scholarly journals Effects of ADC Nonlinearity on the Spurious Dynamic Range Performance of Compressed Sensing

2014 ◽  
Vol 2014 ◽  
pp. 1-6 ◽  
Author(s):  
Rongzong Kang ◽  
Pengwu Tian ◽  
Hongyi Yu
Keyword(s):  
Compressed Sensing ◽  
Dynamic Range ◽  
Dynamic Performance ◽  
Digital Converter ◽  
Analog To Digital ◽  
Sensing System ◽  
Spurious Free Dynamic Range ◽  
Simulation Results ◽  
The Impact ◽  
Free Dynamic

Analog-to-information converter (AIC) plays an important role in the compressed sensing system; it has the potential to significantly extend the capabilities of conventional analog-to-digital converter. This paper evaluates the impact of AIC nonlinearity on the dynamic performance in practical compressed sensing system, which included the nonlinearity introduced by quantization as well as the circuit non-ideality. It presents intuitive yet quantitative insights into the harmonics of quantization output of AIC, and the effect of other AIC nonlinearity on the spurious dynamic range (SFDR) performance is also analyzed. The analysis and simulation results demonstrated that, compared with conventional ADC-based system, the measurement process decorrelates the input signal and the quantization error and alleviate the effect of other decorrelates of AIC, which results in a dramatic increase in spurious free dynamic range (SFDR).

A LOW POWER 13-BIT 50MS/s RECIRCULATING PIPELINE ANALOG TO DIGITAL CONVERTER

2014 ◽  
Vol 23 (06) ◽  
pp. 1450090 ◽  
Author(s):  
ARASH ESMAILI ◽  
HADISEH BABAZADEH ◽  
KHAYROLLAH HADIDI ◽  
ABDOLLAH KHOEI
Keyword(s):  
Power Consumption ◽  
Dynamic Range ◽  
Cmos Technology ◽  
Analog To Digital Converter ◽  
Digital Converter ◽  
Nyquist Frequency ◽  
Signal To Noise ◽  
Analog To Digital ◽  
Spurious Free Dynamic Range ◽  
Free Dynamic

A 13-bit analog-to-digital converter (ADC) is designed in 0.35 μm CMOS technology that reduces the power consumption through sharing the resources between pipeline stages. Using a dummy sample-and-hold (S/H) and recirculating concept the requirements for the first stage are relaxed and the design restrictions are resolved. This ADC does not use a dedicated S/H and reaches a speed of 50 MS/s. The design is tested with TSMC mixed-signal 0.35 μm technology and post layout simulations shows over 75 dB Signal-to-Noise and Distortion-Ratio (SNDR) and over 85 dB Spurious Free Dynamic Range (SFDR) at the Nyquist frequency. The designed chip occupies an area of 1.3 mm–0.7 mm and consumes 164 mW power at Nyquist from a 3.3 V supply.

scholarly journals A 3GSps 12-bit Four-Channel Time-Interleaved Pipelined ADC in 40 nm CMOS Process

Electronics ◽  
2019 ◽  
Vol 8 (12) ◽  
pp. 1551 ◽  
Author(s):  
Jianwen Li ◽  
Xuan Guo ◽  
Jian Luan ◽  
Danyu Wu ◽  
Lei Zhou ◽  
...  
Keyword(s):  
Dynamic Range ◽  
Cmos Process ◽  
Pipelined Adc ◽  
Least Significant Bit ◽  
Analog To Digital ◽  
Capacitor Mismatch ◽  
Gain Error ◽  
Spurious Free Dynamic Range ◽  
Time Interleaved ◽  
Free Dynamic

This paper presents a four-channel time-interleaved 3GSps 12-bit pipelined analog-to-digital converter (ADC). The combination of master clock sampling and delay-adjusting is adopted to remove the time skew due to channel mismatches. An early comparison scheme is used to minimize the non-overlapping time, where a custom-designed latch is developed to replace the typical non-overlapping clock generator. By using the dither capacitor to generate an equivalent direct current input, a zero-input-based calibration is developed to correct the capacitor mismatch and inter-stage gain error. Fabricated in a 40 nm CMOS process, the ADC achieves a signal-to-noise-and-distortion ratio (SNDR) of 57.8 dB and a spurious free dynamic range (SFDR) of 72 dB with a 23 MHz input tone. It can achieve an SNDR above 52.3 dB and an SFDR above 61.5 dB across the entire first Nyquist zone. The differential and integral nonlinearities are −0.93/+0.73 least significant bit (LSB) and −2.8/+4.3 LSB, respectively. The ADC consumes 450 mW powered at 1.8V, occupies an active area of 3 mm × 1.3 mm. The calculated Walden figure of merit reaches 0.44 pJ/step.

Design of Low Voltage Low Power ADC for WSN Node

2013 ◽  
Vol 760-762 ◽  
pp. 561-566
Author(s):  
Si Kui Ren ◽  
Zhi Qun Li
Keyword(s):  
Low Power ◽  
Figure Of Merit ◽  
Dynamic Range ◽  
Low Voltage ◽  
Cmos Technology ◽  
Total Power ◽  
Chip Area ◽  
Analog To Digital ◽  
Spurious Free Dynamic Range ◽  
Free Dynamic

This paper presents a low power low voltage 7bit 16MS/s SAR ADC (successive approximation register analog-to-digital converter) for the application of ZigBee receiver. The proposed 7-bit ADC is designed and simulated in 180nm RF CMOS technology. Post simulation results show that at 1.0-V supply and 16 MS/s, the ADC achieves a SNDR (signal-to-noise-and-distortion ratio) and SFDR (Spurious Free Dynamic Range) are 43.6dB, 57.4dB respectively. The total power dissipation is 228μW, and it occupies a chip area of 0.525 mm2. It results in a figure-of-merit (FOM) of 0.11pJ/step.

NEW SAMPLING METHOD TO IMPROVE THE SFDR OF WIDE BANDWIDTH ADC DEDICATED TO NEXT GENERATION WIRELESS TRANSCEIVER

2004 ◽  
Vol 13 (06) ◽  
pp. 1183-1201
Author(s):  
KAMAL EL-SANKARY ◽  
ALI ASSI ◽  
MOHAMAD SAWAN
Keyword(s):  
High Speed ◽  
Sampling Method ◽  
Dynamic Range ◽  
Sampling Rate ◽  
Analog To Digital ◽  
Wireless Transceiver ◽  
Spurious Free Dynamic Range ◽  
Interleaved Adc ◽  
Time Interleaved ◽  
Free Dynamic

Modern wireless communication standards that support high rates of voice and video streaming need high-speed Analog-to-Digital Converters (ADCs) with wide Spurious-Free Dynamic Range (SFDR). Conventional time-interleaved ADCs suffer from spurious components that seriously affect the SFDR. In this paper, we present the mathematical background describing the effect of randomizing the samples among the interleaved ADCs and we propose a digitally oriented method based on this analysis to randomize the mismatches among the ADC channels. Analyses and simulations show the effectiveness of the proposed approach in multi-channel ADCs with arbitrary bit resolution, channel's number and sampling rate. For a 10-bit 500 MS/s ADC, the SFDR achieved using the proposed randomizing method can be as wide as 75 dB, which is an enhancement of more than 26 dB comparing to the conventional time interleaved ADC.

CHARACTERIZING THE PERFORMANCE OF A HIGH-SPEED ADC FOR THE SMA DIGITAL BACKEND

2014 ◽  
Vol 03 (01) ◽  
pp. 1450001 ◽  
Author(s):  
N. A. PATEL ◽  
R. W. WILSON ◽  
R. PRIMIANI ◽  
J. WEINTROUB ◽  
J. TEST ◽  
...  
Keyword(s):  
High Speed ◽  
Dynamic Range ◽  
Single Channel ◽  
Noise Power ◽  
Response Signal ◽  
Analog To Digital ◽  
High Speed Adc ◽  
Spurious Free Dynamic Range ◽  
Channel Mode ◽  
Free Dynamic

We report on tests of a 5 Gs/s analog-to-digital converter (ADC) used in the new Submillimeter Array (SMA) Digital Backend (DBE). The ADC is e2v EV8AQ160, with 8-bit resolution and 4 interleaved cores, operated in single-channel mode. We measured the frequency response, Signal to Noise and Distortion (SINAD), Spurious Free Dynamic Range (SFDR), Noise Power Ratio and intermodulation distortion over the bandwidth of 2.25 GHz. The performance of this ADC is found to be adequate for our application in the SMA DBE. We describe the procedure of aligning the four cores for adjustments of offset, gain and phase parameters which improve the performance of the ADC, particularly in SINAD and SFDR.

A DITHERING TECHNIQUE FOR SHA_LESS PIPELINED ADC

2014 ◽  
Vol 23 (01) ◽  
pp. 1450006 ◽  
Author(s):  
NING NING ◽  
LING DU ◽  
HUA CHEN ◽  
SHUANGYI WU ◽  
QI YU ◽  
...  
Keyword(s):  
Dynamic Range ◽  
Signal To Noise Ratio ◽  
Input Voltage ◽  
Pipelined Adc ◽  
Digital To Analog Converter ◽  
Analog To Digital ◽  
Behavior Simulation ◽  
Spurious Free Dynamic Range ◽  
Analog Converter ◽  
Free Dynamic

A dithering technique for pipelined analog-to-digital converter (ADC) without sample-and-hold amplifier (SHA) is proposed in this paper. The dither signals are injected to the output of the first stage multiplying digital-to-analog converter (MDAC) and the input of the first stage Sub_ADC simultaneously. The equivalent input voltage of the first stage Sub_ADC is consistent with that of the first stage MDAC with dither. To subtract the dither signal precisely, all of the dither signals are quantified by the ADC itself before normal conversion, and the digital codes representing dither signals are stored. During normal conversion, a dither signal selected randomly is added to the analog input and the corresponding digital code is subtracted from the digital output. The proposed dithering technique is verified by behavior simulation. The simulation results show that the spurious free dynamic range (SFDR) is improved effectively and the degradation of signal-to-noise ratio (SNR) can be minimized.

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