scholarly journals Impact of electron beam irradiation in potato starch films containing hibiscus aquous extract

2021 ◽  
Vol 9 (2) ◽  
Author(s):  
Bruna Saporito Teixeira ◽  
Gabriel De Souza Chierentin ◽  
Nelida Lucia del Mastro
Keyword(s):  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Potato Starch ◽  
Low Cost ◽  
Natural Antioxidants ◽  
Degradation Process ◽  
Beam Irradiation ◽  
Good Ability ◽  
Radiation Degradation ◽  
Starch Films

The development of starch films containing natural antioxidants is one alternative of active packaging. Starch is a well-studied natural biopolymer that can be used for the development of biodegradable films because it presents a low cost, is easy to obtain and presents good ability to form films. Hibiscus sabdariffa, commonly known as hibiscus, roselle or red sorrel, is an annual herbaceous sub shrub that contains many types of biocompounds, including organic and phenolic acids. The aim of the present work was to determine the influence of electron beam irradiation on potato starch film containing hibiscus extract. The aqueous hibiscus solution was prepared by boiling for 3 min 1% w/ml dehydrated hibiscus flowers in 500 ml deionized water. The film forming solution was prepared by casting (5% potato starch, 3% glycerol as plasticizer and the hibiscus solution) and irradiated in a 1.5 MeV electron beam accelerator Dynamitron II (Radiation Dynamics Inc.), with doses of 0, 20, 40 and 60 kGy. After drying some mechanical properties were measured. The tensile strength of the control films and the irradiated ones was established. There were no significant differences among them. It looks like hibiscus antioxidants were able to prevent the expected starch radiation degradation process caused by radiation generated free radicals.

The effect of electron beam irradiation on physicochemical properties of potato starch

2018 ◽  
Author(s):  
N. Rajeswara Rao ◽  
B. Sanjeev Rao ◽  
S. V. S. Ramana Reddy ◽  
T. Venkatappa Rao
Keyword(s):  
Electron Beam ◽  
Physicochemical Properties ◽  
Electron Beam Irradiation ◽  
Potato Starch ◽  
Beam Irradiation

scholarly journals Rapid consolidation and curing of advanced composites using electron beam irradiation

2018 ◽  
Vol 233 (4) ◽  
pp. 1168-1181
Author(s):  
Robert Rizzolo ◽  
Daniel Walczyk ◽  
Jaron Kuppers ◽  
Daniel Montoney ◽  
Richard Galloway
Keyword(s):  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Low Cost ◽  
Thickness Distribution ◽  
Hydraulic Press ◽  
Liquid Composite Molding ◽  
Beam Irradiation ◽  
Cross Sectional ◽  
Manufacturing Method ◽  
Strength And Stiffness

A low-cost, low-waste manufacturing method for advanced thermoset composite parts could improve market penetration of composites compared to other engineering materials such as aluminum or steel. Such a method could combine some of the new trends in composites manufacturing such as resin infusion (eliminates need for prepreg), out-of-autoclave consolidation, and snap curing. The feasibility of a hybrid process with these characteristics has been demonstrated by uniting liquid composite molding, resin curing by electron beam irradiation, and high pressure consolidation with specialized elastomeric tooling. To demonstrate feasibility, a mold set was designed to make flat, square four-ply woven carbon fiber parts by (1) vacuum-infusing dry preforms with an electron beam–curable epoxy resin in minutes, (2) applying 690 kPa of uniform pressure and consolidating in seconds using an elastomer-faced specialized elastomeric tooling tool and simple hydraulic press, and (3) curing in seconds using a 3 MeV electron beam source. To better understand how various process parameters affect part performance, parameters are varied in a simple design of experiments, and flexural strength and stiffness, thickness distribution, fiber and void volume fractions, surface roughness, and cross-sectional characteristics (via microscopy) are measured and compared.

Lignin Incorporation Combined with Electron-Beam Irradiation Improves the Surface Water Resistance of Starch Films

2004 ◽  
Vol 5 (5) ◽  
pp. 1678-1686 ◽  
Author(s):  
S. Lepifre ◽  
M. Froment ◽  
F. Cazaux ◽  
S. Houot ◽  
D. Lourdin ◽  
...  
Keyword(s):  
Electron Beam ◽  
Surface Water ◽  
Electron Beam Irradiation ◽  
Water Resistance ◽  
Beam Irradiation ◽  
Starch Films

Methods to Monitor and Improve the Performance of Specimen Holders for Transmission Electron Cryomicroscopy

1996 ◽  
Vol 54 ◽  
pp. 454-455
Author(s):  
B. L. Armbruster ◽  
B. Kraus ◽  
M. Pan
Keyword(s):  
Electron Microscopy ◽  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Beam Irradiation ◽  
Quality Of Data ◽  
Electron Cryomicroscopy ◽  
Thermal Equilibration ◽  
Transmission Electron ◽  
Electron Microscopes

One goal in electron microscopy of biological specimens is to improve the quality of data to equal the resolution capabilities of modem transmission electron microscopes. Radiation damage and beam- induced movement caused by charging of the sample, low image contrast at high resolution, and sensitivity to external vibration and drift in side entry specimen holders limit the effective resolution one can achieve. Several methods have been developed to address these limitations: cryomethods are widely employed to preserve and stabilize specimens against some of the adverse effects of the vacuum and electron beam irradiation, spot-scan imaging reduces charging and associated beam-induced movement, and energy-filtered imaging removes the “fog” caused by inelastic scattering of electrons which is particularly pronounced in thick specimens.Although most cryoholders can easily achieve a 3.4Å resolution specification, information perpendicular to the goniometer axis may be degraded due to vibration. Absolute drift after mechanical and thermal equilibration as well as drift after movement of a holder may cause loss of resolution in any direction.

A Study of Electron Beam Irradiation Influence on Device Contact Junction Characteristics of Advanced DRAM Using Atomic Force Probing

2013 ◽  
Author(s):  
Wei-Chih Wang ◽  
Jian-Shing Luo
Keyword(s):  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Forward Bias ◽  
Irradiation Damage ◽  
Beam Irradiation ◽  
Excess Current ◽  
Atomic Force ◽  
Order Of Magnitude ◽  
Voltage Contrast ◽  
Acceleration Voltage

Abstract In this paper, we revealed p+/n-well and n+/p-well junction characteristic changes caused by electron beam (EB) irradiation. Most importantly, we found a device contact side junction characteristic is relatively sensitive to EB irradiation than its whole device characteristic; an order of magnitude excess current appears at low forward bias region after 1kV EB acceleration voltage irradiation (Vacc). Furthermore, these changes were well interpreted by our Monte Carlo simulation results, the Shockley-Read Hall (SRH) model and the Generation-Recombination (G-R) center trap theory. In addition, four essential examining items were suggested and proposed for EB irradiation damage origins investigation and evaluation. Finally, by taking advantage of the excess current phenomenon, a scanning electron microscope (SEM) passive voltage contrast (PVC) fault localization application at n-FET region was also demonstrated.

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