Laser Scanning Localization Technique for Fast Analysis of High Speed DRAM Devices

2008 ◽  
Author(s):  
Martin Versen ◽  
Achim Schramm ◽  
Jan Schnepp ◽  
Sascha Hoch ◽  
Tapan Vikas ◽  
...  
Keyword(s):  
Integrated Circuit ◽  
High Speed ◽  
Laser Scanning ◽  
Random Access ◽  
Laser Scanning Microscopy ◽  
New Method ◽  
Temperature Influence ◽  
Fast Analysis ◽  
Knowledge Based ◽  
Defect Localization

Abstract Soft defect localization (SDL) is a method of laser scanning microscopy that utilizes the changing pass/fail behavior of an integrated circuit under test and temperature influence. Historically the pass and fail states are evaluated by a tester that leads to long and impracticable measurement times for dynamic random access memories (DRAM). The new method using a high speed comparison device allows SDL image acquisition times of a few minutes and a localization of functional DRAM fails that are caused by defects in the DRAM periphery that has not been possible before. This new method speeds up significantly the turn-around time in the failure analysis (FA) process compared to knowledge based FA.

Low Temperature Fault Isolation Using Soft Defect Localization

2012 ◽  
Author(s):  
Kristopher D. Staller
Keyword(s):  
Low Temperatures ◽  
Laser Scanning ◽  
Low Cost ◽  
Fault Isolation ◽  
Laser Scanning Microscopy ◽  
Cold Temperature ◽  
Multiple Point ◽  
Defect Localization ◽  
Low Levels

Abstract Cold temperature failures are often difficult to resolve, especially those at extreme low levels (< -40°C). Momentary application of chill spray can confirm the failure mode, but is impractical during photoemission microscopy (PEM), laser scanning microscopy (LSM), and multiple point microprobing. This paper will examine relatively low-cost cold temperature systems that can hold samples at steady state extreme low temperatures and describe a case study where a cold temperature stage was combined with LSM soft defect localization (SDL) to rapidly identify the cause of a complex cold temperature failure mechanism.

scholarly journals High-speed volumetric two-photon fluorescence imaging of neurovascular dynamics

2020 ◽  
Vol 11 (1) ◽  
Author(s):  
Jiang Lan Fan ◽  
Jose A. Rivera ◽  
Wei Sun ◽  
John Peterson ◽  
Henry Haeberle ◽  
...  
Keyword(s):  
Blood Flow ◽  
High Speed ◽  
Laser Scanning ◽  
Three Dimensional ◽  
Laser Scanning Microscopy ◽  
Fluorescence Signal ◽  
Imaging Method ◽  
Spatiotemporal Resolution ◽  
Two Photon

AbstractUnderstanding the structure and function of vasculature in the brain requires us to monitor distributed hemodynamics at high spatial and temporal resolution in three-dimensional (3D) volumes in vivo. Currently, a volumetric vasculature imaging method with sub-capillary spatial resolution and blood flow-resolving speed is lacking. Here, using two-photon laser scanning microscopy (TPLSM) with an axially extended Bessel focus, we capture volumetric hemodynamics in the awake mouse brain at a spatiotemporal resolution sufficient for measuring capillary size and blood flow. With Bessel TPLSM, the fluorescence signal of a vessel becomes proportional to its size, which enables convenient intensity-based analysis of vessel dilation and constriction dynamics in large volumes. We observe entrainment of vasodilation and vasoconstriction with pupil diameter and measure 3D blood flow at 99 volumes/second. Demonstrating high-throughput monitoring of hemodynamics in the awake brain, we expect Bessel TPLSM to make broad impacts on neurovasculature research.

Asymmetric Data-Frequency Mapping and Multi Trigger-Probing for Improved Scan Debug

2018 ◽  
Author(s):  
Swaminathan ◽  
Anuradha ◽  
Abuayob ◽  
Eli ◽  
Konstantine Gitelmkher ◽  
...  
Keyword(s):  
Integrated Circuit ◽  
Laser Scanning ◽  
Continuous Wave ◽  
Signal To Noise Ratio ◽  
Fault Isolation ◽  
Laser Scanning Microscopy ◽  
Mapping Technique ◽  
Acquisition Time ◽  
Scan Chain ◽  
Continuous Wave Signal

Abstract Integrated-circuit device dimensions continue to shrink, enabling higher density of devices and smaller node size. A number of strategies to improve the resolution of failure analysis and fault isolation tools exist, but some of these techniques are reaching fundamental limits so that engineers are also challenged to innovative methods to increase the useful life of existing toolsets. Laser Scanning Microscopy including Laser Voltage Probing and frequency mapping struggle to maintain resolution commensurate with shrinking feature size. Here we present two methods to improve efficiency and capability of this toolset using existing optical hardware and configuration. The first method applies a frequency mapping technique using scan chain data patterns that allow for data manipulation. This enables an effective resolution increase through deconvolution of data collected in a sequence of scans completed on varied device states. A second method using multiple triggers per loop to evaluate a deterministic continuous wave signal is shown to reduce probe acquisition time, improve job throughput time, and enable, better signal-to-noise ratio for common scan chain debug workflow.

Suspension Mixing and Segregation in 1D, 2D, and 3D Flows

2007 ◽  
Author(s):  
James F. Gilchrist ◽  
Changbao Gao
Keyword(s):  
High Speed ◽  
Laser Scanning ◽  
Laser Scanning Microscopy ◽  
Chaotic Advection ◽  
Confocal Laser ◽  
Particle Velocities ◽  
Complicated Geometries ◽  
3D Flows ◽  
2D And 3D ◽  
Suspension Structure

Particles in concentrated flowing suspension in pressure-driven flows tend to migrate away from the walls toward the center of the channel. Demixing due to shear-induced migration inhibits mixing and near wall transport. We investigate the competition between mixing and segregation in flows with complicated geometries that generate 3D chaotic advection, resulting in nontrivial concentration patterns. Using high-speed confocal laser scanning microscopy, we directly image the microspheres to measure the interplay between chaotic advection and the 3D spatial concentration profile, local particle velocities, and suspension structure.

scholarly journals EE-TCAM: An Energy-Efficient SRAM-Based TCAM on FPGA

Electronics ◽  
2018 ◽  
Vol 7 (9) ◽  
pp. 186 ◽  
Author(s):  
Inayat Ullah ◽  
Zahid Ullah ◽  
Jeong-A Lee
Keyword(s):  
Power Consumption ◽  
Integrated Circuit ◽  
Energy Efficient ◽  
High Speed ◽  
Random Access ◽  
Content Addressable Memories ◽  
Field Programmable ◽  
Application Specific Integrated Circuit ◽  
High Power Consumption ◽  
Sram Memory

Ternary content-addressable memories (TCAMs) are used to design high-speed search engines. TCAM is implemented on application-specific integrated circuit (native TCAMs) and field-programmable gate array (FPGA) (static random-access memory (SRAM)-based TCAMs) platforms but both have the drawback of high power consumption. This paper presents a pre-classifier-based architecture for an energy-efficient SRAM-based TCAM. The first classification stage divides the TCAM table into several sub-tables of balanced size. The second SRAM-based implementation stage maps each of the resultant TCAM sub-tables to a separate row of configured SRAM blocks in the architecture. The proposed architecture selectively activates at most one row of SRAM blocks for each incoming TCAM word. Compared with the existing SRAM-based TCAM designs on FPGAs, the proposed design consumes significantly reduced energy as it activates a part of SRAM memory used for lookup rather than the entire SRAM memory as in the previous schemes. We implemented the proposed approach sample designs of size 512 × 36 on Xilinx Virtex-6 FPGA. The experimental results showed that the proposed design achieved at least three times lower power consumption per performance than other SRAM-based TCAM architectures.

High-speed time-resolved laser-scanning microscopy using the line-to-pixel referencing method

2016 ◽  
Vol 55 (32) ◽  
pp. 9033 ◽  
Author(s):  
Jiheun Ryu ◽  
Jayul Kim ◽  
Hyunjun Kim ◽  
Jae-heon Jeong ◽  
Hak-jun Lee ◽  
...  
Keyword(s):  
High Speed ◽  
Laser Scanning ◽  
Laser Scanning Microscopy ◽  
Scanning Microscopy ◽  
Time Resolved
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