scholarly journals Design of 300 GHz Combined Doubler/Subharmonic Mixer Based on Schottky Diodes with Integrated MMIC Based Local Oscillator

Electronics ◽  
2020 ◽  
Vol 9 (12) ◽  
pp. 2112
Author(s):  
José M. Pérez-Escudero ◽  
Carlos Quemada ◽  
Ramón Gonzalo ◽  
Iñigo Ederra
Keyword(s):  
State Of The Art ◽  
Schottky Diodes ◽  
Noise Temperature ◽  
Local Oscillator ◽  
The State ◽  
Experimental Characterization ◽  
Conversion Loss ◽  
Equivalent Noise Temperature ◽  
Factor Technique

In this paper the design and experimental characterization of a combined doubler-subharmonic mixer based on Schottky diodes which uses a 75 GHz MMIC based local oscillator is presented. This solution integrates in the same substrate the doubler and the mixer, which share the same metallic packaging with the local oscillator. The prototype has been fabricated and measured. For characterization, the Y-Factor technique has been used and the prototype yields a best conversion loss and equivalent noise temperature of 11 dB and 1976 K, respectively, at 305 GHz. This performance is close to the state of the art, and shows the potential of this approach, which allows a significant reduction in terms of size and volume.

scholarly journals A Millimeter-Wave 4th-Harmonic Schottky Diode Mixer with Integrated Local Oscillator

2021 ◽  
Vol 11 (16) ◽  
pp. 7238
Author(s):  
José M. Pérez-Escudero ◽  
Carlos Quemada ◽  
Ramón Gonzalo ◽  
Iñigo Ederra
Keyword(s):  
Millimeter Wave ◽  
Schottky Diode ◽  
Experimental Validation ◽  
State Of The Art ◽  
Schottky Diodes ◽  
Noise Temperature ◽  
Local Oscillator ◽  
Conversion Loss ◽  
Fourth Harmonic ◽  
Equivalent Noise Temperature

In this paper the design and experimental validation of a fourth-harmonic mixer based on Schottky diodes working around 300 GHz is presented. The main novelty of this work consists in the integration of an MMIC-based local oscillator, working around 75 GHz, and a mixer in the same metallic block housing. A prototype has been characterized using the Y-Factor method and yields a best measured conversion loss and an equivalent noise temperature of 14 dB and 9600 K, respectively. This performance is comparable to the state-of-the-art for this type of mixer.

Characterization Study of Al-Plug Technology

1991 ◽  
Vol 225 ◽  
Author(s):  
H. H. Hoang ◽  
F. S. Chen ◽  
T. E. Turner ◽  
Y. S. Lin ◽  
G. A. Dixit ◽  
...  
Keyword(s):  
State Of The Art ◽  
Electrical Characterization ◽  
The State ◽  
Complete Elimination ◽  
Complete Filling ◽  
Step Coverage ◽  
Characterization Study ◽  
Coverage Problems

ABSTRACTThis work investigates the reliability issues associated with an aluminum sputter process, called the Al-plug process, that results in the complete filling of submicron contacts and vias of various sizes. The state-of-the-art Al-plug technology has proven its superiority over conventional processes due to its process simplicity and complete elimination of metal step-coverage problems and dielectric voiding over contacts/vias, resulting in higher reliability. Materials and electrical characterization of this metal process are presented.

Electrothermal Issues in 4H-SiC 600 V Schottky Diodes in Forward Mode: Experimental Characterization, Numerical Simulations and Analytical Modelling

2006 ◽  
Vol 527-529 ◽  
pp. 1151-1154
Author(s):  
Andrea Irace ◽  
Vincenzo d'Alessandro ◽  
Giovanni Breglio ◽  
Paolo Spirito ◽  
Andrea Bricconi ◽  
...  
Keyword(s):  
Critical Current Density ◽  
Thermal Resistance ◽  
Current Density ◽  
Negative Temperature Coefficient ◽  
State Of The Art ◽  
Schottky Diodes ◽  
Negative Temperature ◽  
Experimental Characterization ◽  
Thermally Induced ◽  
Forward Current

The electrothermal behavior of 4H-SiC 600 V Schottky diodes operated in forward mode is analyzed through numerical and analytically-based simulations. It is shown that the unexpected occurrence of voltage surges systematically detected in state-of-the-art devices is a thermally-induced effect due to the compound contribution of a) the negative temperature coefficient of the forward current at high voltages and b) the relatively high package-to-ambient thermal resistance. As a main result, it is demonstrated that the proposed approaches are suitable to accurately predict the value of a “critical” current density beyond which voltage surges may arise.

scholarly journals An Eigenmode Study of Nanoantennas from Terahertz to Optical Frequencies

Electronics ◽  
2021 ◽  
Vol 10 (22) ◽  
pp. 2782
Author(s):  
Konstantinos D. Paschaloudis ◽  
Constantinos L. Zekios ◽  
Georgios C. Trichopoulos ◽  
Filippos Farmakis ◽  
George A. Kyriacou
Keyword(s):  
Penetration Depth ◽  
Patch Antenna ◽  
State Of The Art ◽  
The State ◽  
Antenna Design ◽  
Surface Currents ◽  
Rectangular Patch ◽  
Full Wave ◽  
Volume Currents

In this work, we present a rigorous full-wave eigenanalysis for the study of nanoantennas operating at both terahertz (THz) (0.1–10 THz), and infrared/optical (10–750 THz) frequency spectrums. The key idea behind this effort is to reveal the physical characteristics of nanoantennas such that we can transfer and apply the state-of-the-art antenna design methodologies from microwaves to terahertz and optics. Extensive attention is given to penetration depth in metals to reveal whether the surface currents are sufficient for the correct characterization of nanoantennas, or the involvement of volume currents is needed. As we show with our analysis, the penetration depth constantly reduces until the region of 200 THz; beyond this point, it shoots up, requiring volume currents for the exact characterization of the corresponding radiating structures. The cases of a terahertz rectangular patch antenna and a plasmonic nanoantenna are modeled, showing in each case the need of surface and volume currents, respectively, for the antenna’s efficient characterization.

Experimental Techniques in Fracture Characterization

2007 ◽  
Vol 567-568 ◽  
pp. 39-44
Author(s):  
W. R. Tyson
Keyword(s):  
Fracture Toughness ◽  
State Of The Art ◽  
Research Trends ◽  
The State ◽  
Experimental Techniques ◽  
Fracture Characterization ◽  
Girth Welds ◽  
Linepipe Steel

Characterization of fracture toughness is discussed in relation to specification of steels for northern pipelines. The state of the art and research trends in measurement of CTOD for girth welds and CTOA for linepipe steel are described.

Demonstration of the state-of-the-art of formation and characterization of ultra-shallow junctions

2001 ◽  
Vol 669 ◽  
Author(s):  
P. Borden ◽  
A. Al-Bayati ◽  
J. Madsen ◽  
C. Lazik ◽  
P. Carey ◽  
...  
Keyword(s):  
Process Control ◽  
State Of The Art ◽  
Depth Resolution ◽  
The State ◽  
Vlsi Technology ◽  
Line Process ◽  
Ultra Shallow Junctions ◽  
Technology Nodes ◽  
Spike Annealing

ABSTRACTDoping process windows are becoming very narrow as VLSI technology nodes scale to smaller and smaller dimensions. The time and cost required to develop new doping methods and the desire to re-use equipment will make it likely that current methods will be applied as long as possible. This means that existing process tools will have very tight stability and uniformity requirements, and metrology will be required to drive process control. The paper describes the state-of-the-art of both doping processes involving ion implantation and spike annealing, and new metrology based on Carrier IlluminationTM methods that will be required to implement in-line process control for these processes. CI offers depth resolution on the order of1Å, providing a level of control required to extend existing doping methods. The prospects of new methods such as Laser Thermal Annealing (LTA) are also discussed.

Analytical and advanced kinetic models for characterization of chain-growth copolymerization: the state-of-the-art

2018 ◽  
Vol 3 (2) ◽  
pp. 128-145 ◽  
Author(s):  
S. K. Fierens ◽  
P. H. M. Van Steenberge ◽  
M.-F. Reyniers ◽  
D. R. D'hooge ◽  
G. B. Marin
Keyword(s):  
Kinetic Models ◽  
State Of The Art ◽  
The State ◽  
Bulk Solution ◽  
Chain Growth

A detailed overview is given on the currently developed analytical and advanced kinetic models to calculate the main bulk/solution chain-growth copolymerization characteristics.

Sign in / Sign up

Export Citation Format

Share Document