The analysis of the multilayer spiral inductors parameters at high frequency

Author(s):  
Sergiu Andreica ◽  
Claudia Pacurar ◽  
Vasile Topa ◽  
Adina Racasan ◽  
Claudia Constantinescu ◽  
...  
2010 ◽  
Vol 2010 (1) ◽  
pp. 000886-000890
Author(s):  
Bruce C. Kim ◽  
Dae-Hyun Han ◽  
Seok-Ho Noh

This paper presents high frequency measurement techniques of on-chip inductors in giga Hertz range for wireless communication products. The on-chip inductors were fabricated on high resistive substrate to reduce loss. We compared several different on-chip inductors for self-resonance frequency and quality factors. The collection of measurement data could be used for the guideline of designing practical spiral inductors for wireless applications.


Author(s):  
Telesphor Kamgaing ◽  
Chee Hoo Lee ◽  
Kyu-Pyung Hwang ◽  
Xiang Yin Zeng ◽  
Jiangqi He ◽  
...  

This paper discusses the design, modeling and characterization of RF inductors and baluns in a multilayer organic substrate. In the first part of the paper, we systematically look at two types of spiral inductors for RF applications. More than 40 multi-turn spiral inductors covering inductance values from a few nH to 20 nH have been fabricated and fully characterized. Single turn inductors suitable for high-frequency applications with inductance values in the sub-nH range have also been fabricated and evaluated. In the second part of the paper, we discuss the design of a Marchand-type balun for 2.4 GHz Bluetooth and WLAN application. This 50:100-Ohm balun design employs staggered trace arrangement which results in improved insertion loss and robust performance. Both measurement and simulation data are presented to validate the package-embedded components.


Author(s):  
Woon Choi ◽  
Shintaro Ono ◽  
Seiichiro Yoshida ◽  
Hajime Tomokage

In order to obtain full information on the high frequency performance of embedded passive elements, we design test elements group (TEG) substrates and compare the simulation result with measured data. S-parameters of spiral inductors embedded in low temperature co-fired ceramic (LTCC) substrates are simulated using high frequency structure simulator (HFSS), microwave studio (MWS) and advanced design simulator (ADS). Then effective inductance and Q factors are calculated from S-parameters after de-embedding process. Measurements of S-parameters are performed using a vector network analyzer in the frequency range up to 15 GHz. The simulation result with dimensional data measured by laser microscope and X-lay microscope is in good agreement with the experimental result. It is suggested that the simulation results can be applied to the design of system-in-a-package (SiP) substrate directly without making TEG.


Electronics ◽  
2021 ◽  
Vol 10 (23) ◽  
pp. 2897
Author(s):  
Claudia Pacurar ◽  
Vasile Topa ◽  
Adina Giurgiuman ◽  
Calin Munteanu ◽  
Claudia Constantinescu ◽  
...  

This paper deals with high frequency analysis of spiral inductors, used in microelectronics circuits, to optimize their configuration. Software developed, designed, and implemented by the authors for nano and micrometre spiral inductor high frequency analysis, named ABSIF, is presented in this paper. ABSIF determines the inductance, quality factor, and electrical parameters for square, hexagonal, octagonal, and circular spiral inductors and their configuration optimization for energy efficiency. ABSIF is a good tool for spiral inductor design optimization in high frequency applications and takes into account the imposed technological limits and/or the designers’ constraints. A set of spiral inductors are considered and analysed for high frequency values using ABSIF, and the results are presented in the paper. The validation of ABSIF was completed by comparing the results with those obtained using a similar commercial software, Sonnet LiteTM, which is dedicated to high frequency electromagnetic analysis.


2007 ◽  
Vol 51 (2) ◽  
pp. 89-100 ◽  
Author(s):  
Tonio Biondi ◽  
Angelo Scuderi ◽  
Egidio Ragonese ◽  
Giuseppe Palmisano

Author(s):  
W. E. Lee ◽  
A. H. Heuer

IntroductionTraditional steatite ceramics, made by firing (vitrifying) hydrous magnesium silicate, have long been used as insulators for high frequency applications due to their excellent mechanical and electrical properties. Early x-ray and optical analysis of steatites showed that they were composed largely of protoenstatite (MgSiO3) in a glassy matrix. Recent studies of enstatite-containing glass ceramics have revived interest in the polymorphism of enstatite. Three polymorphs exist, two with orthorhombic and one with monoclinic symmetry (ortho, proto and clino enstatite, respectively). Steatite ceramics are of particular interest a they contain the normally unstable high-temperature polymorph, protoenstatite.Experimental3mm diameter discs cut from steatite rods (∼10” long and 0.5” dia.) were ground, polished, dimpled, and ion-thinned to electron transparency using 6KV Argon ions at a beam current of 1 x 10-3 A and a 12° angle of incidence. The discs were coated with carbon prior to TEM examination to minimize charging effects.


Author(s):  
G. Y. Fan ◽  
J. M. Cowley

It is well known that the structure information on the specimen is not always faithfully transferred through the electron microscope. Firstly, the spatial frequency spectrum is modulated by the transfer function (TF) at the focal plane. Secondly, the spectrum suffers high frequency cut-off by the aperture (or effectively damping terms such as chromatic aberration). While these do not have essential effect on imaging crystal periodicity as long as the low order Bragg spots are inside the aperture, although the contrast may be reversed, they may change the appearance of images of amorphous materials completely. Because the spectrum of amorphous materials is continuous, modulation of it emphasizes some components while weakening others. Especially the cut-off of high frequency components, which contribute to amorphous image just as strongly as low frequency components can have a fundamental effect. This can be illustrated through computer simulation. Imaging of a whitenoise object with an electron microscope without TF limitation gives Fig. 1a, which is obtained by Fourier transformation of a constant amplitude combined with random phases generated by computer.


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