scholarly journals Analysis for Adhesion Force between Atomic Force Tip and Condensed Particles of Polystyrene Latex. Revised Equation of Interaction Force between Micro Particles Based on DMT Theory.

Hyomen Kagaku ◽  
1998 ◽  
Vol 19 (8) ◽  
pp. 491-497
Author(s):  
Hiroshi HORIOUCHI ◽  
Akira KAWAI
Molecules ◽  
2021 ◽  
Vol 26 (4) ◽  
pp. 900
Author(s):  
Maria Vardaki ◽  
Aida Pantazi ◽  
Ioana Demetrescu ◽  
Marius Enachescu

In this work we present the results of a functional properties assessment via Atomic Force Microscopy (AFM)-based surface morphology, surface roughness, nano-scratch tests and adhesion force maps of TiZr-based nanotubular structures. The nanostructures have been electrochemically prepared in a glycerin + 15 vol.% H2O + 0.2 M NH4F electrolyte. The AFM topography images confirmed the successful preparation of the nanotubular coatings. The Root Mean Square (RMS) and average (Ra) roughness parameters increased after anodizing, while the mean adhesion force value decreased. The prepared nanocoatings exhibited a smaller mean scratch hardness value compared to the un-coated TiZr. However, the mean hardness (H) values of the coatings highlight their potential in having reliable mechanical resistances, which along with the significant increase of the surface roughness parameters, which could help in improving the osseointegration, and also with the important decrease of the mean adhesion force, which could lead to a reduction in bacterial adhesion, are providing the nanostructures with a great potential to be used as a better alternative for Ti implants in dentistry.


2004 ◽  
Vol 126 (2) ◽  
pp. 327-335 ◽  
Author(s):  
Nader Jalili ◽  
Mohsen Dadfarnia ◽  
Darren M. Dawson

The atomic force microscope (AFM) system has evolved into a useful tool for direct measurements of intermolecular forces with atomic-resolution characterization that can be employed in a broad spectrum of applications. The non-contact AFM offers unique advantages over other contemporary scanning probe techniques such as contact AFM and scanning tunneling microscopy, especially when utilized for reliable measurements of soft samples (e.g., biological species). Current AFM imaging techniques are often based on a lumped-parameters model and ordinary differential equation (ODE) representation of the micro-cantilevers coupled with an adhoc method for atomic interaction force estimation (especially in non-contact mode). Since the magnitude of the interaction force lies within the range of nano-Newtons to pica-Newtons, precise estimation of the atomic force is crucial for accurate topographical imaging. In contrast to the previously utilized lumped modeling methods, this paper aims at improving current AFM measurement technique through developing a general distributed-parameters base modeling approach that reveals greater insight into the fundamental characteristics of the microcantilever-sample interaction. For this, the governing equations of motion are derived in the global coordinates via the Hamilton’s Extended Principle. An interaction force identification scheme is then designed based on the original infinite dimensional distributed-parameters system which, in turn, reveals the unmeasurable distance between AFM tip and sample surface. Numerical simulations are provided to support these claims.


2000 ◽  
Vol 40 (supplement) ◽  
pp. S80
Author(s):  
H. Kim ◽  
T. Osada ◽  
A. Ikai

2005 ◽  
Vol 103-104 ◽  
pp. 275-278
Author(s):  
Yi Koan Hong ◽  
Ja Hyung Han ◽  
Jin Hyung Lee ◽  
Jin Goo Park ◽  
Ahmed A. Busnaina

The adhesion force and removal of alumina particles on Cu, Ta, TEOS, SILKTM, Aurora and FSG wafer surfaces were experimentally and theoretically investigated in slurry solutions of different pHs. These wafer surfaces showed negative zeta potentials in the investigated pH ranges with exception of FSG and Ta. However, the zeta potentials of FSG surface drastically decreased with increasing pH. The lowest adhesion force and smallest number of alumina particles were measured between alumina particle and FSG surface in a slurry solution of pH 11. Alkaline slurry was much more desirable in controlling the level of particle contamination during Cu CMP. The pH of the slurry and zeta potentials of the surfaces played important roles in controlling the interaction force.


2014 ◽  
Vol 658 ◽  
pp. 459-464
Author(s):  
Bogdan Munteanu ◽  
Yves Berthier ◽  
Jean Paul Rieu ◽  
Ana Maria Trunfio-Sfarghiu

We present an experimental study of the interactions of negative and positive model particles and their influence on the surface elasticity of biomimetic pulmonary surfactant. In this purpose we have measured the adhesion force between negative (G) and positive (GS) particles and supported lipid bilayer by Atomic Force Spectroscopy. In addition, the modification in surface elasticity of lipid monolayer under quasistatic compression when interacting with negative and positive particles was investigated on a Langmuir trough. We found that, positive particles interact poorly with biomimetic pulmonary surfactant, therefore no modifications in surface elasticity were observed. Conversely, negative charged particles interact strongly with the biomimetic pulmonary surfactant, decreasing the surface elasticity. The results are directly relevant for understanding the interactions and the effects of particulate matter on pulmonary structures which could lead to pulmonary surfactant inhibition or deficiency causing severe respiratory distress or pathologies.


2010 ◽  
Vol 13 (3) ◽  
pp. 1029-1037 ◽  
Author(s):  
Lijin Xia ◽  
Scott C. Lenaghan ◽  
Mingjun Zhang ◽  
Yu Wu ◽  
Xiaopeng Zhao ◽  
...  

2004 ◽  
Vol 49 (2) ◽  
pp. 183-190 ◽  
Author(s):  
S. Dunn ◽  
S. Impey ◽  
C. Kimpton ◽  
S.A. Parsons ◽  
J. Doyle ◽  
...  

Stainless steel, polymethylmethacrylate and polytetrafluoroethylene coupons were analysed for surface topographical and adhesion force characteristics using tapping mode atomic force microscopy and force-distance microscopy techniques. The two polymer materials were surface modified by polishing with silicon carbide papers of known grade. The struvite scaling rate was determined for each coupon and related to the data gained from the surface analysis. The scaling rate correlated well with adhesion force measurements indicating that lower energy materials scale at a lower rate. The techniques outlined in the paper provide a method for the rapid screening of materials in potential scaling applications.


2001 ◽  
Vol 7 (S2) ◽  
pp. 1236-1237
Author(s):  
Shelley R. Gilliss ◽  
Jeffrey K. Fairer ◽  
N. Ravishankar ◽  
Mark G. Schwabel ◽  
C. Barry Carter

Cerium oxide is widely used for chemomechanical polishing (CMP) of silicate glasses. Uses include finishing of optical elements and planarizing dielectrics in the semiconductor industry. This study is designed to investigate the fundamentals of the cerium oxide/silica CMP process by measuring the interaction force between silicate glasses and cerium oxide. Surface forces involved in the polishing of glass by a cerium oxide abrasive can be studied in a controlled manner by measuring sample-tip interactions between a glass substrate and a cerium oxide tip in an atomic force microscope (AFM). Commercially available AFM tips have been coated with thin, uniform films of cerium oxide. By using a square pyramid tip as a template for the shape of the cerium oxide film, challenges related to irregular or blunt tip shape can be overcome. However, complete characterization of structure, shape and chemical composition is required before useful information can be obtained using the AFM.


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