Design of High-Speed Low Variation Static Noise Margin Ternary S-RAM Cells

2021 ◽  
Vol 21 (1) ◽  
pp. 102-110
Author(s):  
Yogesh Shrivastava ◽  
Tarun Kumar Gupta
Keyword(s):  
High Speed ◽  
Static Noise Margin ◽  
Noise Margin ◽  
Static Noise

Design and Analysis of SRAM Cell using Negative Bit-Line Write Assist Technique and Separate Read Port for High-Speed Applications

2021 ◽  
pp. 2150270
Author(s):  
Jitendra Kumar Mishra ◽  
Lakshmi Likhitha Mankali ◽  
Kavindra Kandpal ◽  
Prasanna Kumar Misra ◽  
Manish Goswami
Keyword(s):  
Power Dissipation ◽  
High Speed ◽  
Random Access ◽  
Random Access Memory ◽  
Access Memory ◽  
Static Noise Margin ◽  
Semiconductor Memory ◽  
Noise Margin ◽  
Sram Cell ◽  
Static Noise

The present day electronic gadgets have semiconductor memory devices to store data. The static random access memory (SRAM) is a volatile memory, often preferred over dynamic random access memory (DRAM) due to higher speed and lower power dissipation. However, at scaling down of technology node, the leakage current in SRAM often increases and degrades its performance. To address this, the voltage scaling is preferred which subsequently affects the stability and delay of SRAM. This paper therefore presents a negative bit-line (NBL) write assist circuit which is used for enhancing the write ability while a separate (isolated) read buffer circuit is used for improving the read stability. In addition to this, the proposed design uses a tail (stack) transistor to decrease the overall static power dissipation and also to maintain the hold stability. The comparison of the proposed design has been done with state-of-the-art work in terms of write static noise margin (WSNM), write delay, read static noise margin (RSNM) and other parameters. It has been observed that there is an improvement of 48%, 11%, 19% and 32.4% in WSNM while reduction of 33%, 39%, 48% and 22% in write delay as compared to the conventional 6T SRAM cell, NBL, [Formula: see text] collapse and 9T UV SRAM, respectively.

A Read-Static-Noise-Margin-Free SRAM Cell for Low-VDD and High-Speed Applications

2006 ◽  
Vol 41 (1) ◽  
pp. 113-121 ◽  
Author(s):  
K. Takeda ◽  
Y. Hagihara ◽  
Y. Aimoto ◽  
M. Nomura ◽  
Y. Nakazawa ◽  
...  
Keyword(s):  
High Speed ◽  
Static Noise Margin ◽  
Noise Margin ◽  
Sram Cell ◽  
Static Noise

scholarly journals SRAM CELL 6T AND 8T PARAMETRIC STABILITY ANALYSIS

2021 ◽  
Vol I (I) ◽  
Author(s):  
Bharathabau K
Keyword(s):  
Stability Analysis ◽  
High Speed ◽  
Memory Cell ◽  
Parametric Stability ◽  
Static Noise Margin ◽  
Noise Margin ◽  
Sram Cell ◽  
Margin Analysis ◽  
Static Noise ◽  
Technology Advances

As technology advances, the need for SRAM cells that may be utilised in high-speed applications grows. SRAM cells' static noise margin (SNM) is one of the most important variables to consider when designing a memory cell, and it is the main predictor of SRAM cell speed. The static noise margin will have an impact on the read and write margins. When it comes to the SRAM Cell's stability, the SNM is very important. For high-speed SRAMs, read/write margin analysis is critical since it affects how much data can be read and written. The simulation was run using Mentor Graphics' IC Station, which utilised 350nm technology rather than 180nm technology.

scholarly journals Restoration circuits for Low power Reduce Swing of 6T and 8T SRAM Cell With Improved Read and Write Margins

2021 ◽  
Vol 7 ◽  
pp. 22-34
Author(s):  
Vinod Kumar ◽  
Ram Murti Rawat
Keyword(s):  
Low Power ◽  
Static Noise Margin ◽  
Noise Margin ◽  
Equivalent Time ◽  
Sram Cell ◽  
Section Viii ◽  
Static Noise

A paper that examines the factors thataffect the Static Noise Margin (SNM) of a StaticRandom Access memories. At an equivalent time,they specialise in optimizing Read and Writeoperation of 8T SRAM cell which is best than 6TSRAM cell Using Swing Restoration Dual NodeVoltage. The read and Write operation and improveStability analysis. This SRAM technique on thecircuit or architecture level is required to improveread and write operation. during this paperComparative Analysis of 6T and 8T SRAM Cellswith Improved Read and Write Margin is completedfor 180 nm Technology with Cadence Virtuososchematics Tool.This Paper is organized as follows: thecharacteristics of 6T SRAM cell are described arerepresented in section VIII. In section IX, proposed8T SRAM cell is described. In section X, Standard8T SRAM cell is described. Section XI includes thesimulation results which give comparison of variousparameters of 6T and 8T SRAM cells. In Section XIISimulation Results and DC analysis and sectionXIII conclusion the work.

Designing of Low-Power High-Speed Noise Immune CNTFET 1-Trit Unbalanced Ternary Subtractor

2021 ◽  
Author(s):  
Yogesh Shrivastava ◽  
Tarun Kumar Gupta
Keyword(s):  
Power Consumption ◽  
High Speed ◽  
Noise Analysis ◽  
Average Power ◽  
Noise Margin ◽  
Average Power Consumption ◽  
Effect Transistor ◽  
Power Delay Product ◽  
Static Noise ◽  
Made In

Ternary logic has been demonstrated as a superior contrasting option to binary logic. This paper presents a ternary subtractor circuit in which the input signal is converted into binary. The proposed design is implemented using Carbon Nanotube Field Effect Transistor (CNTFET), a forefront innovation. A correlation has been made in the proposed design on parameters like Power-Delay Product (PDP), Energy Delay Product (EDP), average power consumption, delay and static noise margin. Every one of these parameters is obtained by simulating the circuits on the HSPICE simulator. The proposed design indicates an improvement of 60.14%, 59.34%, 74.98% and 84.28%, respectively, in power consumption, delay, PDP and EDP individually in correlation with recent designs. The increased carbon nanotubes least affect the proposed subtractor design. In noise analysis, the proposed design outperformed all the existing designs.

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