In vivo chemical characterization of oral fluids in patients with osseointegrated dental implants by the means of Total reflection X-Ray fluorescence analysis (TXRF)

Elpidite belongs to a special group of microporous zirconosilicates, which are of great interest due to their capability to uptake various molecules and ions, e.g., some radioactive species, in their structural voids. The results of a combined electron probe microanalysis and single-crystal X-ray diffraction study of the crystals of elpidite from Burpala (Russia) and Khan-Bogdo (Mongolia) deposits are reported. Some differences in the chemical compositions are observed and substitution at several structural positions within the structure of the compounds are noted. Based on the obtained results, a detailed crystal–chemical characterization of the elpidites under study was carried out. Three different structure models of elpidite were simulated: Na2ZrSi6O15·3H2O (related to the structure of Russian elpidite), partly Ca-replaced Na1.5Ca0.25ZrSi6O15·2.75H2O (close to elpidite from Mongolia), and a hypothetical CaZrSi6O15·2H2O. The vibration spectra of the models were obtained and compared with the experimental one, taken from the literature. The strong influence of water molecule vibrations on the shape of IR spectra of studied structural models of elpidite is discussed in the paper.

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Nanotechnology in Roman Opaque Red Glass from the 2nd Century AD. Archaeometric Investigation in Red Sectilia from the Decoration of the Lucius Verus Villa in Rome

Heritage ◽

10.3390/heritage2030159 ◽

2019 ◽

Vol 2 (3) ◽

pp. 2597-2611 ◽

Cited By ~ 1

Author(s):

Mario Bandiera ◽

Patrice Lehuédé ◽

Marco Verità ◽

Luis Alves ◽

Isabelle Biron ◽

...

Keyword(s):

Chemical Composition ◽

Chemical Characterization ◽

Second Step ◽

Colorimetric Analysis ◽

Historical Sources ◽

Pixe Analysis ◽

X Ray ◽

Colorimetric Measurements ◽

Shed Light

This work aims to characterise the chemical composition of Roman opaque red glass sectilia dated to the 2nd century A.D and to shed light on Roman glassmaking production of different shades of red, from red to reddish-brown. Due to the lack of technical historical sources for this period many questions about technological aspects still remain. In this project a multi-disciplinary approach is in progress to investigate the red glass sectilia with several red hues from the Imperial Villa of Lucius Verus (161–169 A.D.) in Rome. First, colorimetric measurements were taken to identify the various red hues. The second step was chemical characterization of the samples and the identification of crystalline colouring phases. Particle Induced X-Ray Emission (PIXE) analysis was used to investigate the chemical composition of these glass samples, while the crystalline phases were identified by Raman Spectroscopy and Scanning Electrons Microscope with Energy Dispersive X-ray Spectrometry (SEM-EDS). Using SEM-EDS nanoparticles were detected as a colouring agent, the chemical composition and the morphology of which has been studied in depth. This information has been compared with the colorimetric analysis to establish any correlation with the different colour hues.

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How to Use the Features of Total Reflection of X-Rays for Energy Dispersive XRF

Advances in X-ray Analysis ◽

10.1154/s037603080002036x ◽

1988 ◽

Vol 32 ◽

pp. 105-114 ◽

Cited By ~ 2

Author(s):

H. Schwenke ◽

W. Berneike ◽

J. Knoth ◽

U. Weisbrod

Keyword(s):

Thin Films ◽

Penetration Depth ◽

Fluorescence Analysis ◽

Total Reflection ◽

X Rays ◽

X Ray ◽

Characteristic Features ◽

Respective Characteristic ◽

Nanometer Regime ◽

Sensitive Method

AbstractThe total reflection of X-rays is mainly determined by three parameters , that is the orltical angle, the reflectivity and the penetration depth. For X-ray fluorescence analysis the respective characteristic features can be exploited in two rather different fields of application. In the analysis of trace elements in samples placed as thin films on optical flats, detection limits as low as 2 pg or 0.05 ppb, respectively, have been obtained. In addition, a penetration depth in the nanometer regime renders Total Reflection XRF an inherently sensitive method for the elemental analysis of surfaces. This paper outlines the main physical and constructional parameters for instrumental design and quantitation in both branches of TXRF.

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