Characterization of Gate Oxide Pinhole Defect in NMOS FinFET Devices

2017 ◽  
Author(s):  
Liangshan Chen ◽  
Arnaud Bousquet ◽  
Tanya Schaeffer ◽  
Lucile C. Teague Sheridan ◽  
Lowell Hodgkins ◽  
...  
Keyword(s):  
Failure Mechanism ◽  
Electron Tomography ◽  
Gate Oxide ◽  
The Other ◽  
Physical Analysis ◽  
Tem Analysis ◽  
Root Cause ◽  
The Common ◽  
Tomography Analysis

Abstract This paper highlights the application of nanoprobing technique and electron tomography analysis to characterize the tiny gate oxide pinhole defect in NMOS FinFET devices. Nanoprobing technique was utilized to achieve a better understanding on the failure mechanism by characterizing the device electrical behaviors, and electron tomography, capable of mitigating the common projection issue encountered by general TEM analysis, was applied for physical analysis. It has been demonstrated through two cases, one logic fail and the other memory fail, that these two techniques together can effectively identify the root cause of pinhole defect. This type of pinhole defect, characterized by a tiny spot of oxide discontinuity and without excessive materials inter-diffusion, has been extremely challenging in FA analysis. This paper will provide the analysis details leading to the successful characterization of such type of oxide pinhole defect.

Electrical Signature Verification of a Lightly Doped Drain Profile Abnormality in a 65nm Device via Nano-Probing and Junction Stain TEM

2009 ◽  
Author(s):  
Jie Su ◽  
Sanan Liang ◽  
Yoyo Wen ◽  
May Yang ◽  
Linfeng Wu ◽  
...  
Keyword(s):  
Failure Mechanism ◽  
Memory Function ◽  
Random Access ◽  
Signature Verification ◽  
Physical Analysis ◽  
Electronic Microscopy ◽  
Access Memory ◽  
Tem Analysis ◽  
Root Cause ◽  
Lightly Doped Drain

Abstract Failures caused by threshold voltage (Vt) shifts in sub-100nm technology transistors have become very difficult to both analyze and determine the failure mechanism. The failure mechanisms for Vt shifts are typically non-visible for traditional physical analysis methods such as SEM inspection or traditional TEM analysis. This paper demonstrates how nano-probing was used to carefully and fully characterize the Vt shift failure to determine a specific electrical signature for a specific failure mechanism and then with junction stain Transmission Electronic Microscopy (TEM) verify the subtle doping defect affecting the Static Random Access Memory function in the 65nm generation node. Device failure due to a lack of Lightly Dope Drain (LDD) implant induced by an inconspicuous spacer defect was determined to be the root cause of the failure.

Identifying the Root Cause of Source-Drain Leakage Caused Soft Fail in Advanced Bulk FinFET Devices

2018 ◽  
Author(s):  
Liangshan Chen ◽  
Yuting Wei ◽  
Tanya Schaeffer ◽  
Chongkhiam Oh
Keyword(s):  
Careful Analysis ◽  
Physical Analysis ◽  
Device Structure ◽  
Tem Analysis ◽  
Root Cause ◽  
3D Architecture ◽  
Cause Of Failure ◽  
Electrical Analysis ◽  
Electrical Data

Abstract The paper reports the investigation on the root cause of source-drain leakage in bulk FinFET devices. While the failing device was readily isolated by nanoprobing technique and the electrical analysis pinpointed the potential defect location inside the Fin channel, the identification of physical root cause went through extreme challenges imposed by the tiny-sized device and the unique FinFET 3D architecture. The initial TEM analysis was misled by the projection of a species in the lamella surface and thus could not explain the electrical data. Careful analysis on the device structure was able to identify the origin of the species and led to the discovery of the actual root cause. This paper will provide the analysis details leading to the findings, and highlight the role of electrical understanding in not only providing guidance for physical analysis but also revealing the true root cause of failure in FinFET devices.

Busting Myths in Compound Handling Practices for Assay Developers

2021 ◽  
pp. 247263032110233
Author(s):  
Rosalia Gonzales ◽  
Travis Mathewson ◽  
Jefferson Chin ◽  
Holly McKeith ◽  
Lane Milde ◽  
...  
Keyword(s):  
The Other ◽  
Common Goal ◽  
Collaborative Relationship ◽  
Sample Handling ◽  
Root Cause ◽  
The Common ◽  
Recommended Practices ◽  
Handling Practices ◽  
The One

Since the advent of modern-day screening collections in the early 2000s, various aspects of our knowledge of good handling practices have continued to evolve. Some early practices, however, continue to prevail due to the absence of defining data that would bust the myths of tradition. The lack of defining data leads to a gap between plate-based screeners, on the one hand, and compound sample handling groups, on the other, with the latter being the default party to blame when an assay goes awry. In this paper, we highlight recommended practices that ensure sample integrity and present myth busting data that can help determine the root cause of an assay gone bad. We show how a strong and collaborative relationship between screening and sample handling groups is the better state that leads to the accomplishment of the common goal of finding breakthrough medicines.

scholarly journals Biological and Molecular Characterization of Four Botryosphaeria Species Isolated from Pear Plants Showing Stem Wart and Stem Canker in China

Plant Disease ◽  
2014 ◽  
Vol 98 (6) ◽  
pp. 716-726 ◽  
Author(s):  
Lifeng Zhai ◽  
Meixin Zhang ◽  
Gang Lv ◽  
Xiaoren Chen ◽  
Nana Jia ◽  
...  
Keyword(s):  
Molecular Characterization ◽  
Phylogenetic Analyses ◽  
Stem Canker ◽  
Morphological Characterization ◽  
The Other ◽  
Internal Transcribed Spacer Region ◽  
Pathogenicity Tests ◽  
The Common ◽  
Stem Cankers

Pear stem wart and pear stem canker, which have been considered as two different fungal diseases caused by pathogens belonging to Botryosphaeria spp., commonly occur and cause serious damage in the main pear-producing areas in China. To identify the species of this genus infecting pear in China, 131 Botryosphaeria isolates were recovered from pear samples exhibiting symptoms collected from 20 different provinces and areas. Morphological characterization and phylogenetic analyses of the ribosomal DNA internal transcribed spacer region and the β-tubulin and EF1-α genes revealed that Botryosphaeria dothidea, B. rhodina, B. obtusa, and B. parva were associated with different pear stem wart and stem canker symptoms. Remarkably, all isolates of B. dothidea were obtained from the samples showing either stem wart or stem canker lesions; however, the isolates of the other three species were obtained only from the samples showing stem canker. Pathogenicity tests on the pear shoots showed that B. dothidea isolates could induce stem wart or stem canker lesions but all the isolates of the other three species could only induce stem cankers. However, the isolates of B. parva, B. rhodina, and B. obtusa exhibited higher virulence than that of the B. dothidea isolates on the pear fruit. Our results suggest that B. dothidea is the common causal agent for these two diseases (a pear stem wart and a pear-related stem canker), whereas B. parva, B. rhodina, and B. obtusa only cause pear stem canker diseases. To our knowledge, this study represents the first report for biological and molecular characterization of four Botryosphaeria spp. isolated from pear plants showing stem wart and stem canker in China.

Introduction

2019 ◽  
Author(s):  
Judith Mair ◽  
Gabby Walters
Keyword(s):  
Natural Disasters ◽  
Political Instability ◽  
Tourism Industry ◽  
The Other ◽  
Perceived Threat ◽  
Heavy Industry ◽  
Root Cause ◽  
Common Thread ◽  
The Common ◽  
Industry Sectors

Tourism has always been impacted by crises and disasters, and no tourism destination is exempt (Beirman, 2006). Tourism is particularly susceptible to natural disasters (hurricanes, earthquakes and bushfires amongst others), which can cause sudden and immediate damage and destruction to destinations and their infrastructure, as well as longer terms issues with reduced visitor arrivals, leading to knock-on employment problems (Huang et al., 2008). However, there are other types of man-made crises that can also affect the tourism industry, including the actual or perceived threat of terrorism or political instability within a destination. Additionally, while some crises may affect entire destinations, others are more specific, affecting only particular industry sectors or organisations. Finally, not all challenges for destination marketers arise suddenly. Many destinations struggle to attract tourists because they are perceived to be unattractive for some reason, perhaps as a result of the long-running presence of heavy industry. The common thread linking these various crises, disasters and challenges is the unfortunate effect that they have on the reputation and image of the destination or organisation involved. Faulkner (2001: 136) defined a disaster as “a situation where an enterprise or a destination is confronted with sudden unpredictable catastrophic changes over which it has little control”. A crisis, on the other hand, is considered to be “a situation where the root cause of an event is, to some extent, self-inflicted through such problems as inept management structures and practices or a failure to adapt to change” (Faulkner 2001, p.136). However, while there is an academic distinction between the term ‘crisis’ and ‘disaster’, they are often used interchangeably and in this book, both terms will be used.

scholarly journals Capacity-Equivocation Regions of the DMBCs with Noiseless Feedback

2013 ◽  
Vol 2013 ◽  
pp. 1-13 ◽  
Author(s):  
Xinxing Yin ◽  
Zhi Xue ◽  
Bin Dai
Keyword(s):  
Limited Feedback ◽  
Single Letter ◽  
Broadcast Channels ◽  
The Other ◽  
Secrecy Capacity ◽  
Wiretap Channel ◽  
The Common ◽  
Noiseless Feedback ◽  
Common Message

The discrete memoryless broadcast channels (DMBCs) with noiseless feedback are studied. The entire capacity-equivocation regions of two models of the DMBCs with noiseless feedback are obtained. One is the degraded DMBCs with rate-limited feedback; the other is thelessandreversely less noisyDMBCs with causal feedback. In both models, two kinds of messages are transmitted. The common message is to be decoded by both the legitimate receiver and the eavesdropper, while the confidential message is only for the legitimate receiver. Our results generalize the secrecy capacity of the degraded wiretap channel with rate-limited feedback (Ardestanizadeh et al., 2009) and the restricted wiretap channel with noiseless feedback (Dai et al., 2012). Furthermore, we use a simpler and more intuitive deduction to get the single-letter characterization of the capacity-equivocation region, instead of relying on the recursive argument which is complex and not intuitive.

Characterization of Laser Induced Backside Damage for Gettering Purposes

1981 ◽  
Vol 4 ◽  
Author(s):  
G.E.J. Eggermont ◽  
D.F. Allison ◽  
S.A. Gee ◽  
K.N. Ritz ◽  
R.J. Falster ◽  
...  
Keyword(s):  
Heat Treatment ◽  
Surface Roughness ◽  
Side Effects ◽  
Laser Pulse ◽  
Laser Pulse Energy ◽  
Limited Range ◽  
The Other ◽  
Tem Analysis ◽  
Initial Oxidation

ABSTRACTA characterization of Q-switched Nd-YAG laser induced backside damage in various stages of a bipolar process is presented. TEM-analysis shows the occurence of microcracks, low angle boundaries and dislocations in as-irradiated wafers, of which the microcracks anneal out during an initial oxidation at 1050°C. The other damage is very stable and remains even after a heat treatment at 1200°C. This is quite in contrast with mechanically or Ar implantation induced backside damage, which anneal out completely at such high temperatures. Side effects of laser induced backside damage such as surface roughness and influence on wafer strength are found to be of no consequence within a limited range of laser pulse energy densities where the gettering efficiency is found to be very promising.

scholarly journals Resolution of Customer Return Non-Volatile Memory Data Retention Bit Failures through Bit Map Verification and Bit Cell Characterization by Nanoprobe Analysis

2021 ◽  
Author(s):  
Randal Mulder
Keyword(s):  
Failure Analysis ◽  
Failure Mechanism ◽  
Nonvolatile Memory ◽  
Physical Analysis ◽  
Data Retention ◽  
Tem Analysis ◽  
Cell Characterization ◽  
Atomic Force ◽  
Programming Error ◽  
Non Volatile Memory

Abstract A major customer had been returning devices for nonvolatile memory (NVM) data retention bit failures. The ppm level was low but the continued fallout at the customer location was causing a quality and reliability concern. The customer wanted a resolution as to the cause of the failures and for a corrective action. An NVM bit data retention failure occurs when a programmed bit loses it programmed data state over time and flips to the opposite data state (0 -> 1 or 1 -> 0) causing a programming error. Previous failure analysis results on several failing devices with a single NVM bit data retention failure was inconclusive. TEM analysis showed no difference between the failing bit and neighboring passing bit. The lack of results led to the questioning of the accuracy of the bit map documentation and if the TEM analysis was being performed at the correct bit location. Bit map documentation takes the failing bit's electrical address and converts it to a physical address location. If the bit map documentation is incorrect, locating the failing bit is not possible and physical failure analysis will not be performed at the correct bit location. This paper will demonstrate how Atomic Force Probe (AFP) nanoprobe analysis was used to first verify the bit map documentation by determining the programming of bits at specific locations through bit cell characterization; and then characterize the failing bit location to verify the programming error and determine the possible failure mechanism based on its electrical signature followed by the appropriate physical analysis to determine the failure mechanism.

Friendship, Knowledge and Reciprocity in Lysis

Apeiron ◽  
2020 ◽  
Vol 53 (4) ◽  
pp. 315-337
Author(s):  
José Antonio Giménez
Keyword(s):  
Good Life ◽  
The Other ◽  
The Good Life ◽  
The Common

AbstractPlato’s characterization of philia in Lysis, on one hand, as one-sided belonging to the ultimate object of our desire and, on the other, as interpersonal reciprocal belonging appears problematic. Yonesawa has recently claimed that one can make sense of both uses of “belonging” if we assume that one is the other’s friend when each one coincides in being the ultimate object of the other’s desire. This paper proposes instead that Lysis’ ‘reciprocity’ of friendship results from friends’ right wanting, which presupposes their souls are well-disposed to a true object of desire. To prove this, I will argue that (i) the action and the argument of the dialogue exhibit this kind of reciprocity, (ii) there is a ‘unique’ ultimate object of desire (‘teleological monism’), that consists of a ‘knowledge about the good life’ and (iii) only the common longing for such knowledge can make possible friends’ reciprocal belonging.

scholarly journals ACTORS OF HOMELESSNESS IN KUALA LUMPUR CITY: ADVOCACY VERSUS PARADOX

2021 ◽  
Vol 6 (25) ◽  
pp. 103-118
Author(s):  
Junaidi Abu Bakar ◽  
Norazlan Hadi Yaacob ◽  
Suharmili Rosle
Keyword(s):  
Mental Health ◽  
The Other ◽  
Field Observations ◽  
Economic Approach ◽  
Kuala Lumpur ◽  
Economic Problems ◽  
Fundamental Factor ◽  
Root Cause ◽  
The Common ◽  
The City

This study assessed the advocacies by various parties on the factors that lead to the emergence of homelessness symptoms in Malaysia. The present study was on field observations, social participation, and intensive interviews with the homeless (hot sports location) in Kuala Lumpur. This study contradicted the common advocacies that the factors of homelessness in Malaysia are due to economic problems such as costly rental for a house, difficulty in employment, and underpaid. On the other hand, the findings obtained from this study showed that the fundamental factor that produced the symptoms of homelessness in Malaysia was mental health. Accordingly, the purpose of this study is to raise awareness among parties that efforts to determine the root cause of homelessness in the city should not only involve an economic approach but should be based on a sociocultural-psychology technique instead.

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