Photoluminescence in Porous Silicon: Evidence for the Quantum Confinement Model

1991 ◽  
Vol 256 ◽  
Author(s):  
David L. Naylor ◽  
Sung B. Lee ◽  
John C. Pincenti ◽  
Brett E. Bouma
Keyword(s):  
Porous Silicon ◽  
Hydrofluoric Acid ◽  
Quantum Wire ◽  
Quantum Confinement ◽  
Electrochemical Etching ◽  
Photoluminescence Spectra ◽  
Peak Wavelength ◽  
Effects Of Temperature ◽  
Good Agreement ◽  
Confinement Model

ABSTRACTPhotoluminescence spectra have been measured in porous silicon following electrochemical etching in dilute hydrofluoric acid (HF). The effects of HF concentration during etching on the efficiency and peak wavelength of photoluminescence have been investigated. The effects of temperature between 25°C and 200°C on PL spectra have been recorded. Photoluminescence lifetimes as a function of wavelength have been studied following ultrashort UV photoexcitation. A number of lifetime components in the decay are observed the longest in good agreement over the wavelength range of 500 to 600 nm with a silicon quantum wire model. At longer wavelengths a departure from lifetimes of the wire model is observed and two hypotheses for the discrepancy are presented.

Relationships Between Photoluminescence Spectra and Porosity of Porous Silicon

1994 ◽  
Vol 332 ◽  
Author(s):  
H.Z. Song ◽  
L.Z. Zhang ◽  
B.R. Zhang ◽  
G.G. Qin
Keyword(s):  
Porous Silicon ◽  
Quantum Confinement ◽  
Light Emission ◽  
Photoluminescence Spectra ◽  
Lower Side ◽  
Si Substrates ◽  
Peak Energy ◽  
P Type ◽  
Confinement Model

ABSTRACTIt was found that porous silicon (PS) layers formed on 0.01 Ωcm (111) and 0.02 Ωcm (100) Si substrates show high photoluminescence (PL) peak energies on both lower and higher porosity sides and a minimum of PL peak energy at the moderate porosity, while those formed on 0.8 and 10Ωcm (111) p-type Si substrates show an increase of PL peak energy with porosity on the lower side and a saturation of PL peak energy with porosity on the higher side. These experimental facts are not consistent with the quantum confinement model for light emission of PS, which predicts a monotonous increase of PL peak energy with PS porosity.

Effect of Metallic Ions on Photoluminescence of Porous Silicon

2010 ◽  
Vol 663-665 ◽  
pp. 641-644 ◽  
Author(s):  
Bao Gai Zhai ◽  
Ming Meng ◽  
Qing Lan Ma ◽  
Yuan Ming Huang
Keyword(s):  
Porous Silicon ◽  
Cross Section ◽  
Electrochemical Deposition ◽  
Quantum Confinement ◽  
Careful Consideration ◽  
Metallic Ions ◽  
Photoluminescence Spectra ◽  
Physical Origin ◽  
Sem Images ◽  
Confinement Model

In the present paper, we have not only investigated the top surface and cross-section morphology, but also measured photoluminescence spectra characteristic of porous silicon after deposition of metallic ions by electrochemical deposition employing scanning electron microscopy (SEM) and spectrometer, respectively. It is apparent from the SEM images that the microstructure of porous silicon is seriously ruined by the metallic ions deposited by electrochemical deposition. Most interesting is the finding that in the photoluminescence spectrum of porous silicon after the deposition of metallic ions such as AL3+ and Cu2+, the luminescence band gradually is quenched as the electrochemical deposition progressed. A careful consideration of the results obtained show that according to the basic theory of well-established quantum confinement model, the quenching of photoluminescence spectra of porous silicon may well be attributed to the microstructure fell into ruin. On the other side of the fence, we can interpret the physical origin of the phenomenon in view of the presence of metallic ions which give rise a series of energy level deep in the band gap of porous silicon.

DETERMINATION OF NANOMETER-SCALE SIZES IN n+-TYPE POROUS SILICON BY THE USE OF X-RAY AND RAMAN SPECTROSCOPIES

2002 ◽  
Vol 09 (05n06) ◽  
pp. 1769-1772
Author(s):  
A. RAMÍREZ-PORRAS
Keyword(s):  
Porous Silicon ◽  
Quantum Confinement ◽  
Uv Light ◽  
Electrochemical Etching ◽  
Nanometer Scale ◽  
X Ray ◽  
Recombination Processes ◽  
Phosphorus Doped ◽  
Confinement Model

Porous silicon layers were obtained by electrochemical etching on (111) plane surfaces of crystalline phosphorus-doped silicon in the presence of hydrofluoric acid. The photoluminescence of this kind of layers when illuminated with UV light is possibly explained by the quantum confinement model (QCM), which states the presence of nanometer-scale crystallites that enlarge the semiconductor band gap up to optical photon energies when the band-to-band recombination processes take place. In this study, the size determination of those proposed structures was performed by X-ray diffractiometry and by Raman spectroscopy. The obtained results suggest a consistency between the experimental work and the QCM.

Quantum Confinement Effects on the Dielectric Constant of Porous Silicon

1992 ◽  
Vol 283 ◽  
Author(s):  
R. Tsu ◽  
L. Ioriatti ◽  
J. F. Harvey ◽  
H. Shen ◽  
R. A. Lux
Keyword(s):  
Dielectric Constant ◽  
Porous Silicon ◽  
Size Effects ◽  
Quantum Confinement ◽  
Electrochemical Etching ◽  
Index Of Refraction ◽  
Quantum Size Effects ◽  
Quantum Size ◽  
Quantum Confinement Effects ◽  
Shallow Impurities

ABSTRACTThe reduction of the dielectric constant due to quantum confinement is studied both experimentally and theoretically. Angle resolved ellipsometry measurements with Ar- and He-Ne-lasers give values for the index of refraction far below what can be accounted for from porosity alone. A modified Penn model to include quantum size effects has been used to calculate the reduction in the static dielectric constant (ε) with extreme confinement. Since the binding energy of shallow impurities depends inversely on ε2, the drastic decrease in the carrier concentration as a result of the decrease in ε leads to a self-limiting process for the electrochemical etching of porous silicon.

scholarly journals Depth-Resolved Microspectroscopy of Porous Silicon Multilayers

1999 ◽  
Vol 588 ◽  
Author(s):  
S. Manotas ◽  
F. Agulló-Rueda ◽  
J. D. Moreno ◽  
R. J. Martín-Palma ◽  
R. Guerrero-Lemus ◽  
...  
Keyword(s):  
Porous Silicon ◽  
Quantum Confinement ◽  
Silicon Nanocrystals ◽  
Phonon Frequency ◽  
Lattice Mismatch ◽  
High Porosity ◽  
Phonon Confinement ◽  
Heating Effects ◽  
Average Size ◽  
Good Agreement

AbstractWe have measured micro-photoluminescence (PL) and micro-Raman spectra on the cross section of porous silicon multilayers to sample different layer depths. We find noticeable differences in the spectra of layers with different porosity, as expected from the quantum confinement of electrons and phonons in silicon nanocrystals with different average sizes. The PL emission band gets stronger, blue shifts, and narrows at the high porosity layers. The average size can be estimated from the shift. The Raman phonon band at 520 cm−1 weakens and broadens asymmetrically towards the low energy side. The line shape can be related quantitatively with the average size by the phonon confinement model. To get a good agreement with the model we add a band at around 480 cm−1, which has been attributed to amorphous silicon. We also have to leave as free parameters the bulk silicon phonon frequency and its line width, which depend on temperature and stress. We reduced laser power to eliminate heating effects. Then we use the change of frequency with depth to monitor the stress. At the interface with the substrate we find a compressive stress in excess of 10 kbar, which agrees with the reported lattice mismatch. Finally, average sizes are larger than those estimated from PL.

Effects of Gas Environments on Porous Silicon Photoluminescence

1999 ◽  
Vol 560 ◽  
Author(s):  
G. Di Francia ◽  
V. La Ferrara ◽  
L. Lancellotti ◽  
L. Quercia ◽  
T. Fasolino
Keyword(s):  
Porous Silicon ◽  
Oxide Layer ◽  
Electrochemical Etching ◽  
Peak Wavelength ◽  
Laser Illumination ◽  
Dry Air ◽  
Thin Oxide Layer ◽  
Thin Oxide ◽  
Photoluminescence Response

ABSTRACTThe photoluminescence response of a series of porous silicon samples, obtained by electrochemical etching of n-type CZ-silicon, has been recorded in various gas environments. A quenching is reported when porous silicon is in the presence of an oxidising ambient (dry air or acetone vapours in dry air). Process reversibility depends on the duration of laser illumination. Quenching is also recorded if porous silicon is in the presence of acetone vapours in nitrogen ambient, where complete reversibility is however shown. Moreover, the peak wavelength is red shifted in dry air and blue shifted in acetone vapours. Irreversible quenching is related to the growth of a thin oxide layer on the emitting nanostrucures.

scholarly journals PHOTOSENSITIVE MATRIX BASED ON POROUS MICROCRYSTALLINE SILICON

2017 ◽  
Vol 17 (5) ◽  
pp. 115-121
Author(s):  
N.V. Latukhina ◽  
D.A. Pisarenko ◽  
A.V. Volkov ◽  
V.A. Kitaeva
Keyword(s):  
Porous Silicon ◽  
Hydrofluoric Acid ◽  
Electrochemical Etching ◽  
Etching Process ◽  
Microcrystalline Silicon ◽  
Artificial Retina ◽  
Experimental Researches ◽  
Water Alcohol Solutions ◽  
Water Alcohol

The article presents the results of experimental researches of optoelectric properties of porous silicon. Layers of porous silicon were formed using electrochemical etching process in water-alcohol solutions of hydrofluoric acid on plates with a pre-established microrelief surface. Evaluation of possibility of using of created structure as the artificial retina component was performed based on the results of the research.

Effect of Preparation Conditions on the Silicon L-Edge In Electrochemically Prepared Porous Silicon

1993 ◽  
Vol 298 ◽  
Author(s):  
T. Van Buuren ◽  
T. Tiedje ◽  
W. Weydanz
Keyword(s):  
Electronic Structure ◽  
High Resolution ◽  
Porous Silicon ◽  
Quantum Confinement ◽  
Light Exposure ◽  
Blue Shift ◽  
Bulk Silicon ◽  
Preparation Conditions ◽  
P Type ◽  
Confinement Model

AbstractHigh resolution measurements of the silicon L-edge absorption in electrochemically prepared porous silicon show that the absorption threshold is shifted to higher energy relative to bulk silicon, and that the shift is dependent on how the porous silicon is prepared. When the porous silicon is made from n-type material with light exposure, the blue shift increases logarithmically with the anodizing current. Porous silicon prepared by anodizing p-type silicon exhibits a blue shift in the L-edge which increases with the time spent in the HF solution after the anodizing potential is turned off. The data are consistent with the quantum confinement model for the electronic structure of porous silicon.

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