scholarly journals A BIST Scheme for Bootstrapped Switches

Electronics ◽  
2021 ◽  
Vol 10 (14) ◽  
pp. 1661
Author(s):  
Xiao-Bin Tang ◽  
Masayoshi Tachibana
Keyword(s):  
Power Supply ◽  
Gate Voltage ◽  
Supply Voltage ◽  
Clock Signal ◽  
Power Supply Voltage ◽  
Mos Transistor ◽  
Turn On ◽  
Self Test ◽  
Bootstrapped Switch ◽  
Catastrophic Faults

This paper proposes a built-in self-test (BIST) scheme for detecting catastrophic faults in bootstrapped switches. The clock signal and the gate voltage of the sampling MOS transistor are taken as the observation signals in the proposed BIST scheme. Usually, the gate voltage of the sampling MOS transistor is greater than or equal to the supply voltage when the switch is turn on, and such a voltage is not suitable for observation. To solve this problem, a low power supply voltage is provided for the bootstrapped switch to obtain a suitable observation voltage. The proposed BIST scheme and the circuit under test (CUT) are realized with transistor level. The proposed BIST scheme was simulated by HSPICE. The simulated fault coverage is approximately 87.9% with 66 test circuits.

scholarly journals Experimental FIA Methodology Using Clock and Control Signal Modifications under Power Supply and Temperature Variations

Sensors ◽  
2021 ◽  
Vol 21 (22) ◽  
pp. 7596
Author(s):  
Francisco Eugenio Potestad-Ordóñez ◽  
Erica Tena-Sánchez ◽  
José Miguel Mora-Gutiérrez ◽  
Manuel Valencia-Barrero ◽  
Carlos Jesús Jiménez-Fernández
Keyword(s):  
Power Supply ◽  
Supply Voltage ◽  
Fault Injection ◽  
Short Pulse ◽  
Mathematical Formulation ◽  
Control Signal ◽  
Clock Signal ◽  
Power Supply Voltage ◽  
Injection Attacks ◽  
And Control

The security of cryptocircuits is determined not only for their mathematical formulation, but for their physical implementation. The so-called fault injection attacks, where an attacker inserts faults during the operation of the cipher to obtain a malfunction to reveal secret information, pose a serious threat for security. These attacks are also used by designers as a vehicle to detect security flaws and then protect the circuits against these kinds of attacks. In this paper, two different attack methodologies are presented based on inserting faults through the clock signal or the control signal. The optimization of the attacks is evaluated under supply voltage and temperature variation, experimentally determining the feasibility through the evaluation of different Trivium versions in 90 nm ASIC technology implementations, also considering different routing alternatives. The results show that it is possible to inject effective faults with both methodologies, improving fault efficiency if the power supply voltage decreases, which requires only half the frequency of the short pulse inserted into the clock signal to obtain a fault. The clock signal modification methodology can be extended to other NLFSR-based cryptocircuits and the control signal-based methodology can be applied to both block and stream ciphers.

Power Supply Voltage Dependence of Within-Die Delay Variation of Regular Manual Layout and Irregular Place-and-Route Layout

2011 ◽  
Vol E94-C (6) ◽  
pp. 1072-1075
Author(s):  
Tadashi YASUFUKU ◽  
Yasumi NAKAMURA ◽  
Zhe PIAO ◽  
Makoto TAKAMIYA ◽  
Takayasu SAKURAI
Keyword(s):  
Power Supply ◽  
Voltage Dependence ◽  
Supply Voltage ◽  
Power Supply Voltage ◽  
Place And Route ◽  
Delay Variation

Power Supply Voltage Control for Eliminating Overkills and Underkills in Delay Fault Testing

2016 ◽  
Vol E99.C (10) ◽  
pp. 1219-1225
Author(s):  
Masahiro ISHIDA ◽  
Toru NAKURA ◽  
Takashi KUSAKA ◽  
Satoshi KOMATSU ◽  
Kunihiro ASADA
Keyword(s):  
Power Supply ◽  
Supply Voltage ◽  
Voltage Control ◽  
Fault Testing ◽  
Power Supply Voltage ◽  
Delay Fault ◽  
Delay Fault Testing

AlInAs/GaInAs on InP HEMTs for low power supply voltage operation of high power-added efficiency microwave amplifiers

1993 ◽  
Vol 29 (15) ◽  
pp. 1324 ◽  
Author(s):  
L.E. Larson ◽  
M.M. Matloubian ◽  
J.J. Brown ◽  
A.S. Brown ◽  
M. Thompson ◽  
...  
Keyword(s):  
Low Power ◽  
High Power ◽  
Power Supply ◽  
Supply Voltage ◽  
Power Supply Voltage ◽  
Power Added Efficiency ◽  
Microwave Amplifiers

Transistor Width Effect on the Power Supply Voltage Dependence of α-SER in CMOS 6T SRAM

2020 ◽  
Vol 67 (5) ◽  
pp. 811-817
Author(s):  
G. Torrens ◽  
A. Alheyasat ◽  
B. Alorda ◽  
S. Barcelo ◽  
J. Segura ◽  
...  
Keyword(s):  
Power Supply ◽  
Voltage Dependence ◽  
Supply Voltage ◽  
Power Supply Voltage ◽  
Width Effect
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