Asymmetric Data-Frequency Mapping and Multi Trigger-Probing for Improved Scan Debug

2018 ◽  
Author(s):  
Swaminathan ◽  
Anuradha ◽  
Abuayob ◽  
Eli ◽  
Konstantine Gitelmkher ◽  
...  
Keyword(s):  
Integrated Circuit ◽  
Laser Scanning ◽  
Continuous Wave ◽  
Signal To Noise Ratio ◽  
Fault Isolation ◽  
Laser Scanning Microscopy ◽  
Mapping Technique ◽  
Acquisition Time ◽  
Scan Chain ◽  
Continuous Wave Signal

Abstract Integrated-circuit device dimensions continue to shrink, enabling higher density of devices and smaller node size. A number of strategies to improve the resolution of failure analysis and fault isolation tools exist, but some of these techniques are reaching fundamental limits so that engineers are also challenged to innovative methods to increase the useful life of existing toolsets. Laser Scanning Microscopy including Laser Voltage Probing and frequency mapping struggle to maintain resolution commensurate with shrinking feature size. Here we present two methods to improve efficiency and capability of this toolset using existing optical hardware and configuration. The first method applies a frequency mapping technique using scan chain data patterns that allow for data manipulation. This enables an effective resolution increase through deconvolution of data collected in a sequence of scans completed on varied device states. A second method using multiple triggers per loop to evaluate a deterministic continuous wave signal is shown to reduce probe acquisition time, improve job throughput time, and enable, better signal-to-noise ratio for common scan chain debug workflow.

Laser Logic State Imaging (LLSI)

2014 ◽  
Author(s):  
Baohua Niu ◽  
Grace Mei Ee Khoo ◽  
Yuan-Chuan Steven Chen ◽  
Fernando Chapman ◽  
Dan Bockelman ◽  
...  
Keyword(s):  
Spatial Resolution ◽  
Laser Scanning ◽  
Near Infrared ◽  
Continuous Wave ◽  
Process Development ◽  
Low Voltage ◽  
Signal To Noise Ratio ◽  
Fault Isolation ◽  
Cmos Process ◽  
Logic State

Abstract Logic State Imaging (LSI) using Infra-Red Emission Microscopy (IREM) [1-4] has been an indispensable technology for silicon CMOS process development and product debug applications. Its main limitations are relatively poor spatial resolution due to the broadband near-infrared photons emitted, and poor Signal to Noise Ratio (SNR) with low voltage and low leakage processes and products. Continuous-Wave Laser Scanning Microscope (CW-LSM) based Signal Imaging and Probing (CW-SIP) [5-9] technology is also widely used. It features inherently better spatial resolution than IREM, due to the use of monochromatic 1319nm or 1064nm laser light, and high SNR due to its weaker dependence on voltage and leakage, and, for signal imaging applications, the use of narrow band detection to reduce noise. However, CW-SIP can only detect modulating signals, so it couldn’t previously be applied to LSI. In this paper, we introduce an innovative approach that overcomes this limitation to enable Laser Logic State Imaging (LLSI). Actual fault isolation and design debug cases using this technology are presented to show its advantages in terms of resolution (>50% better), SNR (>2X better) and throughput time improvement, especially at low voltages (down to 500mV).

Low Temperature Fault Isolation Using Soft Defect Localization

2012 ◽  
Author(s):  
Kristopher D. Staller
Keyword(s):  
Low Temperatures ◽  
Laser Scanning ◽  
Low Cost ◽  
Fault Isolation ◽  
Laser Scanning Microscopy ◽  
Cold Temperature ◽  
Multiple Point ◽  
Defect Localization ◽  
Low Levels

Abstract Cold temperature failures are often difficult to resolve, especially those at extreme low levels (< -40°C). Momentary application of chill spray can confirm the failure mode, but is impractical during photoemission microscopy (PEM), laser scanning microscopy (LSM), and multiple point microprobing. This paper will examine relatively low-cost cold temperature systems that can hold samples at steady state extreme low temperatures and describe a case study where a cold temperature stage was combined with LSM soft defect localization (SDL) to rapidly identify the cause of a complex cold temperature failure mechanism.

scholarly journals Percentage of Gutta-Percha-, Sealer-, and Void-Filled Areas in Oval-Shaped Root Canals Obturated with Different Filling Techniques: A Confocal Laser Scanning Microscopy Study

2020 ◽  
Vol 14 (01) ◽  
pp. 008-012
Author(s):  
Vinicio Hidemitsu Goto Hirai ◽  
Ricardo Machado ◽  
Maria Carolina Lucato Budziak ◽  
Lucila Piasecki ◽  
Alexandre Kowalczuck ◽  
...  
Keyword(s):  
Confocal Laser Scanning Microscopy ◽  
Laser Scanning ◽  
Continuous Wave ◽  
Laser Scanning Microscopy ◽  
Confocal Laser Scanning ◽  
Scanning Microscopy ◽  
Confocal Laser ◽  
Root Canals ◽  
Gutta Percha

Abstract Objective This study compared different obturation techniques, analyzing percentage of areas filled with gutta-percha, sealer, and voids (PGFA, PSFA, and PVFA, respectively) in oval-shaped root canals. Materials and Methods A total of 60 extracted human mandibular central incisors were decoronated, instrumented, and irrigated using the same protocol. After drying, the root canal was filled with AH Plus labeled with 0.1% rhodamine B dye using a Lentulo spiral. The filling procedure was performed by dividing the teeth into four groups according to the respective technique: G1, cold lateral condensation; G2, continuous wave of condensation; G3, modified cold lateral condensation using an F3 master cone; and G4, modified continuous wave of condensation using an ISO (International Organization for Standardization) sized 30 gutta-percha cone. Then, slices measuring 1.5 mm in thickness were obtained 3 and 6 mm from the apex and evaluated by confocal laser scanning microscopy to determine PGFA, PSFA, and PVFA. Statistical Analysis The data were analyzed statistically with analysis of variance and Games-Howell’s tests (p = 0.05). Results The groups showed no significant differences in the apical third (3 mm from the apex). In the middle third (6 mm from the apex), G3 and G1 showed higher PGFA and PVFA, respectively. G3 showed lower PSFA than G2 and G4. Both cold techniques (G1 and G3) promoted lower PSFA than both warm techniques (G2 and G4). Conclusions Notwithstanding the limitations of this in vitro study, PGFA, PSFA, and PVFA ranged significantly only in the middle third, as observed by the different filling techniques. Higher PGFA and PVFA values were obtained for G3 and G1, respectively. Both cold techniques promoted lower PSFA than both warm techniques.

scholarly journals ON CERTAIN MATHEMATICAL PROBLEMS IN TWO-PHOTON LASER SCANNING MICROSCOPY

2017 ◽  
Vol 22 (5) ◽  
pp. 587-600 ◽  
Author(s):  
Burcin Simsek ◽  
Satish Iyengar
Keyword(s):  
Laser Scanning ◽  
Signal To Noise Ratio ◽  
Waiting Times ◽  
Infinite Horizon ◽  
Laser Scanning Microscopy ◽  
Scanning Microscopy ◽  
Two Photon ◽  
Mathematical Problems ◽  
Poisson Count ◽  
Horizon Case

In an earlier paper, we derived the distribution of the number of photons detected in two-photon laser scanning microscopy when the counter has a dead period. We assumed a Poisson number of emissions, exponential waiting times, and an infinite time horizon, and used an equivalent inhomogeneous Poisson process formulation. We then used that result to improve image quality as measured by the signal-to-noise ratio. Here, we extend that study in two directions. First, we treat the finite-horizon case to assess the accuracy of the simpler infinite-horizon approximation. Second, we use a direct approach by conditioning on the Poisson count for the infinite-horizon case to derive several polynomial identities.

Laser Scanning Localization Technique for Fast Analysis of High Speed DRAM Devices

2008 ◽  
Author(s):  
Martin Versen ◽  
Achim Schramm ◽  
Jan Schnepp ◽  
Sascha Hoch ◽  
Tapan Vikas ◽  
...  
Keyword(s):  
Integrated Circuit ◽  
High Speed ◽  
Laser Scanning ◽  
Random Access ◽  
Laser Scanning Microscopy ◽  
New Method ◽  
Temperature Influence ◽  
Fast Analysis ◽  
Knowledge Based ◽  
Defect Localization

Abstract Soft defect localization (SDL) is a method of laser scanning microscopy that utilizes the changing pass/fail behavior of an integrated circuit under test and temperature influence. Historically the pass and fail states are evaluated by a tester that leads to long and impracticable measurement times for dynamic random access memories (DRAM). The new method using a high speed comparison device allows SDL image acquisition times of a few minutes and a localization of functional DRAM fails that are caused by defects in the DRAM periphery that has not been possible before. This new method speeds up significantly the turn-around time in the failure analysis (FA) process compared to knowledge based FA.

scholarly journals Low Probability of Intercept Triangular Modulated Frequency Modulated Continuous Wave Signal Characterization Comparison using the Spectrogram and the Scalogram

2017 ◽  
pp. 37-47
Author(s):  
Daniel L. Stevens ◽  
Stephanie A. Schuckers
Keyword(s):  
Continuous Wave ◽  
Signal To Noise Ratio ◽  
Time Frequency ◽  
Novel Approach ◽  
Wave Radar ◽  
Time Frequency Localization ◽  
Low Probability ◽  
Low Probability Of Intercept ◽  
Radar Signals ◽  
Continuous Wave Signal

Digital intercept receivers are currently moving away from Fourier-based analysis and towards classical time-frequency analysis techniques for the purpose of analyzing low probability of intercept radar signals. This paper presents the novel approach of characterizing low probability of intercept frequency modulated continuous wave radar signals through utilization and direct comparison of the Spectrogram versus the Scalogram. Two different triangular modulated frequency modulated continuous wave signals were analyzed. The following metrics were used for evaluation: percent error of: carrier frequency, modulation bandwidth, modulation period, chirp rate, and time-frequency localization (x and y direction). Also used were: percent detection, lowest signal-to-noise ratio for signal detection, and plot (processing) time. Experimental results demonstrate that overall, the Spectrogram produced more accurate characterization metrics than the Scalogram. An improvement in performance may well translate into saved equipment and lives.

scholarly journals Automatic Identification of Fluorescently Labeled Brain Cells for Rapid Functional Imaging

2010 ◽  
Vol 104 (3) ◽  
pp. 1803-1811 ◽  
Author(s):  
Ilya Valmianski ◽  
Andy Y. Shih ◽  
Jonathan D. Driscoll ◽  
David W. Matthews ◽  
Yoav Freund ◽  
...  
Keyword(s):  
Laser Scanning ◽  
Signal To Noise Ratio ◽  
Laser Scanning Microscopy ◽  
Scanning Microscopy ◽  
Morphological Properties ◽  
Automatic Identification ◽  
Full Field ◽  
Rate Limiting Step ◽  
Calcium Indicator ◽  
On Line

The on-line identification of labeled cells and vessels is a rate-limiting step in scanning microscopy. We use supervised learning to formulate an algorithm that rapidly and automatically tags fluorescently labeled somata in full-field images of cortex and constructs an optimized scan path through these cells. A single classifier works across multiple subjects, regions of the cortex of similar depth, and different magnification and contrast levels without the need to retrain the algorithm. Retraining only has to be performed when the morphological properties of the cells change significantly. In conjunction with two-photon laser scanning microscopy and bulk-labeling of cells in layers 2/3 of rat parietal cortex with a calcium indicator, we can automatically identify ∼50 cells within 1 min and sample them at ∼100 Hz with a signal-to-noise ratio of ∼10.

scholarly journals Cryo-Confocal Imaging for CLEM Mapping in Brain Tissues

2021 ◽  
Vol 29 (5) ◽  
pp. 34-39
Author(s):  
Connon I. Thomas ◽  
Nicolai T. Urban ◽  
Ye Sun ◽  
Lesley A. Colgan ◽  
Xun Tu ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Laser Scanning ◽  
Signal To Noise Ratio ◽  
Light And Electron Microscopy ◽  
Brain Slices ◽  
Confocal Imaging ◽  
Laser Scanning Microscopy ◽  
Confocal Laser ◽  
Array Tomography ◽  
Biological Phenomena

Abstract:In correlative light and electron microscopy (CLEM) workflows, identifying the same sub-cellular features in tissue by both light (LM) and electron microscopy (EM) remains a challenge. Furthermore, use of cryo-fixation for EM is desirable to capture rapid biological phenomena. Here, we describe a workflow that incorporates cryo-confocal laser scanning microscopy into the CLEM process, mapping cells in brain slices to re-image them with serial section scanning electron microscopy (ssSEM) array tomography. The addition of Airyscan detection increased the signal-to-noise ratio (SNR), allowing individual spines in thick frozen tissue to be visualized at a sufficient spatial resolution, providing a new tool for a CLEM approach to capture biological dynamics.

scholarly journals Low Probability of Intercept Triangular Modulated Frequency Modulated Continuous Wave Signal Characterization Comparison Using the Wigner Ville Distribution and the Choi Williams Distribution

2019 ◽  
pp. 35-44
Author(s):  
Daniel L. Stevens
Keyword(s):  
Continuous Wave ◽  
Signal To Noise Ratio ◽  
Time Frequency ◽  
Novel Approach ◽  
Wave Radar ◽  
Time Frequency Localization ◽  
Low Probability ◽  
Low Probability Of Intercept ◽  
Radar Signals ◽  
Continuous Wave Signal

Digital intercept receivers are currently moving away from Fourier-based analysis and towards classical time frequency analysis techniques for the purpose of analyzing low probability of intercept radar signals. This paper presents the novel approach of characterizing low probability of intercept triangular modulated frequency modulated continuous wave radar signals through utilization and direct comparison of the Wigner Ville Distribution versus the Choi Williams Distribution. The following metrics were used for evaluation: percent error of: carrier frequency, modulation bandwidth, modulation period, chirp rate, and time-frequency localization (x and y direction). Also used were: percent detection, lowest signal-to noise ratio for signal detection, and plot (processing) time. Experimental results demonstrate that overall, the Wigner Ville Distribution produced more accurate characterization metrics than the Choi Williams Distribution. An improvement in performance may well translate into an increase in personnel safety.

scholarly journals Influence of root canal filling techniques on sealer penetration and gutta percha/sealer ratio: a confocal laser scanning microscopy analysis

2020 ◽  
Vol 23 (3) ◽  
Author(s):  
Fatma Macit Ermis ◽  
Faruk Haznedaroğlu
Keyword(s):  
Confocal Laser Scanning Microscopy ◽  
Root Canal ◽  
Laser Scanning ◽  
Continuous Wave ◽  
Laser Scanning Microscopy ◽  
Confocal Laser Scanning ◽  
Confocal Laser ◽  
Root Canal Filling ◽  
Gutta Percha ◽  
Single Cone

 Objective: The influence of four root canal filling techniques on the penetration of an endodontic sealer into dentinal tubules and the gutta percha/ sealer ratio (GP/SR) in root canals was evaluated using confocal laser scanning microscopy (CLSM). Material and Methods: Roots of the maxillary central incisors (n=40) were prepared with ProTaper Universal files up to file F5 and assigned to five groups: continuous wave condensation, lateral condensation, single cone, Thermafill®, and negative control group. After root canal filling with gutta-percha and AH26, along with the addition of 0.01% fluorescein, the roots were cut into 2-mm slices. Using CLSM, the specimens were transversely sectioned at 3, 6, and 10 mm from the apex. Results: Sealer penetration was deeper and more frequent at 10 mm than at the 6mm and 3mm for all obturation technique. Penetration was not significantly affected by obturation techniques except single master cone tecnique. Single cone technique demonstrated the lowest sealer penetration at all levels. However, sealer thickness was strongly dependent on obturation technique. Termafill® demostrated superior GP ratio followed by continuous wave condensation, lateral condensation and single cone. Conclusion: In conclusion, the single cone technique resulted in lower sealer penetration than the other techniques, which did not differ significantly from each other. However, sealer thickness was strongly dependent on obturation technique. Termafill® demostrated superior GP ratio followed by continuous wave condensation, lateral condensation and single cone.KeywordsObturation techniques; Dentinal tubule penetration; Gutta percha, sealer ratio; Confocal laser scanning microscopy.

Sign in / Sign up

Export Citation Format

Share Document