Investigation of Oxide and Interface Trapped Charge on Threshold Voltage Shift in Gamma Irradiated NMOSFET by Subthreshold Method
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2008 ◽
Vol 47
(4)
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pp. 2103-2107
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2008 ◽
Vol 47
(4)
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pp. 3189-3192
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2009 ◽
Vol 53
(2)
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pp. 140-144
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2013 ◽
Vol 60
(5)
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pp. 1689-1694
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