scholarly journals A soft x-ray beam-splitting multilayer optic for the NASA GEMS Bragg Reflection Polarimeter

2012 ◽  
Author(s):  
Ryan Allured ◽  
Mónica Fernández-Perea ◽  
Regina Soufli ◽  
Jennifer B. Alameda ◽  
Alicia Maxwell ◽  
...  
2013 ◽  
Vol 36 (1-2) ◽  
pp. 371-388 ◽  
Author(s):  
Ryan Allured ◽  
Mónica Fernández-Perea ◽  
Regina Soufli ◽  
Jennifer B. Alameda ◽  
Michael J. Pivovaroff ◽  
...  

Crystals ◽  
2021 ◽  
Vol 11 (3) ◽  
pp. 312
Author(s):  
Florian Lauraux ◽  
Stéphane Labat ◽  
Sarah Yehya ◽  
Marie-Ingrid Richard ◽  
Steven J. Leake ◽  
...  

The simultaneous measurement of two Bragg reflections by Bragg coherent X-ray diffraction is demonstrated on a twinned Au crystal, which was prepared by the solid-state dewetting of a 30 nm thin gold film on a sapphire substrate. The crystal was oriented on a goniometer so that two lattice planes fulfill the Bragg condition at the same time. The Au 111 and Au 200 Bragg peaks were measured simultaneously by scanning the energy of the incident X-ray beam and recording the diffraction patterns with two two-dimensional detectors. While the former Bragg reflection is not sensitive to the twin boundary, which is oriented parallel to the crystal–substrate interface, the latter reflection is only sensitive to one part of the crystal. The volume ratio between the two parts of the twinned crystal is about 1:9, which is also confirmed by Laue microdiffraction of the same crystal. The parallel measurement of multiple Bragg reflections is essential for future in situ and operando studies, which are so far limited to either a single Bragg reflection or several in series, to facilitate the precise monitoring of both the strain field and defects during the application of external stimuli.


1995 ◽  
Vol 39 ◽  
pp. 109-117
Author(s):  
Burkhard Beckhoff ◽  
Birgit Kanngießer

X-ray focusing based on Bragg reflection at curved crystals allows collection of a large solid angle of incident radiation, monochromatization of this radiation, and condensation of the beam reflected at the crystal into a small spatial cross-section in a pre-selected focal plane. Thus, for the Bragg reflected radiation, one can achieve higher intensities than for the radiation passing directly to the same small area in the focal plane. In that case one can profit considerably from X-ray focusing in an EDXRF arrangement. The 00 2 reflection at Highly Oriented Pyrolytic Graphite (HOPG) crystals offers a very high intensity of the Bragg reflected beam for a wide range of photon energies. Furthermore, curvature radii smaller than 10 mm can be achieved for HOPG crystals ensuring efficient X-ray focusing in EDXRF applications. For the trace analysis of very small amounts of specimen material deposited on small areas of thin-filter backings, HOPG based X-ray focusing may be used to achieve a very high intensity of monochromatic excitation radiation.


2007 ◽  
Vol 1027 ◽  
Author(s):  
Do Young Noh ◽  
Ki-Hyun Ryu ◽  
Hyon Chol Kang

AbstractThe transformation of Au thin films grown on sapphire (0001) substrates into nano crystals during thermal annealing was investigated by in situ synchrotron x-ray scattering and ex situ atomic force microscopy (AFM). By monitoring the Au(111) Bragg reflection and the low Q reflectivity and comparing them with ex situ AFM images, we found that polygonal-shape holes were nucleated and grow initially. As the holes grow larger and contact each other, their boundary turns into Au nano crystals. The Au nano crystals have a well-defined (111) flat top surface and facets in the in-plane direction.


1989 ◽  
Vol 40 (12) ◽  
pp. 7097-7103 ◽  
Author(s):  
M. Strauss ◽  
N. Rostoker
Keyword(s):  

2021 ◽  
Vol 28 (6) ◽  
Author(s):  
Yuri Shvyd'ko ◽  
Sergey Terentyev ◽  
Vladimir Blank ◽  
Tomasz Kolodziej

Next-generation high-brilliance X-ray photon sources call for new X-ray optics. Here we demonstrate the possibility of using monolithic diamond channel-cut crystals as high-heat-load beam-multiplexing narrow-band mechanically stable X-ray monochromators with high-power X-ray beams at cutting-edge high-repetition-rate X-ray free-electron laser (XFEL) facilities. The diamond channel-cut crystals fabricated and characterized in these studies are designed as two-bounce Bragg reflection monochromators directing 14.4 or 12.4 keV X-rays within a 15 meV bandwidth to 57Fe or 45Sc nuclear resonant scattering experiments, respectively. The crystal design allows out-of-band X-rays transmitted with minimal losses to alternative simultaneous experiments. Only ≲2% of the incident ∼100 W X-ray beam is absorbed in the 50 µm-thick first diamond crystal reflector, ensuring that the monochromator crystal is highly stable. Other X-ray optics applications of diamond channel-cut crystals are anticipated.


2012 ◽  
Vol 523-524 ◽  
pp. 40-45 ◽  
Author(s):  
Taito Osaka ◽  
Makina Yabashi ◽  
Yasuhisa Sano ◽  
Kensuke Tono ◽  
Yuichi Inubushi ◽  
...  

A novel fabrication process was proposed to produce high-quality Bragg beam splitters for hard X-ray free-electron lasers (XFELs), which should consist of thin, bend-free, and robust Bragg-case crystals without any defects. A combination of a mechanical process and plasma chemical vaporization machining was employed. High crystalline perfection of the fabricated Si(110) crystal was verified with X-ray topography and rocking curve measurements. In addition, the thickness was evaluated to be 4.4 μm from the fringe period of the measured rocking curve. The crystal can be employed in Bragg beam splitters using the (220) Bragg reflection for X-ray pump-X-ray probe experiments with XFEL sources.


2000 ◽  
Vol 179 (1) ◽  
pp. 103-108 ◽  
Author(s):  
A.Yu. Nikulin ◽  
J.R. Davis ◽  
N.T. Jones ◽  
B.F. Usher ◽  
A.Yu. Souvorov ◽  
...  

2007 ◽  
Vol 561-565 ◽  
pp. 2095-2098
Author(s):  
Takashi Harumoto ◽  
Ji Shi ◽  
Yoshio Nakamura

Pt/AlN multilayered films fabricated by alternative sputtering deposition were characterized by X-Ray Reflectometry and X-Ray Diffraction. As-deposited films have (111) and (001) preferred orientation for Pt and AlN, respectively. The X-Ray Reflectivity profiles are assigned to the total reflection and Bragg reflections due to periodic layer structure. The Bragg peaks are observed at the 2Theta range beyond 15 degree and the peak intensities increase after annealing. The reflectivity of the first order Bragg reflection is approximately 65% and is stable after annealing at 873K. Simulation of the reflectivity profile has shown roughnesses of the Pt/AlN interfaces are below 0.4nm. X-Ray Diffraction revealed the development of film texture and formation of superlattice by annealing. The latter indicates periodicity of film is very high.


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