Mission profile analysis and calorimetric loss measurement of a SiC hybrid module for main inverter application of electric vehicles

Multiarm systems become the trends of space robots, for the on-orbit servicing missions are becoming more complex and various. A hierarchical task planning method with multiconstraint for multiarm space robot is presented in this paper. The process of task planning is separated into two hierarchies: mission profile analysis and task node planning. In mission profile analysis, several kinds of primitive tasks and operators are defined. Then, a complex task can be decomposed into a sequence of primitive tasks by using hierarchical task network (HTN) with those primitive tasks and operators. In task node planning,A⁎algorithm is improved to adapt the continuous motion of manipulator. Then, some of the primitive tasks which cannot be executed directly because of constraints are further decomposed into several task nodes by using improvedA⁎algorithm. Finally, manipulators execute the task by moving from one node to another with a simple path plan algorithm. The feasibility and effectiveness of the proposed task planning method are verified by simulation.

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Mission Profile-Oriented Active Thermal Control of a Bidirectional Three-Level Buck-Boost GaN-Based DC-DC Converter for Electric Vehicles Powertrains

10.1109/iecon48115.2021.9589692 ◽

2021 ◽

Author(s):

Christian A. Rojas ◽

Ruben Gonzalez ◽

Leonardo Callegaro ◽

Hector Young

Keyword(s):

Electric Vehicles ◽

Thermal Control ◽

Mission Profile

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Applications of SIMS to electronic materials and devices

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100133047 ◽

1992 ◽

Vol 50 (2) ◽

pp. 1682-1683

Author(s):

S.F. Corcoran

Keyword(s):

Depth Distribution ◽

Secondary Ion Mass Spectrometry ◽

Semiconductor Device ◽

Electronic Materials ◽

Profile Analysis ◽

Semiconductor Industry ◽

Small Diameter ◽

Depth Resolution ◽

Detection Sensitivity

Over the past decade secondary ion mass spectrometry (SIMS) has played an increasingly important role in the characterization of electronic materials and devices. The ability of SIMS to provide part per million detection sensitivity for most elements while maintaining excellent depth resolution has made this technique indispensable in the semiconductor industry. Today SIMS is used extensively in the characterization of dopant profiles, thin film analysis, and trace analysis in bulk materials. The SIMS technique also lends itself to 2-D and 3-D imaging via either the use of stigmatic ion optics or small diameter primary beams.By far the most common application of SIMS is the determination of the depth distribution of dopants (B, As, P) intentionally introduced into semiconductor materials via ion implantation or epitaxial growth. Such measurements are critical since the dopant concentration and depth distribution can seriously affect the performance of a semiconductor device. In a typical depth profile analysis, keV ion sputtering is used to remove successive layers the sample.

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Identifying Suicide Typologies Among Trauma-Exposed Veterans

Crisis ◽

10.1027/0227-5910/a000637 ◽

2020 ◽

Vol 41 (4) ◽

pp. 288-295 ◽

Cited By ~ 1

Author(s):

Nadia Bounoua ◽

Jasmeet P. Hayes ◽

Naomi Sadeh

Keyword(s):

Latent Profile Analysis ◽

Suicide Attempts ◽

Clinical Symptoms ◽

Profile Analysis ◽

Risky Behaviors ◽

Self Report ◽

Cross Sectional ◽

Research Priority ◽

Self Harm ◽

And Behaviors

Abstract. Background: Suicide among veterans has increased in recent years, making the identification of those at greatest risk for self-injurious behavior a high research priority. Aims: We investigated whether affective impulsivity and risky behaviors distinguished typologies of self-injurious thoughts and behaviors in a sample of trauma-exposed veterans. Method: A total of 95 trauma-exposed veterans (ages 21–55; 87% men) completed self-report measures of self-injurious thoughts and behaviors, impulsivity, and clinical symptoms. Results: A latent profile analysis produced three classes that differed in suicidal ideation, suicide attempts and nonsuicidal self-injury (NSSI): A low class that reported little to no self-injurious thoughts or behaviors; a self-injurious thoughts (ST) class that endorsed high levels of ideation but no self-harm behaviors; and a self-injurious thoughts and behaviors (STaB) class that reported ideation, suicide attempts and NSSI. Membership in the STaB class was associated with greater affective impulsivity, disinhibition, and distress/arousal than the other two classes. Limitations: Limitations include an overrepresentation of males in our sample, the cross-sectional nature of the data, and reliance on self-report measures. Conclusion: Findings point to affective impulsivity and risky behaviors as important characteristics of veterans who engage in self-injurious behaviors.

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