Direct Observations of the Structural Properties of Semiconducting Polymer: Fullerene Blends under Tensile Stretching

We describe the impact of tensile strains on the structural properties of thin films composed of PffBT4T-2OD π-conjugated polymer and PC71BM fullerenes coated on a stretchable substrate, based on a novel approach using in situ studies of flexible organic thin films. In situ grazing incidence X-ray diffraction (GIXD) measurements were carried out to probe the ordering of polymers and to measure the strain of the polymer chains under uniaxial tensile tests. A maximum 10% tensile stretching was applied (i.e., beyond the relaxation threshold). Interestingly we found different behaviors upon stretching the polymer: fullerene blends with the modified polymer; fullerene blends with the 1,8-Diiodooctane (DIO) additive. Overall, the strain in the system was almost twice as low in the presence of additive. The inclusion of additive was found to help in stabilizing the system and, in particular, the π–π packing of the donor polymer chains.

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In situ investigation of annealing effect on lamellar stacking structure of polyethylene thin films by synchrotron grazing-incidence small-angle and wide-angle X-ray scattering

Journal of Applied Crystallography ◽

10.1107/s002188980700578x ◽

2007 ◽

Vol 40 (s1) ◽

pp. s642-s644 ◽

Cited By ~ 15

Author(s):

Sono Sasaki ◽

Hiroyasu Masunaga ◽

Hiroo Tajiri ◽

Katsuaki Inoue ◽

Hiroshi Okuda ◽

...

Keyword(s):

Thin Films ◽

Small Angle ◽

Grazing Incidence ◽

Annealing Effect ◽

Wide Angle ◽

X Ray ◽

X Ray Scattering ◽

In Situ Investigation ◽

Stacking Structure

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A Novel MEMS-Based Technique for In-Situ Characterization of Freestanding Nanometer Scale Thin Films Inside SEM and TEM

10.1115/imece2001/mems-23802 ◽

2001 ◽

Author(s):

M. A. Haque ◽

M. T. A. Saif

Keyword(s):

Thin Films ◽

Tensile Testing ◽

Uniaxial Tensile ◽

Aluminum Specimen ◽

Sem And Tem ◽

Uniaxial Tensile Testing ◽

Testing Facility ◽

Film Specimen ◽

On Chip

Abstract We present a MEMS-based technique for in-situ uniaxial tensile testing of freestanding thin films inside SEM and TEM. It integrates a freestanding thin film specimen with MEMS force sensors and structures to produce an on-chip tensile testing facility. Cofabrication of the specimen with force and displacement measuring mechanisms produces the following unique features: 1) Quantitative experimentation can be carried out in both SEM and TEM, 2) No extra gripping mechanism is required, 3) Specimen misalignment can be eliminated, 4) Pre-stress in specimen can be determined, and 5) Specimens with micrometer to nanometer thickness can be tested. We demonstrate the technique by testing a 200-nanometer thick Aluminum specimen in-situ in SEM. Significant strengthening and anelasticity were observed at this size scale.

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The In-Situ Observation of Organic Thin Films During Growth Process by Using Grazing Incidence X-Ray Diffraction and Fluorescence Methods

Advances in X-Ray Analysis ◽

10.1007/978-1-4615-5377-9_71 ◽

1997 ◽

pp. 653-658

Author(s):

Kouichi Hayashi ◽

Toshihisa Horiuchi ◽

Kazumi Matsushige

Keyword(s):

Thin Films ◽

Growth Process ◽

Organic Thin Films ◽

Grazing Incidence ◽

In Situ Observation ◽

X Ray Diffraction ◽

X Ray ◽

Fluorescence Methods

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Analysis of the Structural Properties for ZnO/Sapphire(0001) Thin Films by In-situ Atmosphere Annealing

Journal of the Korean Institute of Electrical and Electronic Material Engineers ◽

10.4313/jkem.2006.19.8.769 ◽

2006 ◽

Vol 19 (8) ◽

pp. 769-774

Author(s):

Min-Sung Wang ◽

In-Sung Yoo ◽

Choon-Bae Park

Keyword(s):

Thin Films ◽

Structural Properties

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In situ grazing-incidence X-ray diffraction during electrodeposition of birnessite thin films: Identification of solid precursors

Electrochemistry Communications ◽

10.1016/j.elecom.2011.02.029 ◽

2011 ◽

Vol 13 (5) ◽

pp. 491-494 ◽

Cited By ~ 10

Author(s):

M. Ndjeri ◽

S. Peulon ◽

M.L. Schlegel ◽

A. Chaussé

Keyword(s):

Thin Films ◽

Grazing Incidence ◽

X Ray Diffraction ◽

X Ray

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In-Situ Grazing Incidence Small-Angle X-ray Scattering Studies on Nanopore Evolution in Low-kOrganosilicate Dielectric Thin Films

Macromolecules ◽

10.1021/ma048214e ◽

2005 ◽

Vol 38 (8) ◽

pp. 3395-3405 ◽

Cited By ~ 80

Author(s):

Byeongdu Lee ◽

Jinhwan Yoon ◽

Weontae Oh ◽

Yongtaek Hwang ◽

Kyuyoung Heo ◽

...

Keyword(s):

Thin Films ◽

Small Angle ◽

Grazing Incidence ◽

Dielectric Thin Films ◽

X Ray ◽

X Ray Scattering ◽

Ray Scattering

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The Effect of Surface Interactions on the Viscosity of Polymer Thin Films

MRS Proceedings ◽

10.1557/proc-0890-y06-03 ◽

2005 ◽

Vol 890 ◽

Author(s):

Chunhua Li ◽

Jun Jiang ◽

Miriam J. Rafailovich ◽

Jonathan C. Sokolov

Keyword(s):

Thin Films ◽

Film Thickness ◽

Effective Viscosity ◽

Polymer Thin Films ◽

Surface Interactions ◽

Polymer Chains ◽

Bilayer Films ◽

Silicon Interface ◽

Effect Of Surface

ABSTRACTPreviously, we reported that the viscosity of a polymer film can be measured in situ by observing the liquid-liquid dewetting of polymer bilayer films. In this study, we use the technique to investigate the effect of film thickness and surface interactions on the effective viscosity of polymer thin films. We found that the effective viscosity increases dramatically with decreasing the film thickness. We attribute this to the pinning of the polymer chains at the strongly interacting polymer/Silicon interface.

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Tensile testing low density multilayers: Aluminum/titanium

Journal of Materials Research ◽

10.1557/jmr.1998.0397 ◽

1998 ◽

Vol 13 (10) ◽

pp. 2902-2909 ◽

Cited By ~ 39

Author(s):

D. Josell ◽

D. van Heerden ◽

D. Read ◽

J. Bonevich ◽

D. Shechtman

Keyword(s):

Thin Films ◽

Yield Stress ◽

Tensile Testing ◽

Tensile Tests ◽

Uniaxial Tensile ◽

Low Density ◽

Multilayer Thin Films ◽

Bilayer Thickness ◽

Relationship Of ◽

The Relationship

Yield stresses, ultimate tensile strengths, and specific strengths of aluminum/titanium multilayer thin films are determined from the results of uniaxial tensile tests. The plasticity in the stress-strain curves, the nature of the fracture surfaces, and the relationship of the yield stress and the bilayer thickness are discussed. Properties are compared with those of other multilayer materials published in the literature.

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