Morphology and Crystallographic Characterization of Nickel Nanowires—Influence of Magnetic Field and Current Density During Synthesis

2014 ◽  
Vol 5 (2) ◽  
Author(s):  
Mahendran Samykano ◽  
Ram Mohan ◽  
Shyam Aravamudhan
Keyword(s):  
Magnetic Field ◽  
Current Density ◽  
Quality Data ◽  
Synthesis Process ◽  
X Ray Diffraction ◽  
X Ray ◽  
Nickel Nanowires ◽  
Helium Ion ◽  
Sem Imaging

This paper presents results and discussion from a comprehensive morphological and crystallographic characterization of nickel nanowires synthesized by template-based electrodeposition method. In particular, the influence of magnetic and electric field (current density) conditions during the synthesis of nickel nanowires was studied. The structure and morphology of the synthesized nanowires were studied using Helium ion microscopy (HIM) and scanning electron microscopy (SEM) methods. The HIM provided higher quality data and resolution compared to conventional SEM imaging. The crystallographic properties of the grown nanowires were also studied using X-ray diffraction (XRD). The results clearly indicated that the morphological and crystallographic properties of synthesized nickel nanowires were strongly influenced by the applied magnetic field and current density intensity during the synthesis process.

Synthesis and Characterization of Cobalt-Nickel Nanowires Formed under External Magnetic Field

2015 ◽  
Vol 799-800 ◽  
pp. 120-124 ◽  
Author(s):  
Mary Donnabelle L. Balela ◽  
Lalaine M. Dulin ◽  
Erica A. Garcia ◽  
M. Janelle H. Tica
Keyword(s):  
Magnetic Field ◽  
External Magnetic Field ◽  
Face Centered Cubic ◽  
X Ray Diffraction ◽  
X Ray ◽  
Hexagonal Close Packed ◽  
Cobalt Nickel ◽  
Nickel Nanowires ◽  
Face Centered

Cobalt-nickel (Co-Ni) nanowires were formed by electroless deposition in ethylene glycol under external magnetic field. The effects of initial Co (II) and Ni (II) concentration on the surface and morphology of the synthesized nanowires were investigated by x-ray diffraction (XRD) and scanning electron microscope (SEM) respectively. An increase in the Co (II) concentration resulted in increase in diameter of the nanowires. However, the length of nanowires was observed to decrease. Higher Co (II) concentration resulted in a mixture of hexagonal close-packed and face-centered cubic Co-Ni nanowires. X-ray diffraction revealed that crystal growth occurred when the nanowires are annealed at 653 K for 10h.

scholarly journals PREPARATION OF NICKEL NANOWIRES AND EFFECTS OF SYNTHESIS CONDITIONS ON THEIR MORPHOLOGY

2019 ◽  
Vol 57 (3A) ◽  
pp. 21
Author(s):  
Minh Truong Xuan Nguyen ◽  
Thu Thi Minh Bui ◽  
Cuc Thi Le ◽  
Linh Huu Nguyen ◽  
Y Ngoc Pham ◽  
...  
Keyword(s):  
Synthesis Process ◽  
X Ray Diffraction ◽  
One Dimensional ◽  
X Ray ◽  
Synthesis Conditions ◽  
Nickel Nanowires ◽  
Transmission Electron ◽  
Experimental Parameters ◽  
Polyol Medium ◽  
Nickel Nanostructures

Nickel nanostructures prepared by various methods have received considerable attentions due to their numerous applications. In this study, one-dimensional nickel nanowires (NiNWs) were synthesized by the reduction of nickel (II) chloride in polyol medium. Poly (vinylpyrrolidone) (PVP) served as the surfactant and hydrazine hydrate was used as the reductant. The effects of different experimental parameters, i.e. concentration of Ni2+, volume of N2H4, concentration of PVP and reaction temperature on the formation and morphology of NiNWs were studied. The structure, composition and surface morphology of the materials were characterized by X-ray diffraction (XRD) and transmission electron microscopy (TEM). The results showed that the morphology as well as the diameter of NiNWs could be effectively controlled by adjusting parameters of the synthesis process.

scholarly journals Effect of Silver (Ag) Addition on the Forming Of Y-247 Superconductors (Y2Ba4Cu7O15-?) using Wet Mixing Method

2019 ◽  
Vol 20 (1) ◽  
pp. 11
Author(s):  
A.A. Made Wisnu Wijaya Putra ◽  
W. G. Suharta ◽  
P. Suardana
Keyword(s):  
Volume Fraction ◽  
Lattice Parameter ◽  
Synthesis Process ◽  
X Ray Diffraction ◽  
Ag Addition ◽  
X Ray ◽  
Mixing Method ◽  
Parameter Values ◽  
Scanning Electron

Superconductor Y-247 (Y2Ba4Cu7O15-?) with adding silver (Ag) by using the wet-mixing method has been done. The synthesis process was carried out by calcination at 600o C for 3 hours and sintered at 925o C for 10 hours. Variations in the increase in the addition of Ag used were Ag0.05, Ag0.1, Ag0.15 and Ag0.2. Characterization of X-Ray Diffraction (XRD), showed an increase in the addition of Ag resulting in a decrease in the volume fraction, where the volume fractions obtained consecutive were 55.0%, 51.3%, 50.9% and 46.3%. Increasing the addition of Ag results in an increase in the lattice parameter values in the direction of the a axis which is 3.8247 Å, 3.8291 Å, 3.8292 Å, 3.8293 Å, decreasing the lattice parameter values in the b axis direction which is 3.8426 Å, 3.8415 Å, 3.8409 Å, 3.8383 Å and decreasing the lattice parameter values in the direction of the c axis are 49.2174 Å, 49.2022 Å, 49.1881 Å, 49.1761 Å. Analysis of the results of the characterization of Scanning Electron Microscopy (SEM), the particle size obtained was 225.47 nm, 202.88 nm, 190.68 nm and 172.22 nm.

scholarly journals Synthesis and characterization of EuB6 by borothermic reduction of Eu2O3

2011 ◽  
Vol 5 (3) ◽  
pp. 149-154 ◽  
Author(s):  
Sanjay Kumar ◽  
Nagaiyar Krishnamurthy
Keyword(s):  
Nuclear Reactor ◽  
Europium Oxide ◽  
Synthesis Process ◽  
X Ray Diffraction ◽  
X Ray ◽  
Carbon And Nitrogen ◽  
Europium Hexaboride ◽  
Substitutional Impurities ◽  
Borothermic Reduction

Carbon free high pure europium hexaboride is an urgent need for the fast breeder nuclear reactor program. The properties of EuB6 are highly influenced by the presence of one or more substitutional impurities, particularly, carbon, oxygen and nitrogen. In the present investigation carbon and nitrogen free high pure europium hexaboride was synthesized by borothermic reduction of europium oxide Eu2O3 (using boron as a reducing agent) at relatively low temperature (< 900?C). Glassy B2O3, the by-product of the synthesis process, was leached out completely in slightly acidic warm water from which boron could be recovered by usual electrolysis process. The product obtained was characterized by X-ray diffraction (XRD), scanning electron microscope (SEM) and chemical analysis. Oxidation behaviour of pressureless sintered EuB6 pellets (> 90 % of theoretical density) was studied at 850?C and revealed that an adherent thin surface of Eu2O3 was formed which prevent the further oxidation.

A Grazing Incidence X-Ray Reflectometer for Rapid Nondestructive Characterization of Thin Films and Interfaces

1991 ◽  
Vol 240 ◽  
Author(s):  
N. Loxley ◽  
A. Monteiro ◽  
M. L. Cooke ◽  
D. K. Bowen ◽  
B. K. Tanner
Keyword(s):  
Information Content ◽  
Grazing Incidence ◽  
Scattering Data ◽  
Quality Data ◽  
X Ray Diffraction ◽  
High Quality Data ◽  
X Ray ◽  
Minimum Criteria ◽  
Nondestructive Characterization

ABSTRACTWe describe a novel instrument dedicated to making rapid angular-dispersive grazing incidence X-ray reflectivity measurements. A novel, automatic, optical technique for rapid specimen alignment, is incorporated into the control software. We discuss the information content of diffuse scattering data collected in non-standard modes. Examples of data are presented showing the application to the characterization of semiconductors and metal multilayers. The technique is shown to be particularly powerful for measurement of the thickness of epitaxial films of AlGaAs on GaAs less than 50 nm thick and where high resolution X-ray diffraction becomes impracticable. We demonstrate that, as the method is insensitive to dislocation density, high quality data can be taken rapidly from heavily relaxed multilayers. Minimum criteria for adequate information content in the data are explored and the effect of specimen curvature is examined.

Morphology and Mass Changes with Magnetic Field during the Electrodeposition of Ni-Co

2011 ◽  
Vol 264-265 ◽  
pp. 1389-1394
Author(s):  
Mehdi Ebadi ◽  
Wan Jeffrey Basirun ◽  
Yatimah Alias
Keyword(s):  
Magnetic Field ◽  
Current Density ◽  
X Ray Diffraction ◽  
Parallel Magnetic Field ◽  
Cobalt Ions ◽  
Electrodeposition Process ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
The Difference

The influence of a static magnetic field of 4.4 T on the electrodeposition process on copper plates immersed in a solution of Nickel and Cobalt ions is presented. The electrodeposited layers characterized by Scanning Electron Microscopy (SEM) including Energy Dispersive X-Ray (EDX), X-Ray Diffraction (XRD) and Atomic Force Microscopy (AFM).It was observed that the difference between the mass of electrodeposition with the application of a Permanent Parallel Magnetic Field to the electrode surface (PPMF) and the electrodeposited layers without the PPMF, increased with the increase of current density. The presence of the PPMF gave smoother electrodeposited surface compared to without the PPMF. The increase in current density gave fewer the cracks on the electrodeposited surface.

The Use of Advanced Analytical Techniques for Characterization of the Chemical, Physical, and Crystallographic Nature of a Surface

1973 ◽  
Vol 31 ◽  
pp. 132-133 ◽  
Author(s):  
R. E. Herfert
Keyword(s):  
Surface Characterization ◽  
Analytical Techniques ◽  
X Ray Diffraction ◽  
Depth Of Penetration ◽  
X Ray ◽  
The Past ◽  
Transmission Electron ◽  
Scanning Electron

Studies of the nature of a surface, either metallic or nonmetallic, in the past, have been limited to the instrumentation available for these measurements. In the past, optical microscopy, replica transmission electron microscopy, electron or X-ray diffraction and optical or X-ray spectroscopy have provided the means of surface characterization. Actually, some of these techniques are not purely surface; the depth of penetration may be a few thousands of an inch. Within the last five years, instrumentation has been made available which now makes it practical for use to study the outer few 100A of layers and characterize it completely from a chemical, physical, and crystallographic standpoint. The scanning electron microscope (SEM) provides a means of viewing the surface of a material in situ to magnifications as high as 250,000X.

High Resolution Replication of Organoclay Surfaces

1982 ◽  
Vol 40 ◽  
pp. 576-577
Author(s):  
W. W. Barker ◽  
W. E. Rigsby ◽  
V. J. Hurst ◽  
W. J. Humphreys
Keyword(s):  
Clay Mineral ◽  
Organic Molecule ◽  
Organic Molecules ◽  
X Ray Diffraction ◽  
Xrd Pattern ◽  
X Ray ◽  
Naturally Occurring ◽  
Silicate Layers ◽  
Mineral Identification

Experimental clay mineral-organic molecule complexes long have been known and some of them have been extensively studied by X-ray diffraction methods. The organic molecules are adsorbed onto the surfaces of the clay minerals, or intercalated between the silicate layers. Natural organo-clays also are widely recognized but generally have not been well characterized. Widely used techniques for clay mineral identification involve treatment of the sample with H2 O2 or other oxidant to destroy any associated organics. This generally simplifies and intensifies the XRD pattern of the clay residue, but helps little with the characterization of the original organoclay. Adequate techniques for the direct observation of synthetic and naturally occurring organoclays are yet to be developed.

Synthesis and characterization of TiN / Ti / AISI 410 coatings

2018 ◽  
Vol 2 (1) ◽  
pp. 7
Author(s):  
S Chirino ◽  
Jaime Diaz ◽  
N Monteblanco ◽  
E Valderrama
Keyword(s):  
Synthesis And Characterization ◽  
Photoemission Spectroscopy ◽  
X Ray Diffraction ◽  
X Ray ◽  
Columnar Grains ◽  
Tin Thin Films ◽  
Steel Aisi ◽  
Interacting Surfaces ◽  
Stainless Steel Aisi

The synthesis and characterization of Ti and TiN thin films of different thicknesses was carried out on a martensitic stainless steel AISI 410 substrate used for tool manufacturing. The mechanical parameters between the interacting surfaces such as thickness, adhesion and hardness were measured. By means of the scanning electron microscope (SEM) the superficial morphology of the Ti/TiN interface was observed, finding that the growth was of columnar grains and by means of EDAX the existence of titanium was verified.  Using X-ray diffraction (XRD) it was possible to observe the presence of residual stresses (~ -3.1 GPa) due to the different crystalline phases in the coating. Under X-ray photoemission spectroscopy (XPS) it was possible to observe the molecular chemical composition of the coating surface, being Ti-N, Ti-N-O and Ti-O the predominant ones.

Studies on the Preparation, Characterization and Solubility of -Cyclodextrin-Roxythromycin Inclusion Complexes

2009 ◽  
Vol 2 (2) ◽  
pp. 523-530
Author(s):  
D. Nagasamy Venkatesh ◽  
S. Karthick ◽  
M. Umesh ◽  
G. Vivek ◽  
R.M. Valliappan ◽  
...  
Keyword(s):  
Dissolution Rate ◽  
Inclusion Complexes ◽  
Phase Solubility ◽  
X Ray Diffraction ◽  
Scanning Calorimetry ◽  
X Ray ◽  
Ir Studies ◽  
Poorly Soluble ◽  
Poorly Soluble Drug

Roxythromycin/ β-cyclodextrin (Roxy/ β-CD) dispersions were prepared with a view to study the influence of β-CD on the solubility and dissolution rate of this poorly soluble drug. Phase-solubility profile indicated that the solubility of roxythromycin was significantly increased in the presence of β-cyclodextrin and was classified as AL-type, indicating the 1:1 stoichiometric inclusion complexes. Physical characterization of the prepared systems was carried out by differential scanning calorimetry (DSC), X-ray diffraction studies (XRD) and IR studies. Solid state characterization of the drug β-CD binary system using XRD, FTIR and DSC revealed distinct loss of drug crystallinity in the formulation, ostensibly accounting for enhancement of dissolution rate.

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