scholarly journals Neutron tunneling in nanostructured systems: isotopical effect

MRS Advances ◽  
2018 ◽  
Vol 3 (42-43) ◽  
pp. 2609-2616
Author(s):  
A. Matiwane ◽  
J. Sackey ◽  
M.L. Lekala ◽  
A. Gibaud ◽  
M. Maaza

AbstractThis contribution reports, to the best of our knowledge, for the first time on the neutron tunneling phenomenon in nickel isotopes based nanostructured. More accurately, 58Ni-62Ni-58Ni thin films Fabry-Perot resonator configuration exhibited several tunneling resonances. In total, there were 7 tunneling resonances. These tunneling resonances manifest themselves via sharp dips in the total reflection plateau due to quasi-bound states in the nanostructured isotopic based nickel thin film Fabry-Perot resonator.

2015 ◽  
Vol 51 (6) ◽  
pp. 1143-1146 ◽  
Author(s):  
Monika Warzecha ◽  
Jesus Calvo-Castro ◽  
Alan R. Kennedy ◽  
Alisdair N. Macpherson ◽  
Kenneth Shankland ◽  
...  

Sensitive optical detection of nitroaromatic vapours with diketopyrrolopyrrole thin films is reported for the first time.


2020 ◽  
Vol 8 (2) ◽  
pp. 536-542 ◽  
Author(s):  
Yuanqi Huang ◽  
Ang Gao ◽  
Daoyou Guo ◽  
Xia Lu ◽  
Xiao Zhang ◽  
...  

A thermostable Fe-doped γ-Ga2O3 thin film with a high room temperature saturation magnetic moment of 5.73 μB/Fe has been obtained for the first time.


1996 ◽  
Vol 423 ◽  
Author(s):  
Chinkyo Kim ◽  
I. K. Robinson ◽  
Jaemin Myoung ◽  
Kyuhwan Shim ◽  
Kyekyoon Kim ◽  
...  

AbstractIn some materials, Van der Merwe's equilibrium theory of strain relief is believed to explain the sudden transition from pseudomorphic growth of a thin film to a progressively relaxed state. We show, for the first time for GaN, how an accurate estimate of the critical thickness of a thin film can be extrapolated from suitable measurements of lattice constants as a function of film thickness using synchrotron X-ray. We do this both for an elementary elastic energy function, in which the interactions between the dislocations are ignored, and for a more realistic energy estimate due to Kasper. The method is found to work quantitatively for thin films of GaN on AIN. The critical thickness is determined to be 29 ± 4 Å.


2019 ◽  
Vol 2 (2) ◽  
pp. 67
Author(s):  
Zhiya Dang ◽  
Duc Anh Dinh

Lead halide perovskites are the new rising generation of semiconductor materials due to their unique optical and electrical properties. The investigation of the interaction of halide perovskites and light is a key issue not only for understanding their photophysics but also for practical applications. Hence, tremendous efforts have been devoted to this topic and brunch into two: (i) decomposition of the halide perovskites thin films under light illumination; and (ii) influence of light soaking on their photoluminescence (PL) properties. In this review, we for the first time thoroughly compare the illumination conditions and the sample environment to correlate the PL changes and decomposition of perovskite under light illumination. In the case of vacuum and dry nitrogen, PL of the halide perovskite (MAPbI3–xClx, MAPbBr3–xClx, MAPbI3) thin films decreases due to the defects induced by light illumination, and under high excitations, the thin film even decomposes. In the presence of oxygen or moisture, light induces the PL enhancement of halide perovskite (MAPbI3) thin films at low light illumination, while increasing the excitation, which causes the PL to quench and perovskite thin film to decompose. In the case of mixed halide perovskite ((MA)Pb(BrxI1-x)3) light induces reversible segregation of Br domains and I domains. 


2015 ◽  
Vol 3 (38) ◽  
pp. 19263-19267 ◽  
Author(s):  
Dandan Zhao ◽  
Qingwen Tian ◽  
Zhengji Zhou ◽  
Gang Wang ◽  
Yuena Meng ◽  
...  

A novel, robust and low-toxicity solution route to deposit CIGSe thin films for solar cell applications is proposed. The solvent of 1,2-ethanedithiol and 1,2-ethylenediamine is employed for the first time to simultaneously dissolve elemental Cu, In, Ga, and Se. With this solution-processed CIGSe thin film solar cell, an efficiency of 9.5% was achieved.


2000 ◽  
Vol 609 ◽  
Author(s):  
R.E.I. Schropp ◽  
J.K. Rath ◽  
B. Stannowski ◽  
C.H.M. Van Der Werf ◽  
Y. Chen ◽  
...  

ABSTRACTDirect deposition of polycrystalline silicon (poly-Si) thin films by the Hot Wire CVD method has been used for the first time for the fabrication of poly-Si top gate Thin Film Transistors (TFTs). The TFTs have a high electron mobility in saturation of up to 4 cm2V−1s−1 as well as a remarkably large ON/OFF ratio of up to 6 × 105.


2015 ◽  
Vol 3 (17) ◽  
pp. 9152-9159 ◽  
Author(s):  
Chang-Wen Chen ◽  
Sheng-Yi Hsiao ◽  
Chien-Yu Chen ◽  
Hao-Wei Kang ◽  
Zheng-Yu Huang ◽  
...  

The optical constants of a CH3NH3PbI3−xClxperovskite thin film were acquired for the first time.


2005 ◽  
Vol 875 ◽  
Author(s):  
Lili Hu ◽  
Junlan Wang ◽  
Zijian Li ◽  
Shuang Li ◽  
Yushan Yan

AbstractNanoporous zeolite thin films are promising candidates as future low dielectric constant (low-k) materials. During the integration process with other semiconductor materials, the residual stresses resulting from the synthesis processes may cause fracture or delamination of the thin films. In order to achieve high quality low-k zeolite thin films, the evaluation of the adhesion performance is important. In this paper, laser spallation technique is utilized to investigate the interfacial adhesion of zeolite thin film-Si substrate interfaces prepared using three different processes. The experimental results demonstrate that the nature of the deposition method has a great effect on the resulted interfacial adhesion of the film-substrate interfaces. This is the first time that the interfacial strength of zeolite thin films-Si substrates is quantitatively evaluated. The results have great significance in the future applications of low-k zeolite thin film materials.


1995 ◽  
Vol 39 ◽  
pp. 695-700
Author(s):  
Kenji Sakurai ◽  
Atsuo Iida

It has been proposed that the interference effect in grazing incidence/exit X-ray fluorescence can be used as an analytical tool. Though these total reflection related measurements have been widely used because of their inherent high sensitivity to the surface of materials, the interference in case of thin films is most likely to be considered difficult to analyze. The present paper describes the use of the interference effect to provide additional capability to enhance information on a specific interface of a thin film. Detailed interpretation of the angular resolved fluorescence tells us at which interface an element of interest is localized. It can be applied to the thin film of only a few layers or non-periodic multilayers where a regular standing wave is not generated.


Author(s):  
Zhiya Dang 1 ◽  
Duc Anh Dinh 1

Lead halide perovskites are the new rising generation of semiconductor materials due to theirunique optical and electrical properties. The investigation of the interaction of halide perovskites and light is a key issue not only for understanding theirphotophysicsbut also for practical applications. Hence, tremendous efforts have been devoted to this topic andbrunch into two:(i)decompositionof the halide perovskites thin films under light illumination and(ii)influence of light soaking on their photoluminescence (PL) properties. In this review, we for the first time thoroughly compare the illumination conditions and the sample environment to correlate the PL changes and decomposition of perovskite under light illumination. Inthe case of vacuum and dry nitrogen, PL of the halide perovskite ( PbI3–xClx, PbBr3–xClx, MAPbI3) thin films decreases due to the defects induced by light illumination, and under high excitations the thin film even decomposes. In thepresence of oxygen or moisture,light induces the PL enhancement of halide perovskite (MAPbI3) thin films at low light illumination, while increasing the excitationcauses the PL to quench and perovskite thin film to decompose. In the case of mixed halide perovskite (MAPb(BrxI1-x)3) light inducesreversible segregation of Br domains and I domains. 


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