High precision multi-spindle wrench for automated sealing of joints during assembly of products operating at high pressures

2020 ◽  
pp. 348-351
Author(s):  
Yu.Z. Zhitnikov ◽  
B.Yu. Zhitnikov ◽  
A.E. Matrosov
Keyword(s):  
High Precision ◽  
Experimental Analysis ◽  
High Pressures ◽  
Threaded Joints ◽  
Achievable Accuracy ◽  
Accuracy And Stability

Based on the theoretical and experimental analysis of achievable accuracy and stability of main forces of automated tightening of threaded joints, a multi-spindle nut has been developed, which ensures tightness of joints of articles operating at high pressures.

scholarly journals Borehole multi-functional logger for geophysical high-precision monitoring in Antarctic and Greenland ice sheets and glaciers

2021 ◽  
pp. 1-11
Author(s):  
Aleksey Markov ◽  
Pavel Talalay ◽  
Mikhail Sysoev ◽  
Andrey Miller ◽  
Alexander Cherepakhin
Keyword(s):  
High Precision ◽  
Cross Sections ◽  
Low Temperatures ◽  
High Pressures ◽  
Ice Sheets ◽  
Dome A ◽  
Lake Vostok ◽  
Pressure Axis ◽  
Vostok Station ◽  
Kunlun Station

Abstract This article presents the main aspects of the design solutions (based on the application of sensors MEMS and cantilevers), testing and applying of the multi-functional borehole logger ANTTIC (Antarctic Thermo-barometer, Inclinometer, Caliper) for geophysical high-precision monitoring (when simultaneous registering of temperature, pressure, axis inclination angle and radii of borehole cross-sections at 12 points), which is designed specifically for ultra-low temperatures and ultra-high pressures, and to determine an elliptical borehole shape and registration anisotropy factor in deep ice boreholes in the central region of Eastern Antarctica, in the areas of dome A at the Kunlun station (China) and/or of lake Vostok at the Vostok station (Russia).

High precision powder x‐ray diffraction measurements at high pressures

1990 ◽  
Vol 61 (10) ◽  
pp. 2571-2580 ◽  
Author(s):  
Charles Meade ◽  
Raymond Jeanloz
Keyword(s):  
High Precision ◽  
High Pressures ◽  
X Ray Diffraction ◽  
X Ray

A Study of High-Precision Internal Clock Maintenance Method

2013 ◽  
Vol 765-767 ◽  
pp. 2407-2410
Author(s):  
Bu Xin You ◽  
He Zhi Liu ◽  
Peng Tian ◽  
Jia Xu ◽  
Jing Bu
Keyword(s):  
Real Time ◽  
High Precision ◽  
Random Error ◽  
Engineering Application ◽  
Internal Clock ◽  
Accurate Information ◽  
Dynamic Compensation ◽  
The Real ◽  
Accuracy And Stability ◽  
Gps Timing

In the engineering application, we put forward higher request to the device in the clock accuracy and stability. In this paper, we can modify GPS second pulse online which based on the GPS timing and combine high precision crystal in order to reduce its random error. And on this basis, we put forward a method of dynamic compensation to do the real-time numerical compensation in the apparatus. It can be used as accurate information for the device using nanosecond, not only has high precision, but also simple to implement, and has higher application value in engineering.

Automatic measurement of SAED patterns from asbestos minerals

1988 ◽  
Vol 46 ◽  
pp. 846-847
Author(s):  
J. C. Russ ◽  
T. Taguchi ◽  
P. M. Peters ◽  
E. Chatfield ◽  
J. C. Russ ◽  
...  
Keyword(s):  
Diffraction Pattern ◽  
High Precision ◽  
Diffraction Data ◽  
Automatic Measurement ◽  
Automatic Method ◽  
Important Method ◽  
X Ray ◽  
Integrated Intensity ◽  
Asbestiform Minerals ◽  
True Center

Conventional SAD patterns as obtained in the TEM present difficulties for identification of materials such as asbestiform minerals, although diffraction data is considered to be an important method for making this purpose. The preferred orientation of the fibers and the spotty patterns that are obtained do not readily lend themselves to measurement of the integrated intensity values for each d-spacing, and even the d-spacings may be hard to determine precisely because the true center location for the broken rings requires estimation. We have implemented an automatic method for diffraction pattern measurement to overcome these problems. It automatically locates the center of patterns with high precision, measures the radius of each ring of spots in the pattern, and integrates the density of spots in that ring. The resulting spectrum of intensity vs. radius is then used just as a conventional X-ray diffractometer scan would be, to locate peaks and produce a list of d,I values suitable for search/match comparison to known or expected phases.

On effects of non-systematic reflections on weak-beam images of partial dislocations

1991 ◽  
Vol 49 ◽  
pp. 688-689
Author(s):  
K. Z. Botros ◽  
S. S. Sheinin
Keyword(s):  
High Precision ◽  
Stacking Fault ◽  
Important Application ◽  
Stacking Fault Energy ◽  
Sharp Peak ◽  
Weak Beam ◽  
Partial Dislocations ◽  
Deviation Parameter ◽  
Beam Diffraction

The main features of weak beam images of dislocations were first described by Cockayne et al. using calculations of intensity profiles based on the kinematical and two beam dynamical theories. The feature of weak beam images which is of particular interest in this investigation is that intensity profiles exhibit a sharp peak located at a position very close to the position of the dislocation in the crystal. This property of weak beam images of dislocations has an important application in the determination of stacking fault energy of crystals. This can easily be done since the separation of the partial dislocations bounding a stacking fault ribbon can be measured with high precision, assuming of course that the weak beam relationship between the positions of the image and the dislocation is valid. In order to carry out measurements such as these in practice the specimen must be tilted to "good" weak beam diffraction conditions, which implies utilizing high values of the deviation parameter Sg.

Digital differential hysteresis iimage processing displays what the microscope acquires but the eye can't see

1995 ◽  
Vol 53 ◽  
pp. 642-643
Author(s):  
Klaus-Ruediger Peters
Keyword(s):  
Image Processing ◽  
Visual System ◽  
High Precision ◽  
Image Data ◽  
Processing Technology ◽  
Output Data ◽  
Contrast Resolution ◽  
Pixel Intensity ◽  
Data Reading ◽  
Hysteresis Properties

Differential hysteresis processing is a new image processing technology that provides a tool for the display of image data information at any level of differential contrast resolution. This includes the maximum contrast resolution of the acquisition system which may be 1,000-times higher than that of the visual system (16 bit versus 6 bit). All microscopes acquire high precision contrasts at a level of <0.01-25% of the acquisition range in 16-bit - 8-bit data, but these contrasts are mostly invisible or only partially visible even in conventionally enhanced images. The processing principle of the differential hysteresis tool is based on hysteresis properties of intensity variations within an image.Differential hysteresis image processing moves a cursor of selected intensity range (hysteresis range) along lines through the image data reading each successive pixel intensity. The midpoint of the cursor provides the output data. If the intensity value of the following pixel falls outside of the actual cursor endpoint values, then the cursor follows the data either with its top or with its bottom, but if the pixels' intensity value falls within the cursor range, then the cursor maintains its intensity value.

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