Energy distribution of μd1s muonic atom and its spin states effecting on muonic X-Ray transfer yield in solid thin film method

2014 ◽  
Vol 23 (02) ◽  
pp. 1450006 ◽  
Author(s):  
R. Gheisari ◽  
M. Afshari ◽  
K. Khorshidian
Keyword(s):  
Thin Film ◽  
Energy Distribution ◽  
Muonic Atom ◽  
Rate Equations ◽  
Spin States ◽  
X Rays ◽  
X Ray ◽  
Solid Deuterium ◽  
Molecular Formation ◽  
Film Method

We have investigated the energy distribution of [Formula: see text] and its spin states (F) effecting on muonic X-ray transfer yield in the solid thin film method. Argon ( Ar ) ion has been considered as the implanted ion in solid deuterium (s D 2) layer at a temperature of T = 3 K. A kinetics model has been used, the corresponding rate equations have been constructed and our results of X-ray yield have been compared with recent measured data. The μd1s muonic atoms, which can take part in resonant molecular formation, have been separated from atoms participating in nonresonant reactions. On this basis, the integrated number of X-rays has been calculated. The results show that the effect of μd1s energy distribution on the number of X-photons is not serious, while its spin states strongly affect the muonic X-ray yield.

Problems in Thin-Film X-ray Quantification

1990 ◽  
Vol 48 (2) ◽  
pp. 458-459
Author(s):  
J N Chapman ◽  
W A P Nicholson
Keyword(s):  
Thin Film ◽  
Specimen Thickness ◽  
X Rays ◽  
Characteristic Peak ◽  
Local Composition ◽  
X Ray ◽  
Measured Ratio ◽  
Path Lengths ◽  
Composition Changes

Energy dispersive x-ray microanalysis (EDX) is widely used for the quantitative determination of local composition in thin film specimens. Extraction of quantitative data is usually accomplished by relating the ratio of the number of atoms of two species A and B in the volume excited by the electron beam (nA/nB) to the corresponding ratio of detected characteristic photons (NA/NB) through the use of a k-factor. This leads to an expression of the form nA/nB = kAB NA/NB where kAB is a measure of the relative efficiency with which x-rays are generated and detected from the two species.Errors in thin film x-ray quantification can arise from uncertainties in both NA/NB and kAB. In addition to the inevitable statistical errors, particularly severe problems arise in accurately determining the former if (i) mass loss occurs during spectrum acquisition so that the composition changes as irradiation proceeds, (ii) the characteristic peak from one of the minority components of interest is overlapped by the much larger peak from a majority component, (iii) the measured ratio varies significantly with specimen thickness as a result of electron channeling, or (iv) varying absorption corrections are required due to photons generated at different points having to traverse different path lengths through specimens of irregular and unknown topography on their way to the detector.

scholarly journals Synchrotron X-ray Microdiffraction Images of Polarization Switching in Epitaxial PZT Capacitors with Pt and SrRuO3 Top Electrodes

2003 ◽  
Vol 784 ◽  
Author(s):  
Dal-Hyun Do ◽  
Dong Min Kim ◽  
Chang-Beom Eom ◽  
Eric M. Dufresne ◽  
Eric D. Isaacs ◽  
...  
Keyword(s):  
Thin Film ◽  
Bottom Electrode ◽  
Sputter Deposition ◽  
Ferroelectric Polarization ◽  
X Rays ◽  
X Ray ◽  
Pzt Film ◽  
Thin Film Capacitors ◽  
Pzt Thin Film ◽  
Switchable Polarization

ABSTRACTThe evolution of stored ferroelectric polarization in PZT thin film capacitors was imaged using synchrotron x-ray microdiffraction with a submicron-diameter focused incident x-ray beam. To form the capacitors, an epitaxial Pb(Zr,Ti)O3 (PZT) thin film was deposited on an epitaxially-grown conductive SrRuO3 (SRO) bottom electrode on a SrTiO3 (STO) (001) substrate. Polycrystalline SRO or Pt top electrodes were prepared by sputter deposition through a shadow mask and subsequent annealing. The intensity of x-ray reflections from the PZT film depended on the local ferroelectric polarization. With 10 keV x-rays, regions of opposite polarization differed in intensity by 26% in our PZT capacitor with an SRO top electrode. Devices with SRO electrodes showed just a 25% decrease in the remnant polarization after 107 switching cycles. In devices with Pt top electrodes, however, the switchable polarization decreased a by 70% after only 5×104 cycles.

Spectra of X-Ray Tubes with Transmission Anodes for Fundamental Parameter Analysis

1992 ◽  
Vol 36 ◽  
pp. 81-88
Author(s):  
Horst Ebel ◽  
Maria F. Ebel ◽  
Christian Pöhn ◽  
Bernd Schoßmann
Keyword(s):  
Energy Distribution ◽  
Penetration Depth ◽  
High Voltage ◽  
Spectral Distribution ◽  
Narrow Band ◽  
Typical Feature ◽  
Parameter Analysis ◽  
Fundamental Parameter ◽  
X Rays ◽  
X Ray

AbstractThe approach for the description of the emission of white and characteristic x-rays from standard x-ray tubes is modified for an application to transmission anodes. This modification is based on the assumption of a negligible penetration depth of the electrons in comparison to the thickness of the anode. The results of our considerations are presented for Cu, Mo and W anodes with two different thicknesses. For comparison, the spectra of standard anodes which have been operated with identically high voltages and anode currents are given. A typical feature of transmission anodes is their spectral hardening of the energy distribution of emitted photons. A further interesting detail is the development of narrow band excitation anodes as can be seen from the results for Mo. With anode thicknesses of approximately 200 μm and a high voltage of 30 kv the spectral distribution is restricted to an energy ranging from 15 to 20 keV.

scholarly journals A NuSTAR view of powerful γ-ray loud blazars

2019 ◽  
Vol 627 ◽  
pp. A72 ◽  
Author(s):  
G. Ghisellini ◽  
M. Perri ◽  
L. Costamante ◽  
G. Tagliaferri ◽  
T. Sbarrato ◽  
...  
Keyword(s):  
Energy Distribution ◽  
Spectral Energy Distribution ◽  
Peak Frequency ◽  
High Energy ◽  
Spectral Energy ◽  
X Rays ◽  
X Ray ◽  
Γ Ray ◽  
The Universe ◽  
Jet Power

We observed three blazars at z >  2 with the NuSTAR satellite. These were detected in the γ-rays by Fermi/LAT and in the soft X-rays, but have not yet been observed above 10 keV. The flux and slope of their X-ray continuum, together with Fermi/LAT data allows us to estimate their total electromagnetic output and peak frequency. For some of them we were able to study the source in different states, and investigate the main cause of the different observed spectral energy distribution. We then collected all blazars at redshifts greater than 2 observed by NuSTAR, and confirm that these hard and luminous X-ray blazars are among the most powerful persistent sources in the Universe. We confirm the relation between the jet power and the disk luminosity, extending it at the high-energy end.

Determination of the Mechanical Response of Thin Films with X-Rays

1993 ◽  
Vol 308 ◽  
Author(s):  
I. C. Noyan ◽  
G. Sheikh
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Mechanical Response ◽  
Strain Analysis ◽  
Local Strain ◽  
X Rays ◽  
Stress Strain ◽  
X Ray ◽  
The Individual

ABSTRACTThe mechanical response of a specimen incorporating thin films is dictated by a combination of fundamental mechanical parameters such as Young's moduli of the individual layers, and by configurational parameters such as adhesion strength at the interface(s), residual stress distribution and other process dependent factors. In most systems, the overall response will be dominated by the properties of the (much thicker) substrate. Failure within the individual layers, on the other hand, is dependent on the local strain distributions and can not be predicted from the substrate values alone. To better understand the mechanical response of these systems, the strain within the individual layers of the thin film system must be measured and correlated with applied stresses. Phase selectivity of X-ray stress/strain analysis techniques is well suited for this purpose. In this paper, we will review the use of the traditional x-ray stress/strain analysis methods for the determination of the mechanical properties of thin film systems.

scholarly journals Using the Emission of Muonic X-rays as a Spectroscopic Tool for the Investigation of the Local Chemistry of Elements

Nanomaterials ◽  
2020 ◽  
Vol 10 (7) ◽  
pp. 1260
Author(s):  
Matteo Aramini ◽  
Chiara Milanese ◽  
Adrian D. Hillier ◽  
Alessandro Girella ◽  
Christian Horstmann ◽  
...  
Keyword(s):  
Electronic Structure ◽  
Qualitative Method ◽  
Hydrogen Desorption ◽  
Systematic Investigation ◽  
Muonic Atom ◽  
X Rays ◽  
X Ray ◽  
Spectroscopic Tool ◽  
X Ray Absorption

There are several techniques providing quantitative elemental analysis, but very few capable of identifying both the concentration and chemical state of elements. This study presents a systematic investigation of the properties of the X-rays emitted after the atomic capture of negatively charged muons. The probability rates of the muonic transitions possess sensitivity to the electronic structure of materials, thus making the muonic X-ray Emission Spectroscopy complementary to the X-ray Absorption and Emission techniques for the study of the chemistry of elements, and able of unparalleled analysis in case of elements bearing low atomic numbers. This qualitative method is applied to the characterization of light elements-based, energy-relevant materials involved in the reaction of hydrogen desorption from the reactive hydride composite Ca(BH4)2-Mg2NiH4. The origin of the influence of the band-structure on the muonic atom is discussed and the observed effects are attributed to the contribution of the electronic structure to the screening and to the momentum distribution in the muon cascade.

An Empirical Test Of A Thin-Film Analysis Routine On Bisrcacu Oxide Superconductor Precursors

1990 ◽  
Vol 48 (2) ◽  
pp. 236-237
Author(s):  
D.K. Ross ◽  
R.V. Heyman ◽  
D. Elthon
Keyword(s):  
Thin Film ◽  
Microprobe Analysis ◽  
Electron Microprobe Analysis ◽  
Empirical Test ◽  
X Rays ◽  
Film Analysis ◽  
X Ray ◽  
Analysis Techniques ◽  
Thin Film Analysis ◽  
Excitation Volume

Until quite recently, electron microprobe analysis techniques were limited to samples of “infinite” thickness, that is, to samples thick enough such that the entire excitation volume was contained within the material of interest. Thin film analysis was not possible with available matrix correction programs, which were based on the assumption of samples of “infinite” thickness. Now however, algorithms are available that permit analysis of thin samples.We have obtained one of the more versatile and sophisticated of these programs. In order to investigate the accuracy of this routine we have analyzed several BiSrCaCuO thin films at 15 kV and repeated the analysis at 30 kV. These films were thick enough such that at 15 kV conventional ZAF data reduction yielded acceptable totals (98-101 %) with minimal substrate x rays observed. At 30 kV, however abundant substrate x rays were observed and ZAF yielded very low totals. X-ray intensity ratios from 30 kV runs were used to estimate film thickness and matrix corrections were applied using the Waldo algorithm.

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