Comparative Study of Structural Properties of YBa2Cu3O7 Thin Films on SrTiO3 Single Crystal and Bicrystal Substrates by X- ray Diffraction

AbstractWe present a comparative study in terms of structural properties deduced from X - ray diffraction diagrams between YBa2Cu3O7 (YBCO) thin films fabricated on SrTiO3 (STO) single crystal substrates and bicrystallines substrates with a symmetrical tilt angle of 24 degrees. Periodic Lattice Distortions (PLD) have been observed around different Bragg peaks in YBCO thin films deposited on STO bicrystals while only diffraction peaks have been measured in the diagrams corresponding to the YBCO thin films deposited on STO single crystal substrates. Only in regions situated a 3.5 mm at both sides of the grain boundary the PDL have been investigated. Scans along different (h, k, l) directions allow us to conclude that the qPLD vector associated to the distortion is along the (h,-k,0) direction. However, we found that the amplitude of the components of the qPLD vector depend on the Bragg peak chosen. We believe such a result indicates that we have not a PDL with a simple qPLD vector. In this line, other (h, k, l) directions must be investigated to deduce the exact origin of the qPLD vector. Nevertheless, independently on the qPLD vector associated to the PLD, we believe that such a distortion in the lattice is a consequence of the stress field induced by the grain boundary in the YBCO thin film deposited on the bricrystal.

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Comparative Study on Structural Properties of Poly(3-hexylthiophene) and Poly(3-hexylthiophene):6,6-Phenyl-C61Butyric Acid Methyl Ester Thin Films Using Synchrotron X-ray Diffraction

Japanese Journal of Applied Physics ◽

10.1143/jjap.49.01ac01 ◽

2010 ◽

Vol 49 (1) ◽

pp. 01AC01 ◽

Cited By ~ 1

Author(s):

Takeaki Sakurai ◽

Toshihiro Yamanari ◽

Masato Kubota ◽

Susumu Toyoshima ◽

Tetsuya Taima ◽

...

Keyword(s):

Thin Films ◽

Methyl Ester ◽

Comparative Study ◽

Structural Properties ◽

Acid Methyl Ester ◽

X Ray Diffraction ◽

X Ray ◽

Acid Methyl

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Structural properties of the guest species in diacyl peroxide/urea inclusion compounds: an X-ray diffraction investigation

Proceedings of the Royal Society of London. Series A: Mathematical and Physical Sciences ◽

10.1098/rspa.1990.0129 ◽

1990 ◽

Vol 431 (1882) ◽

pp. 245-269 ◽

Cited By ~ 31

Keyword(s):

Single Crystal ◽

Structural Properties ◽

Inclusion Compounds ◽

X Ray Diffraction ◽

Channel Axis ◽

Guest Molecules ◽

X Ray ◽

Urea Inclusion Compounds ◽

Diacyl Peroxide ◽

Urea Inclusion

In this paper we report single crystal X-ray diffraction studies of urea inclusion compounds containing diacyl peroxides (dioctanoyl peroxide (OP), diundecanoyl peroxide (UP), lauroyl peroxide (LP)) as the guest component. In these inclusion compounds, the host (urea) molecules crystallize in a hexagonal structure that contains linear, parallel, non-intersecting channels (tunnels). The guest (diacyl peroxide) molecules are closely packed inside these channels with a periodic repeat distance that is incommensurate with the period of the host structure along the channel axis. Furthermore, there is pronounced inhomogeneity within the guest structure: within each single crystal, there are regions in which the guest molecules are three-dimensionally ordered, and other regions in which they are only one-dimensionally ordered (along the channel axis). Although it has not proven possible to ‘determine’ the guest structures in the conventional sense, substantial information concerning their average periodicities and their orientational relationships with respect to the host has been deduced from single crystal X-ray diffraction photographs recorded at room temperature. For OP/urea, UP/urea and LP/urea, the guest structure in the three-dimensionally ordered regions is monoclinic, and six types of domain of this monoclinic structure can be identified within each single crystal. The relative packing of diacyl peroxide molecules is the same in each domain, and the different domains are related by 60° rotation about the channel axis. For each of these inclusion compounds, the offset between the ‘heights’ of the guest molecules in adjacent channels is the same ( ca . 4.6 Å (4.6 x 10 -10 m)) within experimental error, suggesting that the relative interchannel packing of the guest molecules is controlled by a property of the diacyl peroxide group. In addition to revealing these novel structural properties, the work discussed in this paper has more general relevance concerning the measurement and interpretation of single crystal X-ray diffraction patterns that are based on more than one three-dimensionally periodic reciprocal lattice. Seven separate reciprocal lattices are required to rationalize the complete X-ray diffraction pattern from each diacyl peroxide/urea crystal studied here.

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Crystallization of Zn-rich and P-rich amorphous Zn3P2 thin films

Canadian Journal of Physics ◽

10.1139/p88-060 ◽

1988 ◽

Vol 66 (5) ◽

pp. 373-375 ◽

Cited By ~ 4

Author(s):

C. J. Arsenault ◽

D. E. Brodie

Keyword(s):

Thin Film ◽

Thin Films ◽

Activation Energy ◽

Electrical Properties ◽

Structural Properties ◽

Crystallization Process ◽

X Ray Diffraction ◽

Electrical Measurements ◽

Conductivity Activation Energy ◽

X Ray

Zn-rich and P-rich amorphous Zn3P2 thin films were prepared by co-evaporation of the excess element during the normal Zn3P2 deposition. X-ray diffraction techniques were used to investigate the structural properties and the crystallization process. Agglomeration of the excess element within the as-made amorphous Zn3P2 thin film accounted for the structural properties observed after annealing the sample. Electrical measurements showed that excess Zn reduces the conductivity activation energy and increases the conductivity, while excess P up to 15 at.% does not alter the electrical properties significantly.

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A comparative study of the structural properties of InGaN/GaN quantum wells determined by X-ray diffraction, high-angle annular dark-field imaging and energy-filtered TEM

Microscopy of Semiconducting Materials 2003 ◽

10.1201/9781351074636-13 ◽

2018 ◽

pp. 57-60

Author(s):

J S Barnard ◽

M E Vickers ◽

M J Kappers ◽

E J Thrush ◽

C J Humphreys

Keyword(s):

Comparative Study ◽

Quantum Wells ◽

Structural Properties ◽

Dark Field ◽

High Angle ◽

X Ray Diffraction ◽

X Ray ◽

Dark Field Imaging ◽

Annular Dark Field ◽

Field Imaging

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Microstructure and Mechanical Properties of Chromium Carbide Coatings Deposited by Magnetron Sputtering Technique

Defect and Diffusion Forum ◽

10.4028/www.scientific.net/ddf.397.118 ◽

2019 ◽

Vol 397 ◽

pp. 118-124

Author(s):

Linda Aissani ◽

Khaoula Rahmouni ◽

Laala Guelani ◽

Mourad Zaabat ◽

Akram Alhussein

Keyword(s):

Thin Films ◽

Mechanical Properties ◽

Magnetron Sputtering ◽

Structural Properties ◽

Annealing Temperature ◽

Diffusion Mechanism ◽

X Ray Diffraction ◽

Chromium Carbides ◽

X Ray ◽

Mechanical And Structural Properties

From the hard and anti-corrosions coatings, we found the chromium carbides, these components were discovered by large studies; like thin films since years ago. They were pointed a good quality for the protection of steel, because of their thermal and mechanical properties for this reason, it was used in many fields for protection. Plus: their hardness and their important function in mechanical coatings. The aim of this work joins a study of the effect of the thermal treatment on mechanical and structural properties of the Cr/steel system. Thin films were deposited by cathodic magnetron sputtering on the steel substrates of 100C6, contain 1% wt of carbon. Samples were annealing in vacuum temperature interval between 700 to 1000 °C since 45 min, it forms the chromium carbides. Then pieces are characterising by X-ray diffraction, X-ray microanalysis and scanning electron microscopy. Mechanical properties are analysing by Vickers test. The X-ray diffraction analyse point the formation of the Cr7C3, Cr23C6 carbides at 900°C; they transformed to ternary carbides in a highest temperature, but the Cr3C2 doesn’t appear. The X-ray microanalysis shows the diffusion mechanism between the chromium film and the steel sample; from the variation of: Cr, Fe, C, O elements concentration with the change of annealing temperature. The variation of annealing temperature shows a clean improvement in mechanical and structural properties, like the adhesion and the micro-hardness.

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Lumefantrine Comparative Study: Single Crystal, Powder X-Ray Diffraction, Hirshfeld Surface, and Thermal Analysis

Journal of Structural Chemistry ◽

10.1134/s0022476620010175 ◽

2020 ◽

Vol 61 (1) ◽

pp. 151-159

Author(s):

M. B. de Freitas-Marques ◽

M. I. Yoshida ◽

C. Fernandes ◽

B. L. Rodrigues ◽

W. N. Mussel

Keyword(s):

Thermal Analysis ◽

Comparative Study ◽

Single Crystal ◽

Hirshfeld Surface ◽

X Ray Diffraction ◽

X Ray

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Single-Crystal-like Structure of Poly(9,9-dioctylfluorene) Thin Films Evaluated by Synchrotron-Sourced Grazing-Incidence X-ray Diffraction

Polymer Journal ◽

10.1295/polymj.pj2007063 ◽

2007 ◽

Vol 39 (12) ◽

pp. 1306-1311 ◽

Cited By ~ 4

Author(s):

Masahiro Misaki ◽

Shuichi Nagamatsu ◽

Masayuki Chikamatsu ◽

Yuji Yoshida ◽

Reiko Azumi ◽

...

Keyword(s):

Thin Films ◽

Single Crystal ◽

Grazing Incidence ◽

X Ray Diffraction ◽

X Ray

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EPITAXIALLY GROWN YBCO THIN FILMS ON LOW LOSS LaAlO3 SUBSTRATE

Modern Physics Letters B ◽

10.1142/s0217984990000477 ◽

1990 ◽

Vol 04 (05) ◽

pp. 369-373 ◽

Cited By ~ 3

Author(s):

Y. Z. ZHANG ◽

L. LI ◽

Y. Y. ZHAO ◽

B. R. ZHAO ◽

Y. G. WANG ◽

...

Keyword(s):

Electron Microscopy ◽

Thin Films ◽

Scanning Electron Microscopy ◽

X Ray Diffraction ◽

Dc Magnetron Sputtering ◽

Low Loss ◽

X Ray ◽

Ybco Thin Films ◽

Zero Resistance ◽

Scanning Electron

A planar dc magnetron sputtering device was used to prepare high T c and high J c YBCO thin films. Both single crystal and polycrystal thin films were successfully grown on (100) oriented LaAlO 3 substrates. Zero resistance temperature T c0 = 92.3 K and critical current density J c (0) = 3.82 × 106 A/cm 2 at 77 K was obtained. The films were characterized by X-ray diffraction (XRD) and scanning electron microscopy (SEM).

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REALIZATION AND CHARACTERIZATION OF e-BEAM COMPLETELY EVAPORATED BSCCO THIN FILMS

Modern Physics Letters B ◽

10.1142/s0217984991001477 ◽

1991 ◽

Vol 05 (18) ◽

pp. 1203-1211 ◽

Cited By ~ 10

Author(s):

C. ATTANASIO ◽

L. MARITATO ◽

A. NIGRO ◽

S. PRISHEPA ◽

R. SCAFURO

Keyword(s):

Thin Films ◽

Electron Beam ◽

Single Crystal ◽

Critical Current ◽

Ex Situ ◽

X Ray Diffraction ◽

Reliable Technique ◽

X Ray ◽

Eds Analysis

BSCCO thin films with T c (R = 0) higher than 80 K have been routinely prepared using a simple and reliable technique in which we completely electron beam evaporated weighted amounts of bulk pellets. The films were grown on MgO single crystal (100) substrates and showed, after an ex-situ annealing at high temperatures (840–880° C) for several hours, a strong preferential orientation with the c-axis perpendicular to the plane of the substrate. The films were characterized by Θ − 2Θ X-ray diffraction and EDS analysis and by paraconductivity and critical current measurements.

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