scholarly journals Formation and properties of copper chalcogenides thin films on polymers formed using sodium telluropentathionate

2013 ◽  
Vol 11 (7) ◽  
pp. 1163-1171
Author(s):  
Judita Šukytė ◽  
Remigijus Ivanauskas
Keyword(s):  
Thin Films ◽  
Optical Absorption ◽  
Room Temperature ◽  
Surface Characteristics ◽  
Xrd Analysis ◽  
Structural Features ◽  
Optical Quality ◽  
High Optical Quality ◽  
Copper Chalcogenides ◽  
Crystallite Sizes

AbstractThe preparative conditions were optimized to get chalcogens layers on the polymer — polyamide PA surface by sorption at room temperature using sodium telluropentathionate, Na2TeS4O6. Further interaction of chalcogenized dielectric with copper’s (I/II) salt solution leads to the formation of mixed CuxSy-CuxTey layers. Optical, electrical and surface characteristics of the layers are highly controlled by the deposition parameters. The stoichiometry of these layers was established by UV-Visible and AA spectrometry. Optical absorption (transmittance) experiments show the samples are of high optical quality. The band gaps of thin films were obtained from their optical absorption spectra, which were found in the range of 1.44–2.97 eV. XRD was used in combination with AFM to characterize chalcogenides layers’ structural features. XRD analysis confirmed the formation of mixed copper chalcogenides’ layers in the surface of PA with binary phases such as Cu2Te, Cu3.18Te2, copper telluride, Cu2.72Te2, vulcanite, CuTe, anilite, Cu7S4 and copper sulfide, Cu1.8S. The crystallite sizes of thin films calculated by the Scherer formula were found to be in the range of 3.07–13.53 nm for CuxSy crystallites and 4.06–20.79 nm for CuxTey crystallites. At room temperature an electrical resistance of CuxSy-CuxTey layers varies from 3.0×103 kΩ□−1 to 1.0 kΩ□−1.

scholarly journals CHARACTERISTICS OF LITHIUM LANTHANUM TITANATE THIN FILMS MADE BY ELECTRON BEAM EVAPORATION FROM NANOSTRUCTURED La0.67-xLi 3xTiO3 TARGET

2017 ◽  
Vol 25 (2) ◽  
pp. 243-250
Author(s):  
Nguyen Nang Dinh ◽  
Le Dinh Trong ◽  
Pham Duy Long
Keyword(s):  
Thin Films ◽  
Electron Beam ◽  
Ionic Conductivity ◽  
Room Temperature ◽  
Xrd Analysis ◽  
Electron Beam Evaporation ◽  
Electrochromic Devices ◽  
Lanthanum Titanate ◽  
Average Size ◽  
Beam Deposition

Bulk nanostructured perovskites of La0.67-xLi3xTiO3 (LLTO) were prepared by using thermally ball-grinding from compounds of La2O3, Li2CO3 and TiO2. From XRD analysis, it was found that LTTO materials were crystallized with nano-size grains of an average size of 30 nm. The bulk ionic conductivity was found strongly dependent on the Li+ composition, the samples with x = 0.11 (corresponding to a La0.56Li0.33TiO3 compound) have the best ionic conductivity, which is ca. 3.2 x 10-3 S/cm at room temperature. The LLTO amorphous films were made by electron beam deposition. At room temperature the smooth films have ionic conductivity of 3.5 x 10-5  S/cm and transmittance of 80%. The optical bandgap of the films was found to be of 2.3 eV. The results have shown that the perovskite La0.56Li0.33TiO3  thin films can be used for a transparent solid electrolyte in ionic battery and in all-solid-state electrochromic devices, in particular.    

Temperature dependence of the band gap of high optical quality CdS:Dy thin films based on exciton spectra

2018 ◽  
Vol 5 (12) ◽  
pp. 125902 ◽  
Author(s):  
Yu P Gnatenko ◽  
P M Bukivskij ◽  
M S Furier ◽  
A P Bukivskii ◽  
A S Opanasyuk
Keyword(s):  
Thin Films ◽  
Temperature Dependence ◽  
Band Gap ◽  
Optical Quality ◽  
High Optical Quality

scholarly journals Femtosecond Laser Fabrication of Engineered Functional Surfaces based on Biodegradable Polymer and Biopolymer/Ceramic Composite Thin Films

Polymers ◽  
2019 ◽  
Vol 11 (2) ◽  
pp. 378 ◽  
Author(s):  
Albena Daskalova ◽  
Irina Bliznakova ◽  
Liliya Angelova ◽  
Anton Trifonov ◽  
Heidi Declercq ◽  
...  
Keyword(s):  
Thin Films ◽  
Surface Roughness ◽  
Femtosecond Laser ◽  
Surface Functionalization ◽  
Biodegradable Polymer ◽  
Photoelectron Spectroscopy ◽  
Laser Energy ◽  
Surface Characteristics ◽  
Laser Pulses ◽  
Xrd Analysis

Surface functionalization introduced by precisely-defined surface structures depended on the surface texture and quality. Laser treatment is an advanced, non-contact technique for improving the biomaterials surface characteristics. In this study, femtosecond laser modification was applied to fabricate diverse structures on biodegradable polymer thin films and their ceramic blends. The influences of key laser processing parameters like laser energy and a number of applied laser pulses (N) over laser-treated surfaces were investigated. The modification of surface roughness was determined by atomic force microscopy (AFM). The surface roughness (Rrms) increased from approximately 0.5 to nearly 3 µm. The roughness changed with increasing laser energy and a number of applied laser pulses (N). The induced morphologies with different laser parameters were compared via Scanning electron microscopy (SEM) and confocal microscopy analysis. The chemical composition of exposed surfaces was examined by FTIR, X-ray photoelectron spectroscopy (XPS), and XRD analysis. This work illustrates the capacity of the laser microstructuring method for surface functionalization with possible applications in improvement of cellular attachment and orientation. Cells exhibited an extended shape along laser-modified surface zones compared to non-structured areas and demonstrated parallel alignment to the created structures. We examined laser-material interaction, microstructural outgrowth, and surface-treatment effect. By comparing the experimental results, it can be summarized that considerable processing quality can be obtained with femtosecond laser structuring.

Room-temperature near IR fluorescence of high optical quality KTP

2007 ◽  
Author(s):  
S. M. Hegde ◽  
K. L. Schepler ◽  
R. D. Peterson ◽  
D. E. Zelmon
Keyword(s):  
Room Temperature ◽  
Optical Quality ◽  
High Optical Quality ◽  
Near Ir

In2O3 Thin Films Prepared on TiAlN Substrates Using a Triethylindium and Oxygen Mixture

2007 ◽  
Vol 124-126 ◽  
pp. 1597-1600
Author(s):  
Hyoun Woo Kim ◽  
Sun Keun Hwang ◽  
Won Seung Cho ◽  
Tae Gyung Ko ◽  
Seung Yong Choi ◽  
...  
Keyword(s):  
Thin Films ◽  
Substrate Temperature ◽  
Room Temperature ◽  
Light Emission ◽  
Xrd Analysis ◽  
Oxygen Mixture ◽  
Photoluminescence Spectra ◽  
Sem Images ◽  
Room Temperature Photoluminescence ◽  
Visible Light Emission

This paper reports the fabrication of indium oxide (In2O3) films using a triethylindium and oxygen mixture. The deposition has been carried out on TiAlN substrates (200-350°C). We have established the correlation between the substrate temperature and the structural properties. The films deposited at 300-350°C were polycrystalline, whereas those deposited at 200°C was close to amorphous. XRD analysis and SEM images indicated that the films grown at 350°C had grained structures with the (222) preferred orientation. The room-temperature photoluminescence spectra of the In2O3 films exhibited a visible light emission.

Supersonic Cluster Beam Synthesis of Nanophase Materials

1999 ◽  
Vol 581 ◽  
Author(s):  
P. Milanil ◽  
S. Iannotta ◽  
F. Biasioli ◽  
P. Piseri ◽  
E. Barborini
Keyword(s):  
Thin Films ◽  
Room Temperature ◽  
Tini Alloy ◽  
Cluster Beam ◽  
Crystallite Sizes ◽  
Nanophase Materials ◽  
Cluster Beams ◽  
Cluster Beam Deposition ◽  
Beam Deposition

ABSTRACTWe present the characterization of supersonic cluster beam deposition as a viable technique for the synthesis of nanostructured materials. Stable and intense cluster beams can be obtained with a pulsed microplasma cluster source. This technique has been applied to produce TiNi nanostructured thin films on various substrates at room temperature. The morphology and the structure of the film are strongly influenced by the precursor clusters. Films characterized by crystallite sizes of a few tens of nanometers can be grown without recrystallization by thermal annealing. The stoichiometry of the original TiNi alloy is maintained.

Photoluminescence of high optical quality CdS:Dy thin films deposited by close-spaced vacuum sublimation

2018 ◽  
Vol 197 ◽  
pp. 343-348 ◽  
Author(s):  
Yu.S. Yeromenko ◽  
Yu.P. Gnatenko ◽  
A.S. Opanasyuk ◽  
D.I. Kurbatov ◽  
P.M. Bukivskij ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Quality ◽  
Vacuum Sublimation ◽  
High Optical Quality

Growth of InAs/GaAs quantum dots on germanium-on-insulator-on-silicon (GeOI) substrate with high optical quality at room temperature in the 1.3 μm band

2010 ◽  
Vol 96 (4) ◽  
pp. 043101 ◽  
Author(s):  
Damien Bordel ◽  
Denis Guimard ◽  
Mohan Rajesh ◽  
Masao Nishioka ◽  
Emmanuel Augendre ◽  
...  
Keyword(s):  
Quantum Dots ◽  
Room Temperature ◽  
Optical Quality ◽  
High Optical Quality

Development of a novel high optical quality ZnO thin films by PLD for III–V opto-electronic devices

2006 ◽  
Vol 6 (1) ◽  
pp. 103-108 ◽  
Author(s):  
K. Ramamoorthy ◽  
C. Sanjeeviraja ◽  
M. Jayachandran ◽  
K. Sankaranarayanan ◽  
Pankaj Misra ◽  
...  
Keyword(s):  
Thin Films ◽  
Electronic Devices ◽  
Optical Quality ◽  
Zno Thin Films ◽  
High Optical Quality

Electrical Resistivity Improvement by Precipitation and Strain in Al-Cu Thin Films

2010 ◽  
Vol 305-306 ◽  
pp. 33-37 ◽  
Author(s):  
S. Lallouche ◽  
M.Y. Debili
Keyword(s):  
Thin Films ◽  
Copper Content ◽  
Room Temperature ◽  
Structural Features ◽  
X Ray Diffraction ◽  
X Ray ◽  
Glass Substrates ◽  
Transmission Electron ◽  
Hall Method

This work deals with Al-Cu thin films, deposited onto glass substrates by RF (13.56MHz) magnetron sputtering, and annealed at 773K. The film thickness was approximately the same 3-4µm. They are characterized with respect to microstructure, grain size, microstrain, dislocation density and resistivity versus copper content. Al (Cu) deposits containing 1.8, 7.21, 86.17 and 92.5at%Cu have been investigated. The use of X-ray diffraction analysis and transmission electron microscopy lead to the characterization of different structural features of films deposited at room temperature (< 400K) and after annealing (773K). The resistivity of the films was measured using the four-point probe method. The microstrain profile obtained from XRD thanks to the Williamson-Hall method shows an increase with increasing copper content.

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