The Influence of Mass-Transport-Deposit Surface Topography on the Evolution of Turbidite Architecture: The Sierra Contreras, Tres Pasos Formation (Cretaceous), Southern Chile

2009 ◽  
Vol 79 (5) ◽  
pp. 287-301 ◽  
Author(s):  
D. A. Armitage ◽  
B. W. Romans ◽  
J. A. Covault ◽  
S. A. Graham
Keyword(s):  
Mass Transport ◽  
Surface Topography ◽  
Southern Chile ◽  
Deposit Surface ◽  
Tres Pasos Formation

Influence of mass transport deposit (MTD) surface topography on deep-water deposition: an example from a predominantly fine-grained continental margin, New Zealand

2020 ◽  
Vol 500 (1) ◽  
pp. 147-171 ◽  
Author(s):  
Suzanne Bull ◽  
Greg H. Browne ◽  
Malcolm J. Arnot ◽  
Lorna J. Strachan
Keyword(s):  
New Zealand ◽  
Mass Transport ◽  
Surface Topography ◽  
Deep Water ◽  
Three Dimensional ◽  
Sediment Supply ◽  
Fine Grained ◽  
Basin Floor ◽  
Detachment Surface ◽  
Image Part

AbstractThree-dimensional (3D) seismic data reveal the complex interplay between the surface topography of a c. 4405 km3 mass transport deposit (MTD) and overlying sedimentary packages over approximately the last two million years. The data image part of the Pleistocene to recent shelf to slope to basin-floor Giant Foresets Formation in offshore western New Zealand. The MTD created substantive topographic relief and rugosity at the contemporaneous seabed, formed by the presence of a shallow basal detachment surface, and very large (up to 200 m high) intact slide blocks, respectively. Sediments were initially deflected away from high-relief MTD topography and confined in low areas. With time, the MTD was progressively healed by a series of broadly offset-stacked and increasingly unconfined packages comprised of many channel bodies and their distributary complexes. Positive topography formed by the channels and their distributary complexes further modified the seafloor and influenced the location of subsequent sediment deposition. Channel sinuosity increased over time, interpreted as the result of topographic healing and reduced seafloor gradients. The rate of sediment supply is likely to have been non-uniform, reflecting tectonic pulses across the region. Sediments were routed into deep water via slope-confined channels that originated shortly before emplacement of the MTD.

scholarly journals MoS2 and WS2 nanocone arrays: Impact of surface topography on the hydrogen evolution electrocatalytic activity and mass transport

2018 ◽  
Vol 11 ◽  
pp. 70-81 ◽  
Author(s):  
Daniel Escalera-López ◽  
Ross Griffin ◽  
Mark Isaacs ◽  
Karen Wilson ◽  
Richard E. Palmer ◽  
...  
Keyword(s):  
Mass Transport ◽  
Surface Topography ◽  
Hydrogen Evolution ◽  
Electrocatalytic Activity

Models of Thermodynamic Properties of Prominences

1979 ◽  
Vol 44 ◽  
pp. 349-355
Author(s):  
R.W. Milkey
Keyword(s):  
Thermodynamic Properties ◽  
Mass Transport ◽  
Emission Spectrum ◽  
Thermodynamic Parameters ◽  
Working Group ◽  
Physical Processes ◽  
Theoretical Concepts ◽  
Group 3 ◽  
Observational Techniques

The focus of discussion in Working Group 3 was on the Thermodynamic Properties as determined spectroscopically, including the observational techniques and the theoretical modeling of physical processes responsible for the emission spectrum. Recent advances in observational techniques and theoretical concepts make this discussion particularly timely. It is wise to remember that the determination of thermodynamic parameters is not an end in itself and that these are interesting chiefly for what they can tell us about the energetics and mass transport in prominences.

The Broad Applications of the Scanning Electron Microscope

1969 ◽  
Vol 27 ◽  
pp. 20-21
Author(s):  
C. T. Nightingale ◽  
S. E. Summers ◽  
T. P. Turnbull
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Light Microscopy ◽  
Surface Topography ◽  
Great Depth ◽  
Resolving Power ◽  
Depth Of Field ◽  
Pictorial Representations ◽  
Scanning Electron

The ease of operation of the scanning electron microscope has insured its wide application in medicine and industry. The micrographs are pictorial representations of surface topography obtained directly from the specimen. The need to replicate is eliminated. The great depth of field and the high resolving power provide far more information than light microscopy.

Effects of Ion Beam Milling on Surface Topography

1973 ◽  
Vol 31 ◽  
pp. 84-85
Author(s):  
P.G. Pawar ◽  
P. Duhamel ◽  
G.W. Monk
Keyword(s):  
Surface Topography ◽  
Ion Beam ◽  
Solid Material ◽  
Beam Current ◽  
Atomic Mass ◽  
Micro Milling ◽  
Ion Milling ◽  
Controlled Atmospheres ◽  
Milling Operations ◽  
Sufficient Energy

A beam of ions of mass greater than a few atomic mass units and with sufficient energy can remove atoms from the surface of a solid material at a useful rate. A system used to achieve this purpose under controlled atmospheres is called an ion miliing machine. An ion milling apparatus presently available as IMMI-III with a IMMIAC was used in this investigation. Unless otherwise stated, all the micro milling operations were done with Ar+ at 6kv using a beam current of 100 μA for each of the two guns, with a specimen tilt of 15° from the horizontal plane.It is fairly well established that ion bombardment of the surface of homogeneous materials can produce surface topography which resembles geological erosional features.

Low-Loss Images in a Stem/Tem Microscope

1976 ◽  
Vol 34 ◽  
pp. 496-497 ◽  
Author(s):  
David C. Joy ◽  
Dennis M. Maher
Keyword(s):  
High Resolution ◽  
Surface Topography ◽  
Beam Direction ◽  
Low Loss ◽  
Specimen Holder ◽  
Glancing Angle ◽  
High Resolution Images ◽  
Set Up ◽  
Conventional Manner ◽  
Objective Type

High-resolution images of the surface topography of solid specimens can be obtained using the low-loss technique of Wells. If the specimen is placed inside a lens of the condenser/objective type, then it has been shown that the lens itself can be used to collect and filter the low-loss electrons. Since the probeforming lenses in TEM instruments fitted with scanning attachments are of this type, low-loss imaging should be possible.High-resolution, low-loss images have been obtained in a JEOL JEM 100B fitted with a scanning attachment and a thermal, fieldemission gun. No modifications were made to the instrument, but a wedge-shaped, specimen holder was made to fit the side-entry, goniometer stage. Thus the specimen is oriented initially at a glancing angle of about 30° to the beam direction. The instrument is set up in the conventional manner for STEM operation with all the lenses, including the projector, excited.

A procedure for cross-sectioning materials for TEM analysis without ion milling

1990 ◽  
Vol 48 (4) ◽  
pp. 742-743
Author(s):  
J.P. Benedict ◽  
Ron Anderson ◽  
S. J. Klepeis
Keyword(s):  
Surface Topography ◽  
Milling Time ◽  
Specimen Preparation ◽  
Ion Milling ◽  
Cleaning Operation ◽  
Tem Analysis ◽  
Platinum Silicide ◽  
Surface Alteration ◽  
Polishing Damage ◽  
Tools And Methods

Traditional specimen preparation procedures for non-biological samples, especially cross section preparation procedures, involves subjecting the specimen to ion milling for times ranging from minutes to tens of hours. Long ion milling time produces surface alteration, atomic number and rough-surface topography artifacts, and high temperatures. The introduction of new tools and methods in this laboratory improved our ability to mechanically thin specimens to a point where ion milling time was reduced to one to ten minutes. Very short ion milling times meant that ion milling was more of a cleaning operation than a thinning operation. The preferential thinning and the surface topography that still existed in briefly ion milled samples made the study of interfaces between materials such as platinum silicide and silicon difficult. These two problems can be eliminated by completely eliminating the ion milling step and mechanically polishing the sample to TEM transparency with the procedure outlined in this communication. Previous successful efforts leading to mechanically thinned specimens have shown that problems center on tool tilt control, removal of polishing damage, and specimen cleanliness.

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