Leakage Current and Low-Frequency Noise Analysis and Reduction in a Suspended SOI Lateral p-i-n Diode

2017 ◽  
Vol 64 (10) ◽  
pp. 4252-4259 ◽  
Author(s):  
Guoli Li ◽  
Valeriya Kilchytska ◽  
Nicolas Andre ◽  
Laurent A. Francis ◽  
Yun Zeng ◽  
...  
Keyword(s):  
Leakage Current ◽  
Noise Analysis ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise

Conduction Mechanism and Low Frequency Noise Analysis in Al/Pr0.7Ca0.3MnO3for Bipolar Resistive Switching

2011 ◽  
Vol 50 (1R) ◽  
pp. 011501 ◽  
Author(s):  
Myoung-Sun Lee ◽  
Jung-Kyu Lee ◽  
Hyun-Sang Hwang ◽  
Hyung-Cheol Shin ◽  
Byung-Gook Park ◽  
...  
Keyword(s):  
Resistive Switching ◽  
Conduction Mechanism ◽  
Noise Analysis ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Bipolar Resistive Switching

Low Frequency Noise Analysis in Advanced CMOS Devices

2011 ◽  
Vol 324 ◽  
pp. 441-444 ◽  
Author(s):  
Jalal Jomaah ◽  
Majida Fadlallah ◽  
Gerard Ghibaudo
Keyword(s):  
Experimental Data ◽  
Noise Analysis ◽  
Low Frequency ◽  
Deep Submicron ◽  
Electrical Noise ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Noise Sources ◽  
The Impact ◽  
Mobility Fluctuations

A review of recent results concerning the low frequency noise in modern CMOS devices is given. The approaches such as the carrier number and the Hooge mobility fluctuations used for the analysis of the noise sources are illustrated through experimental data obtained on advanced CMOS generations. Furthermore, the impact on the electrical noise of the shrinking of CMOS devices in the deep submicron range is also shown.

Current–voltage and low-frequency noise analysis of heterojunction diodes with various passivation layers

2016 ◽  
Vol 598 ◽  
pp. 109-114 ◽  
Author(s):  
Young-Uk Ko ◽  
Ho-Jin Yun ◽  
Kwang-Seok Jeong ◽  
Yu-Mi Kim ◽  
Seung-Dong Yang ◽  
...  
Keyword(s):  
Noise Analysis ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Current Voltage ◽  
Passivation Layers ◽  
Heterojunction Diodes
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