer (SPA). Results show that the directly sputtered ITO films produced lower resistance compared to the treated ITO films.


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