scholarly journals Structural, Optical and Photoelectrochemical Properties of Cuprous Oxide Synthesized by Low Temperature Thermal Oxidation

2016 ◽  
Vol 13 (1) ◽  
pp. 01-06
Author(s):  
A. A Ogacacho ◽  
B. O. Aduda
Keyword(s):  
Thin Films ◽  
Low Temperature ◽  
Thermal Oxidation ◽  
Ultrathin Films ◽  
Cuprous Oxide ◽  
Photoelectrochemical Properties ◽  
X Ray Diffraction ◽  
Cooling Process ◽  
X Ray ◽  
Dominant Phase

Ultrathin films (50-150nm thick) cuprous oxide (Cu2O) thin films were deposited by low temperature thermal oxidation technique. The structural, optical and photoelectrochemical properties of the thin films were investigated. X-ray diffraction (XRD) and high resolution scanning electron microscope (SEM) was used to study the phase composition and the thin films’ microstructure respectively. XRD results showed that Cu2O was the dominant phase albeit some trace CuO peaks were also observed indicating surface formation of an extremely layer of CuO probably during the cooling process following either deposition or during the annealing steps. SEM showed a highly nanostructure consisting long narrow nanorods with broadening to the surface but with extremely narrow, sharp cylindrical roots standing on the substrate. Photoelectrochemical properties of the films were studied via a standard three electrode using a saturated calomel cell (SCE).

SiO2ZrO2 Thin Films as Low Temperature NO2 and O3 Sensors

2015 ◽  
Vol 1088 ◽  
pp. 81-85 ◽  
Author(s):  
T.N. Myasoedova ◽  
Victor V. Petrov ◽  
Nina K. Plugotarenko ◽  
Dmitriy V. Sergeenko ◽  
Galina Yalovega ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Scanning Electron Microscopy ◽  
Low Temperature ◽  
Annealing Temperature ◽  
Sol Gel ◽  
X Ray Diffraction ◽  
X Ray ◽  
Operating Temperatures ◽  
Scanning Electron

Thin SiO2ZrO2films were prepared, up to 0.2 μm thick, by means of the sol–gel technology and characterized by a Scanning electron microscopy and X-ray diffraction. It is shown the presence of monoclinic, cubic and tetragonal phases of ZrO2in the SiO2matrix. The crystallites sizes depend on the annealing temperature of the film and amount to 35 and 56 nm for the films annealed at 773 and 973 K, respectively. The films resistance is rather sensitive to the presence of NO2and O3impurity in air at lower operating temperatures in the range of 30-60°C.

Structural properties of low-temperature grown ZnO thin films determined by X-ray diffraction and X-ray absorption spectroscopy

2011 ◽  
Vol 519 (13) ◽  
pp. 4366-4370 ◽  
Author(s):  
Chung-Jong Yu ◽  
Nark-Eon Sung ◽  
Han-Koo Lee ◽  
Hyun-Joon Shin ◽  
Young-Duck Yun ◽  
...  
Keyword(s):  
Thin Films ◽  
Low Temperature ◽  
Structural Properties ◽  
Absorption Spectroscopy ◽  
Zno Thin Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
X Ray Absorption

Microstructures of Ultrathin Films of Sputtered PbTiO3

1994 ◽  
Vol 361 ◽  
Author(s):  
Kiyotaka Wasa ◽  
T. Satoh ◽  
K. Tab Ata ◽  
H. Adachi ◽  
Y. Ichikawa ◽  
...  
Keyword(s):  
Thin Films ◽  
Surface Roughness ◽  
Ultrathin Films ◽  
Crystal Orientation ◽  
Smooth Surface ◽  
Three Dimensional ◽  
Rf Magnetron Sputtering ◽  
X Ray Diffraction ◽  
X Ray ◽  
Dimensional Crystal

ABSTRACTUltrathin films of perovskite PbTiO3, 10–100nm thick, were epitaxially grown on miscut (001)SrTiO3 substrate by rf-magnetron sputtering at 600°C. The electron microscope and high resolution x-ray diffraction analysis suggested the evidence of epitaxial growth of (001)PbTiO3/(001)SrTiO3 with three dimensional crystal orientation. The stoichiometric film shows extremely smooth surface with the surface roughness less than 3nm. Deposition on a miscut substrate under stoichiometric conditions is essential to make continuous thin films of single crystal perovskite PbTiO3.

scholarly journals ON THE PHOTOLUMINESCENCE AND OPTICAL PROPERTIES OF ZINC OXIDE THIN FILMS PREPARED BY THERMAL OXIDATION

2018 ◽  
Vol 24 (3) ◽  
Author(s):  
DRAGOȘ-IOAN RUSU
Keyword(s):  
Thin Films ◽  
Zinc Oxide ◽  
Thermal Oxidation ◽  
Structural Investigation ◽  
Structural Parameters ◽  
Zno Thin Films ◽  
Metallic Zinc ◽  
Photoluminescence Spectra ◽  
X Ray Diffraction ◽  
X Ray

Zinc oxide (ZnO) thin films were prepared by thermal oxidation of vacuum evaporated metallic zinc films. Some structural investigation, performed by X-ray diffraction technique, showed that films are polycrystalline and have a würtzite structure. We also determined some structural parameters of the films. The optical absorption was studied in the wavelength range from 300 nm to 1700 nm. Photoluminescence spectra at temperatures 293 K and 78 K have been analysed.

scholarly journals Effect of Annealing Temperature on Cu2O Thin Films Prepared by Thermal Oxidation Method

2020 ◽  
Vol 36 (2) ◽  
Author(s):  
Tran Thi Ha ◽  
Nguyen Thi Huyen Trang ◽  
Bach Thanh Cong ◽  
Nguyen Thi Dieu Thu ◽  
Nguyen Thanh Binh ◽  
...  
Keyword(s):  
Thin Films ◽  
Thermal Oxidation ◽  
Annealing Temperature ◽  
Reflectance Spectroscopy ◽  
Phase Identification ◽  
Diffraction Measurement ◽  
X Ray Diffraction ◽  
Oxidation Method ◽  
X Ray ◽  
Cu2o Thin Films

We report a facile process to fabricate cuprous thin films by thermal oxidation of copper substrates. Structure and phase identification were studied by X-ray diffraction measurement and Raman spectroscopy. Scanning electron microscopy was utilized to study surface morphology of the as-fabricated thin films and optical properties of the samples were investigated by diffused reflectance spectroscopy. The study shows that cuprous thin films could be obtained by controlling annealing temperature in the region of 200-300 oC.

scholarly journals X-Ray Peak Profile Analysis of Materials M1 and M2 by Williamson-Hall and Size-Strain Plot Methods

2021 ◽  
Vol 45 (2) ◽  
pp. 167-173
Author(s):  
Lalmi Khier ◽  
Lakel Abdelghani ◽  
Djamel Maouche
Keyword(s):  
Low Temperature ◽  
Profile Analysis ◽  
Microstructural Analysis ◽  
Diffraction Method ◽  
X Ray Diffraction ◽  
X Ray ◽  
Mullite Phase ◽  
Dominant Phase ◽  
Joint Method

In this work, we have studied the Kaolin M1 and M2 by the X-ray diffraction method, and we have focused on mullite phase which is the main phase present in common in both products. An update of the program of the method of Stokes was carried out, it was necessary to the microstructural analysis. The completed version is less sensitive to the choice by excess of the number of coefficients of Fourier with regard to the effect of truncation and the office plurality of the errors. The determination of the symmetry of the cell of the principal phase (mullite) in the studied fritted Kaolins was carried out. In Kaolin M1, the size of crystallites of the dominant phase varies between 80 to 170 Å. In Kaolin M2, the size of the crystalline grains of mullite varies between 100 to 400 Å. The size of crystallites was confirmed by the joint method of Williamson-Hall. A distribution of sizes of crystallites was carried out. It shows a dominance of the size of approximately 140 Å for the principal phase of Kaolin M1 and a dominance of the size of approximately 230 Å for the same principal phase of Kaolin M2. By the study of the profiles of line by DRX, it appears very clearly that the principal phase of the various sintered Kaolins, mullite, is free from internal microstrains. It is the case of the mixtures fritted not only at low temperature (1100℃) during 1 hour but also the case of the mixtures of the type ‘chamotte’ cooks with 1350℃ during very long times.

X-ray Diffraction Study of Electric-field-induced Strains in Polycrystalline BiFeO3 Thin Films at Low Temperature Using Synchrotron Radiation

2011 ◽  
Vol 59 (3(1)) ◽  
pp. 2556-2559 ◽  
Author(s):  
Seiji Nakashima ◽  
Osami Sakata ◽  
Hironori Fujisawa ◽  
Jung Min Park ◽  
Takeshi Kanashima ◽  
...  
Keyword(s):  
Thin Films ◽  
Synchrotron Radiation ◽  
Low Temperature ◽  
Electric Field ◽  
Diffraction Study ◽  
X Ray Diffraction ◽  
X Ray ◽  
Bifeo3 Thin Films

scholarly journals Direct synthesis of nanostructured silver antimony sulfide powders from metal xanthate precursors

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Yasser T. Alharbi ◽  
Firoz Alam ◽  
Abdelmajid Salhi ◽  
Mohamed Missous ◽  
David J. Lewis
Keyword(s):  
Thin Films ◽  
Raman Spectroscopy ◽  
Spin Coating ◽  
Carrier Mobility ◽  
Direct Synthesis ◽  
X Ray Diffraction ◽  
X Ray ◽  
Metal Xanthate ◽  
P Type ◽  
Dominant Phase

AbstractSilver(I) ethylxanthate [AgS2COEt] (1) and antimony(III) ethylxanthate [Sb(S2COEt)3] (2) have been synthesised, characterised and used as precursors for the preparation of AgSbS2 powders and thin films using a solvent-free melt method and spin coating technique, respectively. The as-synthesized AgSbS2 powders were characterized by powder X-ray diffraction (XRD), Raman spectroscopy, scanning electron microscopy (SEM) and energy dispersive X-ray (EDX) spectroscopy. The crystalline AgSbS2 powder was investigated using XRD, which shows that AgSbS2 has cuboargyrite as the dominant phase, which was also confirmed by Raman spectroscopy. SEM was also used to study the morphology of the resulting material which is potentially nanostructured. EDX spectra gives a clear indication of the presence of silver (Ag), antimony (Sb) and sulfur (S) in material, suggesting that decomposition is clean and produces high quality AgSbS2 crystalline powder, which is consistent with the XRD and Raman data. Electronic properties of AgSbS2 thin films deposited by spin coating show a p-type conductivity with measured carrier mobility of 81 cm2 V−1 s−1 and carrier concentration of 1.9 × 1015 cm−3. The findings of this study reveal a new bottom-up route to these compounds, which have potential application as absorber layers in solar cells.

Highly Sensitive H2 Sensors Based on Pd- and PdO-Decorated TiO2 Thin Films at Low-Temperature Operation

2016 ◽  
Vol 675-676 ◽  
pp. 277-280 ◽  
Author(s):  
Benjarong Samransuksamer ◽  
Tula Jutarosaga ◽  
Mati Horprathum ◽  
Anurat Wisitsoraat ◽  
Pitak Eiamchai ◽  
...  
Keyword(s):  
Thin Films ◽  
Low Temperature ◽  
Photoelectron Spectroscopy ◽  
Chemical Element ◽  
Operating Temperature ◽  
X Ray Diffraction ◽  
X Ray ◽  
Highly Sensitive ◽  
Dc Reactive Magnetron Sputtering ◽  
Very High

Abstract In this work, the low-temperature H2-sensing properties of palladium (Pd) and palladium oxide (PdO) nanoparticles decorated titanium dioxide (TiO2) thin film were studied. The TiO2 thin films were prepared by the dc reactive magnetron sputtering. The Pd and PdO nanoparticles were sputtered on the top surface of TiO2 surface in order to enhance the sensitivity to the H2 gas. Morphologies, crystal structures, and chemical element of the examiner samples were investigated by the field-emission scanning electron microscopy (FE-SEM), grazing-incident X-ray diffraction (GIXRD), and X-ray photoelectron spectroscopy (XPS), respectively. The effects of the Pd and PdO nanoparticles on H2-sensing performance of TiO2 were investigated over a low concentration range of 150-3,000 ppm H2 at 50-250°C-operating temperatures. This result exhibited that the PdO decorated on TiO2 surface showed very high response to H2 at a low operating temperature of 150°C.

scholarly journals Cu 4O3 thin films deposited by non-reactive rf-magnetron sputtering from a copper oxide target

2021 ◽  
Vol 67 (3 May-Jun) ◽  
pp. 495
Author(s):  
M. A. Cruz Almazán ◽  
E. Vigueras Santiago ◽  
R. López ◽  
S. Hernández López ◽  
V. Hugo Castrejón Sánchez ◽  
...  
Keyword(s):  
Thin Films ◽  
Magnetron Sputtering ◽  
Copper Oxide ◽  
Cuprous Oxide ◽  
Cupric Oxide ◽  
Rf Magnetron Sputtering ◽  
X Ray Diffraction ◽  
Oxide Thin Films ◽  
X Ray ◽  
Reactive Rf Magnetron Sputtering

Copper oxide thin films deposited by sputtering are frequently formed by using metal copper targets in reactive atmospheres. In this report, paramelaconite (Cu4O3) thin films were deposited by non-reactive rf magnetron sputtering. The target used for sputtering was a copper oxide disk fabricated by oxidation of metal copper at 1000 °C for 24 h in airatmosphere. X-ray diffraction (XRD) results showed that the copper oxide target was mainly composed of cupric oxide (CuO) and cuprous oxide (Cu2O) crystals. Raman analyses suggested that the surface of the copper oxide disk is composed by a (CuO) layer. XRD measurements performed to the copper oxide thin films deposited by non-reactive rf magnetron sputtering showed that the film is composed of (Cu4O3) crystals. However,Raman measurements indicated that the Cu4O3 thin films are also composed by amorphous CuO and Cu2O.

Sign in / Sign up

Export Citation Format

Share Document