CRYSTAL STRUCTURE AND GAS SENSING PROPERTIES OF Cu-DOPED ZINC OXIDE

2002 ◽  
Vol 16 (01n02) ◽  
pp. 314-321 ◽  
Author(s):  
CHIN HOCK ONG ◽  
JIAN HUI WANG ◽  
HAO GONG ◽  
H. S. O. CHAN
Keyword(s):  
Zinc Oxide ◽  
Structural Properties ◽  
Gas Sensing ◽  
Rf Magnetron Sputtering ◽  
Columnar Structure ◽  
X Ray Diffraction ◽  
Force Microscopy ◽  
Atomic Force ◽  
Residual Strains ◽  
Nano Crystal

Copper doped Zinc Oxide thin films are prepared by RF magnetron sputtering. The films are characterized by using X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM), and other techniques. It is found that the films are composed of nano-crystal grains with typical columnar structure. The structural properties, such as preferred orientation, residual strains exist in the films, and grains size were studied. Moreover, the porous structure that related with the surface morphology of the films was discussed as it has relationship with the gas sensing property. Gas sensing property of these films was studied with the understanding of structural properties. The films were tested with NO gas. The sensitivity of the films was studied through the discussions of films structures.

Effects of Growth Temperature on the Structural Properties of Zinc Oxide Nanograins Deposited by RF Magnetron Sputtering

2014 ◽  
Vol 895 ◽  
pp. 500-504
Author(s):  
N. Ameera ◽  
A. Shuhaimi ◽  
S. Najwa ◽  
K.M. Hakim ◽  
M. Mazwan ◽  
...  
Keyword(s):  
Zinc Oxide ◽  
Magnetron Sputtering ◽  
Growth Temperature ◽  
Deposition Time ◽  
Rf Magnetron Sputtering ◽  
Rf Power ◽  
X Ray Diffraction ◽  
Force Microscopy ◽  
Glass Substrates ◽  
Atomic Force

Nanograins zinc oxide (ZnO) withc-axis preferred orientation was deposited on glass substrates by RF magnetron sputtering. It was performed with a ZnO target with 99.999% purity at RF power of 200 W. The deposition was carried out in argon and oxygen ambient at the ratio flow-rates of 10 and 5 sccm respectively, with total deposition time of 1 hour. The films were grown atgrowth temperatures were specified at RT, 100, 200, 300, 400 and 500°C. The effects of the growth temperature on the ZnO structural property was investigated by x-ray diffraction (XRD). The best ZnO crystalline quality obtained at growth temperature, TGof 300°C was further characterized by field emission scanning electron microscopy (FESEM) and atomic force microscopy (AFM).

Studies of Hydroxyapatite Thin Coating Produced by Dual RF Magnetron Sputtering for Biomedical Applications

2011 ◽  
Vol 493-494 ◽  
pp. 473-476
Author(s):  
E.O. Lopez ◽  
F.F. Borghi ◽  
Alexandre Mello ◽  
J. Gomes ◽  
Antonella M. Rossi
Keyword(s):  
Magnetron Sputtering ◽  
Deposition Time ◽  
Grazing Incidence ◽  
Rf Magnetron Sputtering ◽  
Nanocrystalline Phase ◽  
Rf Power ◽  
X Ray Diffraction ◽  
Force Microscopy ◽  
Atomic Force ◽  
Sputtering Power

In this present work, we characterize HAp thin films deposited by dual magnetron sputtering device DMS on silicon (Si/HAp). The sputtering RF power was varied from 90 watts to 120 watts and deposition times from 60 to 180 minutes. The argon and oxygen pressure were fixed at 5.0 mTorr and 1.0 mTorr, respectively. Grazing incidence X-ray diffraction (GIXRD) from synchrotron radiation, infrared spectroscopy (FTIR) and atomic force microscopy (AFM) were used for the structural characterization. At lower deposition times, a crystalline phase with preferential orientation along apatite (002) and a disordered nanocrystalline phase were identified. The coating crystallinity was improved with the increase of the deposition time besides the sputtering power.

Characteristics of Electron Transport Study of Composited Graphene-Zinc Oxide Thin Film Photoanode for Dye-Sensitized Solar Cells

2020 ◽  
Vol 307 ◽  
pp. 185-191
Author(s):  
Noor Syafiqah Samsi ◽  
N.A.S. Affendi ◽  
M.K. Yaakob ◽  
M.F.M. Taib ◽  
A. Lepit ◽  
...  
Keyword(s):  
Zinc Oxide ◽  
Dye Sensitized Solar Cells ◽  
Xrd Analysis ◽  
Oxide Thin Film ◽  
X Ray Diffraction ◽  
Force Microscopy ◽  
Atomic Force ◽  
Zno Nanosheets ◽  
High Degree ◽  
Sensitized Solar Cells

Graphene-Zinc Oxide (Gr-ZnO) nanocomposites films were successfully synthesized via facile electrodeposition method in an aqueous solution under Gr concentration conditions. Gr, as a highly conductive carbon, acts as an anchor for ZnO nanosheets and plays a substantial role in controlling the degree of dispersion of ZnO nanosheets onto indium-doped tin oxide (ITO) substrate to form Gr-ZnO nanocomposite. Atomic force microscopy (AFM) and field-emission scanning electron microscopy (FESEM) analysis of Gr-ZnO nanocomposite samples confirmed that the presence of ZnO nanosheets with a high degree of dispersity and crystallinity which is well linked to the thin layer of Gr nanoparticle on ITO substrate. The surface roughness of the films found increased to ~270 nm on Gr-ZnO as compared to Gr ~44 nm and ZnO ~3 nm. Further, the x-ray diffraction spectroscopy (XRD) analysis showed the result is in good agreement with Raman spectroscopy study. The cyclic voltammetry (CV) of Gr-ZnO nanocomposite revealed that the effect of electron-hole recombination process was increased and the presence of Gr in ZnO photoanode provides the fastest redox reaction and hence offers the fastest electron transfer in photoanode.

scholarly journals UV Sensitivity of Indium-Zinc Oxide Nanofibers

2018 ◽  
Vol 2018 ◽  
pp. 1-6 ◽  
Author(s):  
Nadezhda Markova ◽  
Olga Berezina ◽  
Nikolay Avdeev ◽  
Alexander Pergament
Keyword(s):  
Zinc Oxide ◽  
Indium Content ◽  
Silicon Substrates ◽  
X Ray Diffraction ◽  
Force Microscopy ◽  
Atomic Force ◽  
Indium Zinc Oxide ◽  
Electrospinning Method ◽  
Recovery Times ◽  
Response And Recovery

Indium-zinc oxide (IZO) nanofiber matrices are synthesized on SiO2-covered silicon substrates by the electrospinning method. The nanofibers’ dimensions, morphology, and crystalline structure are characterized by scanning electron microscopy, atomic force microscopy, and X-ray diffraction. The results of studying the electrical properties of nanofibers, as well as their sensitivity to UV radiation depending on the In-to-Zn concentration ratio, are presented. It is shown that the highest sensitivity to UV is observed at the indium content of about 50 atomic %. The photocurrent increment with respect to the dark current is more than 4 orders of magnitude. The response and recovery times are 60 and 500 sec, respectively. The results obtained suggest that IZO nanofibers can find application as UV sensors with improved characteristics.

Reactive Sputtering Growth and Characterizations of InN Thin Films on Si Substrates

2012 ◽  
Vol 545 ◽  
pp. 290-293
Author(s):  
Maryam Amirhoseiny ◽  
Hassan Zainuriah ◽  
Ng Shashiong ◽  
Mohd Anas Ahmad
Keyword(s):  
Thin Films ◽  
Room Temperature ◽  
Rf Magnetron Sputtering ◽  
Rf Power ◽  
X Ray Diffraction ◽  
Nitrogen Gas ◽  
X Ray ◽  
Force Microscopy ◽  
Si Substrates ◽  
Atomic Force

We have studied the effects of deposition conditions on the crystal structure of InN films deposited on Si substrate. InN thin films have been deposited on Si(100) substrates by reactive radio frequency (RF) magnetron sputtering method with pure In target at room temperature. The nitrogen gas pressure, applied RF power and the distance between target and substrate were 2×10-2 Torr, 60 W and 8 cm, respectively. The effects of the Ar–N2 sputtering gas mixture on the structural properties of the films were investigated by using scanning electron microscope, energy-dispersive X-ray spectroscopy, atomic force microscopy and X-ray diffraction techniques.

Electrochemical Behavior of LiFePO4 Thin Film Prepared by RF Magnetron Sputtering in Li2SO4 Aqueous Electrolyte

2015 ◽  
Vol 14 (01n02) ◽  
pp. 1460027 ◽  
Author(s):  
Jiaxiong Wu ◽  
Wei Cai ◽  
Guangyi Shang
Keyword(s):  
Thin Film ◽  
Magnetron Sputtering ◽  
Rf Magnetron Sputtering ◽  
Ion Diffusion ◽  
X Ray Diffraction ◽  
Electrochemical Tests ◽  
Force Microscopy ◽  
Atomic Force ◽  
Li Ion ◽  
Deposited Film

LiFePO 4 films were deposited on Au / Si substrate by radio-frequency magnetron sputtering. The effect of annealing on the crystallization and morphology of LiFePO 4 thin film has been investigated. X-ray diffraction revealed that the films through annealing were well crystallized compared with as-deposited films. The surface morphology of the thin film was also observed by scanning electron microscopy (SEM) and atomic force microscopy (AFM). Electrochemical tests in 1M Li 2 SO 4 showed that the annealed thin film in 500°C exhibits larger Li -ion diffusion coefficient (3.46 × 10-7 cm2s-1) than as-deposited film and powder. Furthermore, cyclic voltammetry demonstrate a well-defined lithium intercalation/deintercalation reaction at around 0.45 V versus SCE (i.e., 3.6 V versus Li +/ Li ), suggesting that the annealed LiFePO 4 thin film is a promising candidate cathode film for lithium microbatteries.

STRUCTURE AND OPTICAL PROPERTIES OF InN THIN FILM GROWN ON SiC BY REACTIVE RF MAGNETRON SPUTTERING

2013 ◽  
Vol 20 (01) ◽  
pp. 1350008 ◽  
Author(s):  
M. AMIRHOSEINY ◽  
Z. HASSAN ◽  
S. S. NG ◽  
G. ALAHYARIZADEH
Keyword(s):  
Thin Film ◽  
Optical Properties ◽  
Magnetron Sputtering ◽  
Rf Magnetron Sputtering ◽  
Root Mean Square Roughness ◽  
Diffraction Measurement ◽  
X Ray Diffraction ◽  
Force Microscopy ◽  
Growth Orientation ◽  
Atomic Force

The structure and optical properties of InN thin film grown on 6H-SiC by reactive radio frequency magnetron sputtering were investigated. X-ray diffraction measurement shows that the deposited InN film has (101) preferred growth orientation and wurtzite structure. Atomic force microscopy results reveal smooth surface with root-mean-square roughness around 3.3 nm. One Raman-active optical phonon of E2(high) and two Raman- and infrared-active modes of A1(LO) and E1(TO) of the wurtzite InN are clearly observed at 488.7, 582.7 and 486 cm-1, respectively. These results leading to conclude that the wurtzite InN thin film with (101) preferred growth orientation was successfully grown on 6H-SiC substrate.

Optical And Structural properties of Vertical Aligned Self-Assembled InAs Quantum Dots Multilayers

2001 ◽  
Vol 676 ◽  
Author(s):  
J. C. González ◽  
M. I. N. da Silva ◽  
W. N. Rodrigues ◽  
F. M. Matinaga ◽  
R. Magalhaes-Paniago ◽  
...  
Keyword(s):  
Quantum Dots ◽  
Structural Properties ◽  
Molecular Beam ◽  
X Ray Diffraction ◽  
Inas Quantum Dots ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron ◽  
Self Assembled

ABSTRACTIn this work, we report optical and structural properties of vertical aligned self-assembled InAs quantum dots multilayers. The InAs quantum dots samples were grown by Molecular Beam Epitaxy. Employing Atomic Force Microscopy, Transmission Electron Microscopy, and Gracing Incident X-ray Diffraction we have studied the structural properties of samples with different number of periods of the multiplayer structure, as well as different InAs coverage. The optical properties were studied using Photoluminescence spectroscopy.

scholarly journals Tribo-Mechanical Properties of the Antimicrobial Low-Density Polyethylene (LDPE) Nanocomposite with Hybrid ZnO–Vermiculite–Chlorhexidine Nanofillers

Polymers ◽  
2020 ◽  
Vol 12 (12) ◽  
pp. 2811
Author(s):  
Karla Čech Barabaszová ◽  
Sylva Holešová ◽  
Marianna Hundáková ◽  
Alena Kalendová
Keyword(s):  
Mechanical Properties ◽  
Zinc Oxide ◽  
Xrd Analysis ◽  
Surface Topology ◽  
Low Density Polyethylene ◽  
Indentation Hardness ◽  
Low Density ◽  
X Ray Diffraction ◽  
Force Microscopy ◽  
Atomic Force

Materials made from low-density polyethylene (LDPE) in the form of packages or catheters are currently commonly applied medical devices. Antimicrobial LDPE nanocomposite materials with two types of nanofillers, zinc oxide/vermiculite (ZnO/V) and zinc oxide/vermiculite_chlorhexidine (ZnO/V_CH), were prepared by a melt-compounded procedure to enrich their controllable antimicrobial, microstructural, topographical and tribo-mechanical properties. X-ray diffraction (XRD) analysis and Fourier transform infrared spectroscopy (FTIR) revealed that the ZnO/V and ZnO/V_CH nanofillers and LDPE interacted well with each other. The influence of the nanofiller concentrations on the LDPE nanocomposite surface changes was studied through scanning electron microscopy (SEM), and the surface topology and roughness were studied using atomic force microscopy (AFM). The effect of the ZnO/V nanofiller on the increase in indentation hardness (HIT) was evaluated by AFM measurements and the Vickers microhardness (HV), which showed that as the concentration of the ZnO/V nanofiller increased, these values decreased. The ZnO/V and ZnO/V_CH nanofillers, regardless of the concentration in the LDPE matrix, slightly increased the average values of the friction coefficient (COF). The abrasion depths of the wear indicated that the LDPE_ZnO/V nanocomposite plates exhibited better wear resistance than LDPE_ZnO/V_CH. Higher HV and HIT microhardness values were measured for both nanofillers than the natural LDPE nanocomposite plate. Very positive antimicrobial activity against S. aureus and P. aeruginosa after 72 h was found for both nanofiller types.

Structural Properties of Stannic Oxide Coated Aluminium-Doped Zinc Oxide Nanorods

2015 ◽  
Vol 1109 ◽  
pp. 476-480
Author(s):  
Ahmad Syakirin Ismail ◽  
Mohd Firdaus Malek ◽  
Muhammad Amir Ridhwan Abdullah ◽  
Mohamad Hafiz Mamat ◽  
M. Rusop
Keyword(s):  
Zinc Oxide ◽  
Structural Properties ◽  
Sol Gel ◽  
Zno Nanorods ◽  
Oxide Coating ◽  
Zinc Oxide Nanorods ◽  
Stannic Oxide ◽  
Immersion Method ◽  
Force Microscopy ◽  
Atomic Force

Aluminium (Al) - doped zinc oxide (ZnO) nanorods was deposited using sol-gel immersion method. To study the effect of stannic oxide coating (SnO2) on the structural properties of the ZnO nanorods, SnO2with different layers were deposited on the top of ZnO nanorods, from 1 to 5 layers. The structural properties of the samples have been characterized using field emission scanning electron microscopy (FESEM), atomic force microscopy and x-ray diffraction (XRD). The analyses showed that by increasing the deposited layer, the surface roughness of the samples reduced and also reduced the porosity of the surface.

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