Simultaneous Real-Time Analysis of Bulk and Bottom Cure of Ultraviolet-Curable Inks Using Fourier Transform Infrared Spectroscopy

2017 ◽  
Vol 71 (12) ◽  
pp. 2699-2706 ◽  
Author(s):  
Hennie A.L. Boonen ◽  
Janou A. Koskamp ◽  
Wolfgang Theiss ◽  
Piet D. Iedema ◽  
Robin X.E. Willemse
Keyword(s):  
Fourier Transform ◽  
Real Time ◽  
Uv Curing ◽  
Fourier Transform Infrared ◽  
Attenuated Total Reflection ◽  
Analysis Method ◽  
Real Time Analysis ◽  
Curing Characteristics ◽  
Ultraviolet Curable ◽  
Ft Ir

The curing characteristics of an ultraviolet (UV) ink layer are of utmost importance for the development of UV inks. Measuring either bulk or bottom cure in itself is not new and has been the subject of many articles. In this article, two methods are described based on Fourier transform infrared (FT-IR) spectrometry to measure in real time and simultaneously the bulk and bottom cure of a thin UV ink layer. The procedure consists of applying a thin (10–12 µm) layer of UV-curing ink on an attenuated total reflection (ATR) crystal. The bottom cure is measured with ATR. The bulk cure is measured simultaneously with a reflection analysis (method 1) or a transmission analysis (method 2). With both methods, the bulk and bottom cure can be determined. To overcome problems with the interference in the ATR reflection setup, it is recommended to use the ATR transmission setup.

Chemometric Approach to a Rapid Attenuated Total Reflection Fourier Transform Infrared Analysis of Complex Heroin-Based Mixtures

2020 ◽  
pp. 000370282096971
Author(s):  
Nataša Radosavljević Stevanović ◽  
Milena Jovanović ◽  
Federico Marini ◽  
Slavica Ražić
Keyword(s):  
Principal Component Analysis ◽  
Fourier Transform ◽  
Principal Component ◽  
Fourier Transform Infrared ◽  
Total Reflection ◽  
Attenuated Total Reflection ◽  
Illegal Market ◽  
Ft Ir

Heroin is one of the most frequently seized drugs in Southeastern Europe. Due to the position in the Balkan route, the Republic of Serbia keeps important role in suppression of the trafficking of heroin for domestic and foreign illegal market. This research is aimed to provide a good scientific approach in the field of seized heroin analysis. Two different forms of heroin are present in the illegal market, mostly in mixtures with typical “cutting” agents: caffeine, paracetamol, and sugars. It was observed that the quantity of pure heroin in seized samples slightly increases from year to year. The aim of this study was to produce a reliable and fast procedure for classification of illicit heroin samples and determination of the concentration range of heroin in the samples. For that purpose, the attenuated total reflection Fourier transform infrared spectroscopy (ATR FT-IR) technique was used and combined with such chemometric methods as principal component analysis, cluster analysis, and partial least squares. Principal component analysis (PCA) as an unsupervised model was used for exploratory purposes to identify trends, similarities, and differences between samples by reducing the dimensionality of the data. The cluster classification of examined samples turned out to be extremely useful to evaluate the possibilities of the ATR FT-IR technique to classify the samples appropriately into the patterns, the constituted clusters. Additionally, partial least square was the suitable method for the purpose of determination of the heroin hydrochloride concentration range in examined samples. It is proved that the joined application of spectroscopy and chemometrics can be extremely convenient and useful for forensic and drugs control laboratories.

Real-time Monitoring and Control of Silicon Epitaxy Using Emission Fourier Transform Infrared Spectroscopy

1993 ◽  
Vol 324 ◽  
Author(s):  
Z.H. Zhou ◽  
H. Kim ◽  
Rafael Reif
Keyword(s):  
Fourier Transform ◽  
Real Time ◽  
Film Growth ◽  
Hydrogen Plasma ◽  
Fourier Transform Infrared ◽  
Plasma Cleaning ◽  
Cleaning Process ◽  
Monitoring And Control ◽  
Ir Radiation ◽  
Ft Ir

AbstractReal-time epi-film thickness is measured by an Emission Fourier Transform Infrared Spectrometer (E/FT-IR). The E/FT-IR takes advantage of the heated wafer as the source of IR radiation. In our experiments, wafers were cleaned using in-situ ECR hydrogen plasma followed by film growth. The cleaning and deposition processes were monitored in real-time using the E/FT-IR technique. We have demonstrated the application of E/FT-IR for observing real-time growth rates and incubation times. Based on these real-time observations, the predeposition plasma cleaning process and the deposition process can be effectively monitored and controlled in real-time. Application of E/FT-IR in optimizing the predeposition hydrogen plasma cleaning process was demonstrated.

Novel Attenuated Total Reflection Fourier Transform Infrared Microscopy Using a Gem Quality Diamond as an Internal Reflection Element

2005 ◽  
Vol 59 (10) ◽  
pp. 1236-1241 ◽  
Author(s):  
Sanong Ekgasit ◽  
Pimthong Thongnopkun
Keyword(s):  
Fourier Transform ◽  
Total Internal Reflection ◽  
Fourier Transform Infrared ◽  
Normal Incidence ◽  
Total Reflection ◽  
Attenuated Total Reflection ◽  
Internal Reflection ◽  
The Novel ◽  
Infrared Microscope ◽  
Ft Ir

A novel technique for attenuated total reflection Fourier transform infrared (ATR FT-IR) spectral acquisition by an infrared microscope with a gem-quality faceted diamond as an internal reflection element (IRE) is introduced. Unlike conventional IREs, the novel diamond IRE has a sharp tip configuration instead of a flat tip configuration. Light at normal incidence was coupled into the diamond while the transflected radiation from the diamond was collected through the table facet by the built-in 15× Cassegrainian objective. The number of reflections in the novel diamond IRE equals two. The evanescent field generated under total internal reflection at the pavilion facet was exploited for ATR spectral acquisition of materials attached to the IRE. The observed ATR spectra were compared to those obtained via a traditional zinc selenide IRE.

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