scholarly journals Effect of two polishing systems on color and surface roughness of feldspathic porcelain following orthodontic bracket debonding and composite resin removal

2019 ◽  
Vol 9 ◽  
pp. 105-110
Author(s):  
Nazila Ameli ◽  
Reihane Talaei ◽  
Saeedeh Saeedi ◽  
Raheb Ghorbani ◽  
Bahareh Ali Askari
Keyword(s):  
Surface Roughness ◽  
Color Change ◽  
Orthodontic Bracket ◽  
Force Microscopy ◽  
Color Parameters ◽  
Atomic Force ◽  
Polishing Procedures ◽  
Feldspathic Porcelain ◽  
Group 2 ◽  
Level Of Significance

Objectives Orthodontic bracket removal from a porcelain crown can roughen the surface and lead to plaque accumulation, discoloration, and esthetic problems. Porcelain polishing after debonding is one strategy to decrease such consequences. This study aimed to compare the efficacy of two polishing systems (Sof-Lex discs and Meisinger polishing system) for correction of surface roughness and discoloration of porcelain after orthodontic bracket debonding. Materials and Methods Twenty porcelain blocks were evaluated in two groups of 10. First, the baseline surface roughness and color parameters of the samples were measured using atomic force microscopy and spectrophotometry, respectively. After bracket bonding, a fine cutter was used for bracket debonding, and resin remnants were removed by a tungsten carbide bur and low-speed handpiece. Samples were then polished using Sof-Lex discs (group 1) and Meisinger porcelain polishing kit (group 2). Surface roughness and color parameters were measured again. Data were analyzed using SPSS 18 through the Shapiro–Wilk test, Student’s t-test, and paired t-test at 5% level of significance. Results Porcelain color change (ΔE) was significantly greater in the Meisinger system than Sof-Lex (P < 0.001). The Rq, Ra, and Rt surface roughness parameters significantly increased in both the groups after the intervention compared to baseline (P < 0.05), but the two groups were not significantly different in this respect after the polishing procedures (P > 0.05). Conclusion The porcelain color after polishing with Sof-Lex discs was closer to the baseline. Furthermore, the two systems were not significantly different regarding surface roughness. However, Sof-Lex discs may be recommended due to lower cost.

scholarly journals Comparative effect of three polishing systems on porcelain surface roughness after orthodontic bracket debonding and composite resin removal: An atomic force microscopy

2019 ◽  
Vol 9 ◽  
pp. 223-229
Author(s):  
Faeze Qabel ◽  
Riehane Talaei ◽  
Saeedeh Saeedi ◽  
Raheb Ghorbani ◽  
Nazila Ameli
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Composite Resin ◽  
Cost Effective ◽  
Orthodontic Bracket ◽  
Force Microscopy ◽  
Atomic Force ◽  
The Mean ◽  
Level Of Significance ◽  
One Way Anova

Purpose: Porcelain polishing after orthodontic bracket debonding and resin removal is imperative to eliminate surface roughness and minimize the risk of plaque accumulation, periodontal disease, and porcelain discoloration. This study aimed to assess the effect of three polishing systems on porcelain surface roughness after orthodontic bracket debonding. Materials and Methods: Thirty porcelain blocks were divided into three groups. Surface roughness of the samples was first measured using atomic force microscopy (AFM) and recorded as baseline. Orthodontic brackets were bonded to blocks by composite resin. After bracket debonding, resin remnants were removed by tungsten carbide bur. The blocks were then polished with Sof-Lex discs, Meisinger, and Jota porcelain polishing kit. Surface roughness was measured again using AFM. The Shapiro–Wilk test, one-way ANOVA, and Tukey’s post hoc test were used for data analysis through SPSS version 18.0. Level of significance was set at 5%. Results: The mean change in surface roughness after polishing with Jota kit (56.6 nm) was significantly greater than that compared to Sof-Lex discs (10.7 nm) (P = 0.003) and Meisinger kit (26.6 nm) (P = 0.024). The mean change in surface roughness was not significantly different between Sof-Lex and Meisinger groups. Surface roughness significantly increased in all three groups (P < 0.05). Conclusion: Meisinger polishing kit and Sof-Lex discs were not significantly different in terms of the resultant surface roughness. Thus, the conventional use of Sof-Lex discs seems to be more cost-effective due to their lower cost.

scholarly journals Varying the Polishing Protocol Influences the Color Stability and Surface Roughness of Bulk-Fill Resin-Based Composites

2020 ◽  
Vol 12 (1) ◽  
pp. 1
Author(s):  
Filipa Freitas ◽  
Teresa Pinheiro de Melo ◽  
António HS Delgado ◽  
Paulo Monteiro ◽  
João Rua ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Surface Properties ◽  
Color Change ◽  
Resin Composite ◽  
Color Stability ◽  
Control Surface ◽  
Significance Level ◽  
Color Changes ◽  
Atomic Force ◽  
Polishing Procedures

Surface properties of composites such as roughness and color impact periodontal health and aesthetic outcomes. Novel bulk-fill composites with improved functionality are being introduced and, in light of the existing variety of finishing/polishing procedures, research of their surface properties is warranted. Sixty discs were prepared from bulk-fill composites (Filtek™ Bulk Fill Posterior Restorative and Fill-Up™) and incremental-fill Filtek™ Z250. They were further divided according to different polishing procedures (n = 5): three multi-step polishing procedures or finishing with a bur (control). Surface roughness (Ra) was measured using an atomic force microscope (The AFM Workshop TT-AFM). A spectrophotometer (Spectroshade Micro Optic) was used to determine color stability, after exposure to a coffee solution. Data were analyzed using two-way MANOVA (significance level of 5%). Resin composite type, polishing procedure, and their interaction had a statistically significant effect on surface roughness (p < 0.001) and color change (p < 0.001). Fill-Up™ exhibited the highest surface roughness and greatest color change. Differences in color change were statistically significant (p < 0.001). Filtek™ Bulk Fill registered the lowest surface roughness and color change, after the three-step polishing procedure. Both parameters were significantly correlated (ρ = 0.754, p < 0.001) and found to be material dependent and polishing-procedure dependent. Higher surface roughness relates to greater color changes.

Surface roughness measurements of vanadium-contaminated fluidized cracking catalysts by atomic force microscopy

1996 ◽  
Vol 54 ◽  
pp. 866-867
Author(s):  
H. Kinney ◽  
M.L. Occelli ◽  
S.A.C. Gould
Keyword(s):  
Surface Roughness ◽  
Zeolite Y ◽  
Atomic Level ◽  
Microporous Structure ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Before And After ◽  
Roughness Measurements ◽  
Cracking Catalysts

For this study we have used a contact mode atomic force microscope (AFM) to study to topography of fluidized cracking catalysts (FCC), before and after contamination with 5% vanadium. We selected the AFM because of its ability to well characterize the surface roughness of materials down to the atomic level. It is believed that the cracking in the FCCs occurs mainly on the catalysts top 10-15 μm suggesting that the surface corrugation could play a key role in the FCCs microactivity properties. To test this hypothesis, we chose vanadium as a contaminate because this metal is capable of irreversibly destroying the FCC crystallinity as well as it microporous structure. In addition, we wanted to examine the extent to which steaming affects the vanadium contaminated FCC. Using the AFM, we measured the surface roughness of FCCs, before and after contamination and after steaming.We obtained our FCC (GRZ-1) from Davison. The FCC is generated so that it contains and estimated 35% rare earth exchaged zeolite Y, 50% kaolin and 15% binder.

Brittle Behaviour in Aspirin Crystals: Evidence of Spalling Fracture

2020 ◽  
Author(s):  
Benjamin P. A. Gabriele ◽  
Craig J. Williams ◽  
Douglas Stauffer ◽  
Brian Derby ◽  
Aurora J. Cruz-Cabeza
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Single Crystals ◽  
Spalling Fracture ◽  
Force Microscopy ◽  
Atomic Force ◽  
Afm Imaging

<div> <div> <div> <p>Single crystals of aspirin form I were cleaved and indented on their dominant face. Upon inspection, it was possible to observe strongly anisotropic shallow lateral cracks due to the extreme low surface roughness after cleavage. Atomic Force Microscopy (AFM) imaging showed spalling fractures nucleating from the indent corners, forming terraces with a height of one or two interplanar spacings d100. The formation of such spalling fractures in aspirin was rationalised using basic calculations of attachment energies, showing how (100) layers are poorly bonded when compared to their relatively higher intralayer bonding. An attempt at explaining the preferential propagation of these fractures along the [010] direction is discussed. </p> </div> </div> </div>

Brittle Behaviour in Aspirin Crystals: Evidence of Spalling Fracture

2020 ◽  
Author(s):  
Benjamin P. A. Gabriele ◽  
Craig J. Williams ◽  
Douglas Stauffer ◽  
Brian Derby ◽  
Aurora J. Cruz-Cabeza
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Single Crystals ◽  
Spalling Fracture ◽  
Force Microscopy ◽  
Atomic Force ◽  
Afm Imaging

<div> <div> <div> <p>Single crystals of aspirin form I were cleaved and indented on their dominant face. Upon inspection, it was possible to observe strongly anisotropic shallow lateral cracks due to the extreme low surface roughness after cleavage. Atomic Force Microscopy (AFM) imaging showed spalling fractures nucleating from the indent corners, forming terraces with a height of one or two interplanar spacings d100. The formation of such spalling fractures in aspirin was rationalised using basic calculations of attachment energies, showing how (100) layers are poorly bonded when compared to their relatively higher intralayer bonding. An attempt at explaining the preferential propagation of these fractures along the [010] direction is discussed. </p> </div> </div> </div>

scholarly journals Assessing the Functional Properties of TiZr Nanotubular Structures for Biomedical Applications, through Nano-Scratch Tests and Adhesion Force Maps

Molecules ◽  
2021 ◽  
Vol 26 (4) ◽  
pp. 900
Author(s):  
Maria Vardaki ◽  
Aida Pantazi ◽  
Ioana Demetrescu ◽  
Marius Enachescu
Keyword(s):  
Surface Roughness ◽  
Functional Properties ◽  
Bacterial Adhesion ◽  
Biomedical Applications ◽  
Adhesion Force ◽  
Roughness Parameters ◽  
Force Microscopy ◽  
Atomic Force ◽  
The Mean ◽  
Scratch Tests

In this work we present the results of a functional properties assessment via Atomic Force Microscopy (AFM)-based surface morphology, surface roughness, nano-scratch tests and adhesion force maps of TiZr-based nanotubular structures. The nanostructures have been electrochemically prepared in a glycerin + 15 vol.% H2O + 0.2 M NH4F electrolyte. The AFM topography images confirmed the successful preparation of the nanotubular coatings. The Root Mean Square (RMS) and average (Ra) roughness parameters increased after anodizing, while the mean adhesion force value decreased. The prepared nanocoatings exhibited a smaller mean scratch hardness value compared to the un-coated TiZr. However, the mean hardness (H) values of the coatings highlight their potential in having reliable mechanical resistances, which along with the significant increase of the surface roughness parameters, which could help in improving the osseointegration, and also with the important decrease of the mean adhesion force, which could lead to a reduction in bacterial adhesion, are providing the nanostructures with a great potential to be used as a better alternative for Ti implants in dentistry.

scholarly journals Atomic force microscopy comparative analysis of the surface roughness of two posterior chamber phakic intraocular lens models: ICL versus IPCL

2021 ◽  
Vol 21 (1) ◽  
Author(s):  
Juan Gros-Otero ◽  
Samira Ketabi ◽  
Rafael Cañones-Zafra ◽  
Montserrat Garcia-Gonzalez ◽  
Cesar Villa-Collar ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Intraocular Lenses ◽  
Posterior Chamber ◽  
Anterior Surface ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Phakic Intraocular Lenses ◽  
Roughness Measurements

Abstract Background To compare the anterior surface roughness of two commercially available posterior chamber phakic intraocular lenses (IOLs) using atomic force microscopy (AFM). Methods Four phakic IOLs were used for this prospective, experimental study: two Visian ICL EVO+ V5 lenses and two iPCL 2.0 lenses. All of them were brand new, were not previously implanted in humans, were monofocal and had a dioptric power of − 12 diopters (D). The anterior surface roughness was assessed using a JPK NanoWizard II® atomic force microscope in contact mode immersed in liquid. Olympus OMCL-RC800PSA commercial silicon nitride cantilever tips were used. Anterior surface roughness measurements were made in 7 areas of 10 × 10 μm at 512 × 512 point resolution. The roughness was measured using the root-mean-square (RMS) value within the given regions. Results The mean of all anterior surface roughness measurements was 6.09 ± 1.33 nm (nm) in the Visian ICL EVO+ V5 and 3.49 ± 0.41 nm in the iPCL 2.0 (p = 0.001). Conclusion In the current study, we found a statistically significant smoother anterior surface in the iPCL 2.0 phakic intraocular lenses compared with the VISIAN ICL EVO+ V5 lenses when studied with atomic force microscopy.

Effect of Water Temperature, pH Value, and Film Thickness on the Wettability Behaviour of Copper Surfaces Coated with Copper Using EB-PVD Technique

2019 ◽  
Vol 60 ◽  
pp. 124-141 ◽  
Author(s):  
Naser Ali ◽  
Joao Amaral Teixeira ◽  
Abdulmajid Addali
Keyword(s):  
Surface Roughness ◽  
Contact Angle ◽  
Film Thickness ◽  
Water Temperature ◽  
Ph Value ◽  
Surface Wettability ◽  
Copper Surfaces ◽  
Force Microscopy ◽  
Atomic Force ◽  
Static Contact

This research investigates the effect of surface roughness, water temperature, and pH value on the wettability behaviour of copper surfaces. An electron beam physical vapour deposition technique was used to fabricate 25, 50, and 75 nm thin films of copper on the surface of copper substrates. Surface topographical analysis, of the uncoated and coated samples, was performed using an atomic force microscopy device to observe the changes in surface microstructure. A goniometer device was then employed to examine the surface wettability of the samples by obtaining the static contact angle between the liquid and the attached surface using the sessile drops technique. Waters of pH 4, 7, and 9 were employed as the contact angle testing fluids at a set of fixed temperatures that ranged from 20°C to 60°C. It was found that increasing the deposited film thickness reduces the surface roughness of the as-prepared copper surfaces and thus causing the surface wettability to diverge from its initial hydrophobic nature towards the hydrophilic behaviour region. A similar divergence behaviour was seen with the rise in temperature of water of pH 4, and 9. In contrast, the water of pH 7, when tested on the uncoated surface, ceased to reach a contact angle below 90o. It is believed that the observed changes in surface wettability behaviour is directly linked to the liquid temperature, pH value, surface roughness, along with the Hofmeister effect between the water and the surface in contact.

Effect of Surface Chemistry on Ruthenium Wet Etching

2021 ◽  
Vol 314 ◽  
pp. 302-306
Author(s):  
Quoc Toan Le ◽  
E. Kesters ◽  
M. Doms ◽  
Efrain Altamirano Sánchez
Keyword(s):  
Surface Roughness ◽  
Photoelectron Spectroscopy ◽  
Etching Rate ◽  
Wet Etching ◽  
X Ray ◽  
Force Microscopy ◽  
Metal Free ◽  
Atomic Force ◽  
Different Types ◽  
Effect Of Surface

Different types of ALD Ru films, including as-deposited, annealed Ru, without and with a subsequent CMP step, were used for wet etching study. With respect to the as-deposited Ru, the etching rate of the annealed Ru film in metal-free chemical mixtures (pH = 7-9) was found to decrease substantially. X-ray photoelectron spectroscopy characterization indicated that this behavior could be explained by the presence of the formation of RuOx (x = 2,3) caused by the anneal. A short CMP step applied to the annealed Ru wafer removed the surface RuOx, at least partially, resulting in a significant increase of the etching rate. The change in surface roughness was quantified using atomic force microscopy.

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