Feasibility and Performances of a New, Multiplexed, Fast and Low-Cost Fiber-Optic NIR Spectrometer for the On-Line Measurement of Sugar in Fruits

1993 ◽  
Vol 47 (7) ◽  
pp. 1079-1083 ◽  
Author(s):  
Véronique Bellon ◽  
Jean Louis Vigneau ◽  
Michel Leclercq
Keyword(s):  
Fiber Optics ◽  
Signal To Noise Ratio ◽  
Low Cost ◽  
Sugar Content ◽  
Acquisition Time ◽  
Diode Array ◽  
Line Measurement ◽  
Array Technology ◽  
On Line ◽  
Good Signal

This paper describes an attempt to develop a new NIR spectrometer to sort fruits according to the sugar content in the conditioning stations. This spectrometer, ranging from 800 to 1050 nm, is based on diode array technology. It is coupled with fiber optics, which allow multiplexing; 20 fibers have been detected by the camera, showing the potential multiplexing of 20 different points. The acquisition time is 40 ms per image (i.e., 2 ms per spectrum). A good signal-to-noise ratio has been recorded in the 820–1010 nm range. This spectrometer has been tested with a set of 79 peaches. Partial least-squares processing is applied to different wavelength ranges. The best coefficient of correlation, achieved with a reduced wavelength range (from 847 to 977 nm), is 0.81, and the standard error of prediction is 1.04°Brix. With this calibration, the fruits can be sorted into three maturity classes with a reliability of 76%. This performance, as well as the other characteristics of the instrument, is in accordance with the requirements of the conditioning station managers.

A New Method for On-line Measurement of the Straightness Error of Machine Tools Using an Acceleration Sensor

2021 ◽  
Author(s):  
Kuo Liu ◽  
Yiming Cui ◽  
Zhisong Liu ◽  
Jiakun Wu ◽  
Yongqing Wang
Keyword(s):  
Machine Tools ◽  
Signal To Noise Ratio ◽  
Measurement Data ◽  
Geometric Error ◽  
Ar Model ◽  
High Signal ◽  
Line Measurement ◽  
On Line ◽  
Straightness Error ◽  
Zero Phase

Abstract In order to improve the poor efficiency in the measurement of the geometric error of machine tools’ linear axes, this paper has presented a method to measure and restructure the geometric error of linear axes that is based on accelerometers. This method takes advantage of the phenomenon that when acceleration is measured under different measuring speeds, different frequencies and amplitudes are produced. The measurement data of the high signal-to-noise ratio for various velocities was fused together and the straightness error of the measured axis was obtained by integrating the acceleration twice. In order to remove the trend terms error in the integration, a zero phase IIR Butterworth filter was designed, which guarantees the signal’s phase invariance after filtering. The data was continued with the AR model to eliminate the endpoints’ effect in the filtering. The proposed method was verified by numerical values and experiments. The results showed that the proposed method has better robustness, a wider bandwidth and a higher efficiency than the methods of measuring by laser interferometer. It is also able to measure the geometric error of linear axes with an accuracy that reaches the micron scale.

Capacitance Automatic Measurement Method of the Thickness of Liquid Film on Plat Form

2008 ◽  
Vol 381-382 ◽  
pp. 157-160
Author(s):  
Shu Xing Xu ◽  
B. Wang ◽  
Yi Zhong Zheng
Keyword(s):  
Real Time ◽  
Virtual Instrument ◽  
Measurement Method ◽  
Low Cost ◽  
Measurement Theory ◽  
Water Film ◽  
Automatic Measurement ◽  
Time Data ◽  
Line Measurement ◽  
On Line

The thickness of water film is an important parameter in the field of chemical industry. Water film is formed by the flowing water, which flows through a narrow channel. So it is difficult to use contact gauges to measure the water film because it’s flowing so fast that if it is touched, the thickness will be changed. A low-cost and high precision non-contact measurement method—capacitive sensor is used as the sensor of the thickness of water film, virtual instrument is used to analyze the measurement state. In contrast to the conventional stand-alone instruments, a PC based virtual instrument for the measurement of water film is proposed in this paper. Based on on-line measurement theory, real time voltages should be collected to PC. These voltages will be computed by formulas in Labview and the real time data of thickness will be plotted on the screen. If bad signal got, it will give error alarm. The method of the measurement of water film can save a lot of fees of research and applications, and be easy to apply in other measurement and control fields. The basic principle and working process of capacitive micrometer, denoise method, the method of capacitive calibration, virtual instrument data acquisition system and on-line measurement of water film, will be further discussed in this paper.

scholarly journals A Novel Correlation for Rapid Lactose Determination in Milk by a Cryoscopic Technique

2006 ◽  
Vol 89 (6) ◽  
pp. 1581-1584 ◽  
Author(s):  
Carmen Colinas ◽  
Ignacio Barrera ◽  
Carlos A Blanco
Keyword(s):  
Freezing Point ◽  
Low Cost ◽  
Line Measurement ◽  
Lactose Concentration ◽  
Close Relationship ◽  
On Line ◽  
Simple Measurement ◽  
Enzymatic Procedure ◽  
Spectrophotometric Control ◽  
Operational Simplicity

Abstract Residual lactose in special milk was systematically determined for people with lactose intolerance by means of a rapid on-line measurement of the cryoscopic point. A proposed cryoscopic procedure was compared to 2 conventional yet highly laborious methods: the enzymatic procedure with spectrophotometric control and the polarimetric method. Several experiments with different mixtures of both semi-skimmed and low-lactose milk were performed. A lineal relationship was found between lactose concentration and freezing point, the analytical equation for which shows a close relationship regarding the 3 methods used. The advantages of the cryoscopic procedure include speed in obtaining results and operational simplicity at a low cost, better monitoring of enzymatic hydrolysis kinetics, and greater control over the production process for delactosed milk. The equation obtained also enables prediction of the lactose percentage in commercial milk by a simple measurement of freezing point.

Microcomputer-assisted on-line measurement of breathing pattern and occlusion pressure

1984 ◽  
Vol 56 (1) ◽  
pp. 235-239 ◽  
Author(s):  
F. G. Lind ◽  
A. B. Truve ◽  
B. P. Lindborg
Keyword(s):  
Breathing Pattern ◽  
Low Cost ◽  
Occlusion Pressure ◽  
Flexible System ◽  
Analog Signals ◽  
Occlusion Device ◽  
Mouth Pressure ◽  
Line Measurement ◽  
On Line ◽  
Mouth Occlusion Pressure

A flexible system has been developed for on-line breath-by-breath measurements of variables commonly included in studies of breathing pattern and mouth occlusion pressure (P0.1). The system, utilizing analog signals for mouth pressure and inspiratory flow as inputs, includes a breathing pattern monitor and a pneumatically driven occlusion device designed to be compatible with a low-cost microcomputer and analog and/or digital readout instruments. The design of the system permits accurate breathing pattern and P0.1 measurements even at the highest flow and breathing frequency encountered in muscular exercise studies.

Some Quantification Problems in Parallel EELS Images

1990 ◽  
Vol 48 (2) ◽  
pp. 36-37
Author(s):  
G. Botton ◽  
G. L’Espérance ◽  
M.D. Ball ◽  
C.E. Gallerneault
Keyword(s):  
Electron Microscope ◽  
Imaging System ◽  
Signal To Noise Ratio ◽  
Scanning Transmission Electron Microscope ◽  
Acquisition Time ◽  
Thickness Variation ◽  
Transmission Electron ◽  
Distribution Of Elements ◽  
Scanning Transmission ◽  
Present Distribution

The recently developed parallel electron energy loss spectrometers (PEELS) have led to a significant reduction in spectrum acquisition time making EELS more useful in many applications in material science. Dwell times as short as 50 msec per spectrum with a PEELS coupled to a scanning transmission electron microscope (STEM), can make quantitative EEL images accessible. These images would present distribution of elements with the high spatial resolution inherent to EELS. The aim of this paper is to briefly investigate the effect of acquisition time per pixel on the signal to noise ratio (SNR), the effect of thickness variation and crystallography and finally the energy stability of spectra when acquired in the scanning mode during long periods of time.The configuration of the imaging system is the following: a Gatan PEELS is coupled to a CM30 (TEM/STEM) electron microscope, the control of the spectrometer and microscope is performed through a LINK AN10-85S MCA which is interfaced to a IBM RT 125 (running under AIX) via a DR11W line.

Thickness Measurement in the AEM by Macintosh-Based Analysis of Two-Beam Convergent Beam Patterns

1990 ◽  
Vol 48 (2) ◽  
pp. 504-505
Author(s):  
John F. Mansfield ◽  
Douglas C. Crawford
Keyword(s):  
Electron Microscope ◽  
Video Camera ◽  
Thickness Measurement ◽  
Specimen Thickness ◽  
Crystalline Materials ◽  
Beam Dynamic ◽  
Line Measurement ◽  
On Line ◽  
Image Position ◽  
Convergent Beam

A method has been developed that allows on-line measurement of the thickness of crystalline materials in the analytical electron microscope. Two-beam convergent beam electron diffraction (CBED) patterns are digitized from a JEOL 2000FX electron microscope into an Apple Macintosh II microcomputer via a Gatan #673 CCD Video Camera and an Imaging Systems Technology Video 1000 frame-capture board. It is necessary to know the lattice parameters of the sample since measurements are made of the spacing of the diffraction discs in order to calibrate the pattern. The sample thickness is calculated from measurements of the spacings of the fringes that are seen in the diffraction discs. This technique was pioneered by Kelly et al, who used the two-beam dynamic theory of MacGillavry relate the deviation parameter (Si) of the ith fringe from the exact Bragg condition to the specimen thickness (t) with the equation:Where ξg, is the extinction distance for that reflection and ni is an integer.

Information capacity and bandwidth limitations in the SEM

1989 ◽  
Vol 47 ◽  
pp. 84-85
Author(s):  
D. C. Joy ◽  
R. D. Bunn
Keyword(s):  
Signal To Noise Ratio ◽  
Critical Dimension ◽  
Information Capacity ◽  
Acquisition Time ◽  
Signal To Noise ◽  
Sem Image ◽  
Probe Size ◽  
Minimum Number ◽  
Noise Ratio ◽  
Signal Channel

The information available from an SEM image is limited both by the inherent signal to noise ratio that characterizes the image and as a result of the transformations that it may undergo as it is passed through the amplifying circuits of the instrument. In applications such as Critical Dimension Metrology it is necessary to be able to quantify these limitations in order to be able to assess the likely precision of any measurement made with the microscope.The information capacity of an SEM signal, defined as the minimum number of bits needed to encode the output signal, depends on the signal to noise ratio of the image - which in turn depends on the probe size and source brightness and acquisition time per pixel - and on the efficiency of the specimen in producing the signal that is being observed. A detailed analysis of the secondary electron case shows that the information capacity C (bits/pixel) of the SEM signal channel could be written as :

Control Strategies for a Highly Loaded Biological Ammonia Elimination Process

1993 ◽  
Vol 28 (11-12) ◽  
pp. 531-538 ◽  
Author(s):  
B. Teichgräber
Keyword(s):  
Closed Loop ◽  
Control Strategies ◽  
Level Control ◽  
Sludge Dewatering ◽  
Loop Control ◽  
Reject Water ◽  
Line Measurement ◽  
Control Pattern ◽  
On Line ◽  
Treatment Facilities

A nitrification/denitrification process was applied to reject water treatment from sludge dewatering at Bottrop central sludge treatment facilities of the Emschergenossenschaft. On-line monitoring of influent and effluent turbidity, closed loop control of DO and pH, and on-line monitoring of nitrogen compounds were combined to a three level control pattern. Though on-line measurement of substrate and product showed substantial response time it could be used to operate nitrification/denitrification within process boundaries.

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