Active “multi-fingers”: Test structure to improve MOSFET matching in sub-threshold area
Keyword(s):
2014 ◽
Vol E97.C
(11)
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pp. 1117-1123
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Keyword(s):
Keyword(s):
2014 ◽
Vol 35
(2)
◽
pp. 178-180
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2016 ◽
Vol 24
(6)
◽
pp. 1051-1064
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1967 ◽
Vol 14
(2)
◽
pp. 299-307
◽
Keyword(s):
2012 ◽
Vol 25
(2)
◽
pp. 145-154
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