Red Shift for CdTe Nanoparticle Thin Films and Suspensions During Heating

2008 ◽  
Vol 8 (5) ◽  
pp. 2544-2548 ◽  
Author(s):  
S. Dunn ◽  
H. C. Gardner ◽  
C. Bertoni ◽  
D. E. Gallardo ◽  
N. Gaponik ◽  
...  
Keyword(s):  
Thin Films ◽  
Scanning Probe Microscopy ◽  
Room Temperature ◽  
Red Shift ◽  
Scanning Probe ◽  
Initial Increase ◽  
Layer By Layer ◽  
Prolonged Heating ◽  
Temperature State ◽  
Stock Suspension

The work that we have conducted shows that temperature affects the wavelength of light emitted from CdTe nanoparticle clusters that are in a suspension or deposited into thin films via a layer-by-layer process. Compared with the stock suspension, the films show an initial photoluminescent shift, of circa 6–8 nm to the red, when the particles are deposited. A shift of circa 6–8 nm is also seen when the suspensions are first heated to 85 °C from room temperature (20 °C) having been stored in a fridge at 5 °C. This shift is non-recoverable. With continual cycling from room temperature to 85 °C the suspensions show a slight tendency for the emission to move increasingly to the red; whereas the films show no such tendency. In both cases, the range in emission is ca 10 nm from the room temperature state to 80 °C. The intensity of the emission from the film drops abruptly (ca 50% reduction) after one cycle of heating; in the suspension there is an initial increase (ca 3–5% increase) in intensity before it decays. We see that the shift towards the red has been attributed to energy transfer or a rearrangement of the packing of the particles in the thin films. After conducting analysis of the films using scanning probe microscopy we have determined that a change in the morphology is responsible for the permanent shift in emission wavelength associated with prolonged heating. The influence of traps has not been ruled out, but the morphological change in the samples is very large and is likely to be the dominating mechanism affecting change for the red shift at room temperature.

Surface Microstructures of Ferroelectric SrBi2Ta2O9, BaTiO3 and Metallic SrRuO3 Epitaxial Thin Films

1997 ◽  
Vol 493 ◽  
Author(s):  
Q. D. Jiang ◽  
Z. J. Huang ◽  
C. L. Chen ◽  
A. Brazdeikis ◽  
P. Jin ◽  
...  
Keyword(s):  
Thin Films ◽  
Scanning Probe Microscopy ◽  
Layer Growth ◽  
Scanning Probe ◽  
Layer By Layer ◽  
Epitaxial Thin Films ◽  
Island Growth ◽  
Surface Microstructures ◽  
Atomically Flat ◽  
2D To 3D

ABSTRACTWe have made a comparative invetigation of the surface microstructures of epitaxially grown ferroelectric SrBi2Ta2O9, BaTiO3 films, and metallic SrRuO3 films, using scanning probe microscopy. Though their lattices (or pseudotetrogonal lattices) match closely with SrTiO3 (001) substrates, SPM results show very different surface microstructures. The surfaces of SrRuO3 films display atomically flat terraces of 90° oriented step edges. The size of steps is about 6 Å. The surface of BaTiO3 films deposited at various temperatures displays uniform rectangular islands. Different stages of SrBi2Ta2O9 epitaxial growth have been studied on thickness gradient films, which show clearly 2D nucleation and layer-by-layer growth, following a transition from 2D to 3D island growth. It finally develops into a surface exhibiting round hills consisting of curved terraces with size of steps ranging from 6 Å to 12.5 Å.

Optoeletronic investigation of Cu2ZnSn(S,Se)4 thin-films & Cu2ZnSn(S,Se)4/CdS interface with scanning probe microscopy

2015 ◽  
Vol 59 (2) ◽  
pp. 231-236 ◽  
Author(s):  
Jiangjun Li ◽  
Yugang Zou ◽  
Ting Chen ◽  
Jinsong Hu ◽  
Dong Wang ◽  
...  
Keyword(s):  
Thin Films ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Probe Microscopy

New Algorithm to Enable Construction and Display of 3D Structures from Scanning Probe Microscopy Images Acquired Layer-by-Layer

2018 ◽  
Vol 122 (26) ◽  
pp. 5756-5763 ◽  
Author(s):  
William Nanqiao Deng ◽  
Shuo Wang ◽  
Joao Ventrici de Souza ◽  
Tonya L. Kuhl ◽  
Gang-yu Liu
Keyword(s):  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Layer By Layer ◽  
3D Structures ◽  
Probe Microscopy ◽  
Microscopy Images

Enhanced transmittance and mobility of p-type copper iodide thin films prepared at room temperature via a layer-by-layer approach

2019 ◽  
Vol 361 ◽  
pp. 396-402 ◽  
Author(s):  
Fangjuan Geng ◽  
Lei Yang ◽  
Bing Dai ◽  
Shuai Guo ◽  
Gang Gao ◽  
...  
Keyword(s):  
Thin Films ◽  
Room Temperature ◽  
Layer By Layer ◽  
Copper Iodide ◽  
P Type

Laser Induced Nanofabrication on Titanium Thin Films

1995 ◽  
Vol 397 ◽  
Author(s):  
B.D. Huey ◽  
D.A. Bonnell ◽  
A.D. Akhsakhalian ◽  
A.A. Gorbunov ◽  
A. Sewing ◽  
...  
Keyword(s):  
Thin Films ◽  
Scanning Probe Microscopy ◽  
Optical Resolution ◽  
Diffraction Limit ◽  
Scanning Probe ◽  
Nanometer Scale ◽  
Ion Laser ◽  
Titanium Thin Films ◽  
Novel Structures ◽  
Argon Ion

ABSTRACTIllumination of titanium thin films with an argon-ion laser has been used to fabricate nanometer scale features by localized oxidation. The laser induces a temperature gradient in the metal film, within which oxidation may occur. Due to the non-linearity of the reaction with temperature, the reaction zone can be laterally confined to regions narrower than the diffraction limit of optical resolution. Scanning probe microscopy indicates widths ranging from 105 to 600 nm and heights of 0.8 to 30 nm. The possibility of forming novel structures is demonstrated.

Bias assisted scanning probe microscopy direct write lithography enables local oxygen enrichment of lanthanum cuprates thin films

2015 ◽  
Vol 26 (32) ◽  
pp. 325302 ◽  
Author(s):  
Francesco Lavini ◽  
Nan Yang ◽  
Rama K Vasudevan ◽  
E Strelcov ◽  
S Jesse ◽  
...  
Keyword(s):  
Thin Films ◽  
Scanning Probe Microscopy ◽  
Oxygen Enrichment ◽  
Scanning Probe ◽  
Direct Write ◽  
Probe Microscopy ◽  
Local Oxygen

Scanning probe microscopy generated out-of-plane deformation maps exhibiting heterogeneous nanoscale deformation resulting from thermal cycling of Cu–polyimide damascene interconnects

2001 ◽  
Vol 16 (12) ◽  
pp. 3560-3566 ◽  
Author(s):  
Todd S. Gross ◽  
Nazri bin Kamsah ◽  
Igor I. Tsukrov
Keyword(s):  
Scanning Probe Microscopy ◽  
Room Temperature ◽  
Plane Deformation ◽  
Grain Boundary Sliding ◽  
Scanning Probe ◽  
Diffusion Creep ◽  
Probe Microscopy ◽  
Cu Films ◽  
Interfacial Sliding ◽  
Out Of Plane

Room-temperature scanning probe microscopy was used to generate out-of-plane deformation maps around Cu vias and polyimide mesas in single-level Cu–polyimide damascene interconnect structures subjected to a room-temperature to 350 °C thermal cycle. The deformation maps are obtained by taking the difference between the images obtained before and after thermal processing. The deformation of the Cu is shown to be highly heterogeneous on the submicrometer scale. Direct evidence of Cu–Ta interfacial sliding, Cu–Cu grain boundary sliding, and diffusion creep is presented. The direction of Cu–Ta sliding is shown to depend on polyimide mesa size. A hot-stage atomic force microscope was used to show that hillock/extrusion growth occurs at temperatures between 130 and 180 °C. We propose that this hillock/extrusion growth is correlated with dips in stress–temperature plots for blanket, uncapped Cu films in the same temperature range and that the absence of dips for nitride-capped Cu films is due to suppression of the hillock/extrusion growth.

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