Electrical Characteristics of Metal Oxide Based Multi-Layer Vertical Resistive Switching Memories

2014 ◽  
Vol 14 (11) ◽  
pp. 8201-8204
Author(s):  
Sung Hwan Jang ◽  
Dong Hun Kim ◽  
Dong Yoel Yoon ◽  
Tae Whan Kim
2011 ◽  
Vol 1292 ◽  
Author(s):  
Jung Won Seo ◽  
Seung Jae Baik ◽  
Sang Jung Kang ◽  
Koeng Su Lim

ABSTRACTThis report covers the resistive switching characteristics of cross-bar type semi-transparent (or see-through) resistive random access memory (RRAM) devices based on ZnO. In order to evaluate the transmittance of the devices, we designed the memory array with various electrode sizes and spaces between the electrodes. To prevent read disturbance problems due to sneak currents, we employed a metal oxide based p-NiO/n-ZnO diode structure, which exhibited good rectifying characteristics and high forward current density. Based on these results, we found that the combined metal oxide diode/RRAM device could be promising candidate with suppressed read disturbances of cross-bar type ZnO RRAM device.


Hyomen Kagaku ◽  
2011 ◽  
Vol 32 (7) ◽  
pp. 422-427
Author(s):  
Takatoshi YODA ◽  
Kentaro KINOSHITA ◽  
Kazufumi DOBASHI ◽  
Kenichi KITAMURA ◽  
Satoru KISHIDA

2010 ◽  
Vol 44 (2) ◽  
pp. 025103 ◽  
Author(s):  
Henrique L Gomes ◽  
Paulo R F Rocha ◽  
Asal Kiazadeh ◽  
Dago M De Leeuw ◽  
Stefan C J Meskers

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