scholarly journals Комплексное исследование кластеров радиационных дефектов в GaAs-структурах после нейтронного воздействия

2021 ◽  
Vol 47 (5) ◽  
pp. 38
Author(s):  
С.В. Оболенский ◽  
Е.В. Волкова ◽  
А.Б. Логинов ◽  
Б.А. Логинов ◽  
Е.А. Тарасова ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Schottky Diodes ◽  
Experimental Studies ◽  
Radiation Defects ◽  
Electrical Parameters ◽  
Force Microscopy ◽  
Atomic Force ◽  
Capacitance Voltage ◽  
Before And After ◽  
Concentration Of Electrons

The results of experimental studies of the electrical parameters and surface morphology of GaAs structures of ring and circular Schottky diodes before and after irradiation with ~ 1 MeV neutrons are presented. Bulk radiation defects were revealed by atomic force microscopy (AFM). Based on the results of capacitance-voltage measurements, the concentration of electrons was determined and their mobility was estimated before and after irradiation. On the basis of the results obtained using a combination of these methods, a technique is proposed for determining the average sizes of the space charge regions of clusters of radiation defects.

Characterization of X-ray irradiated graphene oxide coatings using X-ray diffraction, X-ray photoelectron spectroscopy, and atomic force microscopy

2013 ◽  
Vol 28 (2) ◽  
pp. 68-71 ◽  
Author(s):  
Thomas N. Blanton ◽  
Debasis Majumdar
Keyword(s):  
Atomic Force Microscopy ◽  
Graphene Oxide ◽  
Photoelectron Spectroscopy ◽  
High Energy ◽  
X Ray Diffraction ◽  
Carbon Phase ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Before And After

In an effort to study an alternative approach to make graphene from graphene oxide (GO), exposure of GO to high-energy X-ray radiation has been performed. X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), and atomic force microscopy (AFM) have been used to characterize GO before and after irradiation. Results indicate that GO exposed to high-energy radiation is converted to an amorphous carbon phase that is conductive.

AFM Study of Untreated and Treated Fibers of Mongolian Goat Cashmere

2009 ◽  
Vol 610-613 ◽  
pp. 175-178 ◽  
Author(s):  
Namsrai Javkhlantugs ◽  
Enkhbaatar Ankhbayar ◽  
Khishigjargal Tegshjargal ◽  
Damdin Enkhjargal ◽  
Chimed Ganzorig
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Fine Structure ◽  
Ambient Conditions ◽  
Bleaching Process ◽  
Surface Change ◽  
Force Microscopy ◽  
Atomic Force ◽  
Before And After ◽  
The Difference

The morphological surface change of untreated and treated fibers of the Mongolian goat cashmere was investigated by atomic force microscopy (AFM) at ambient conditions. The cuticle scale heights of the Mongolian goat cashmere fibers were measured by the AFM for the fibers before and after treatment. The experimental results showed that the difference between the fine structure of the cuticle and surface roughness of untreated and treated fibers. We found that the surface morphological change of the cashmere fibers was strongly degraded after the bleaching process.

scholarly journals Atomic Force Microscopy Study of the Effect of Antimicrobial Peptides on the Cell Envelope of Escherichia coli

2005 ◽  
Vol 49 (10) ◽  
pp. 4085-4092 ◽  
Author(s):  
M. Meincken ◽  
D. L. Holroyd ◽  
M. Rautenbach
Keyword(s):  
Escherichia Coli ◽  
Atomic Force Microscopy ◽  
Morphological Changes ◽  
Cell Envelope ◽  
Microscopy Study ◽  
Target Cells ◽  
Force Microscopy ◽  
E Coli ◽  
Atomic Force ◽  
Before And After

ABSTRACT The influences of the antibacterial magainin 2 and PGLa from the African clawed frog (Xenopus laevis) and the hemolytic bee venom melittin on Escherichia coli as the target cell were studied by atomic force microscopy (AFM). Nanometer-scale images of the effects of the peptides on this gram-negative bacterium's cell envelope were obtained in situ without the use of fixing agents. These high-resolution AFM images of the surviving and intact target cells before and after peptide treatment showed distinct changes in cell envelope morphology as a consequence of peptide action. Although all three peptides are lytic to E. coli, it is clear from this AFM study that each peptide causes distinct morphological changes in the outer membrane and in some cases the inner membrane, probably as a consequence of different mechanisms of action.

Surface Morphology of Nanoscale TiSi2 Epitaxial Islands on Si(00l)

1996 ◽  
Vol 448 ◽  
Author(s):  
Woochul Yang ◽  
F.J. Jedema ◽  
H. Ade ◽  
R.J Nemanich
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Strain Field ◽  
Island Size ◽  
Island Formation ◽  
Force Microscopy ◽  
Atomic Force ◽  
Before And After ◽  
Size Uniformity ◽  
Rough Substrate

AbstractThe morphologies of nanoscale epitaxial islands of TISi2 are studied. The islands are prepared by deposition of ultrathin Ti (3-20Å) on both smooth and roughened.Si(001) substrates. The island formation is initiated by annealing to 800-1000°C. The roughened substrates are prepared by etching with atomic H produced in a plasma. The morphologies of the substrate before and after island formation are examined by atomic force microscopy (AFM). In particular, the influence of surface-roughness on both the formation of islands and the size distribution of islands is investigated. On a rough substrate islands with a lateral dimension of ~350Å and a vertical dimension of ~25Å were observed with size uniformity of ~20%. Also it was observed that the roughness of the surface reduced the island size and affected the island distribution. The results are discussed in terms of surface energy and the strain field around the islands.

Characterization of H-Plasma Treated ZnO Crystals by Positron Annihilation and Atomic Force Microscopy

2012 ◽  
Vol 331 ◽  
pp. 113-125 ◽  
Author(s):  
Jakub Čížek ◽  
I. Procházka ◽  
J. Kuriplach ◽  
W. Anwand ◽  
Gerhard Brauer ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Positron Annihilation ◽  
Crystal Surface ◽  
Photon Momentum ◽  
Force Microscopy ◽  
Atomic Force ◽  
Before And After ◽  
Positron Lifetime Spectroscopy ◽  
Complementary Techniques

Nominally undoped, hydrothermally grown ZnO single crystals have been investigated before and after exposure to remote H-plasma. Defect characterization has been made by two complementary techniques of positron annihilation: positron lifetime spectroscopy and coincidence Doppler broadening. The high-momentum parts of the annihilation photon momentum distribution have been calculated from first principles in order to assist in defect identification. The positron annihilation results are supplemented by Atomic Force Microscopy for characterization of the crystal surface. It was found that virgin ZnO crystal contains Zn-vacancies associated with hydrogen. H-plasma treatment causes a significant reduction in concentration of these complexes. Physical mechanism of this effect is discussed in the paper.

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