Investigation of ultra-thin gate oxide reliability behavior by separate characterization of soft breakdown and hard breakdown
2000 ◽
Vol 47
(3)
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pp. 650-652
◽
1997 ◽
Vol 117-118
◽
pp. 237-240
◽
Keyword(s):
Reliability and Ruggedness of 1200V SiC Planar Gate MOSFETs Fabricated in a High Volume CMOS Foundry
2018 ◽
Vol 924
◽
pp. 697-702
◽
Keyword(s):